Testing fuse configurations in semiconductor devices
    353.
    发明授权
    Testing fuse configurations in semiconductor devices 有权
    测试半导体器件中的保险丝配置

    公开(公告)号:US09568544B2

    公开(公告)日:2017-02-14

    申请号:US14250191

    申请日:2014-04-10

    Applicant: RAMBUS INC.

    Abstract: A system includes a first integrated circuit configured to operate in at least a normal mode and a test mode and a second integrated circuit, where both the first integrated circuit and the second integrated circuit are disposed within a same semiconductor device package. The system further includes a first terminal, external to the semiconductor device package, electronically coupled to the first integrated circuit and the second integrated circuit. The first terminal is electronically coupled to a buffer in the second integrated circuit and used to convey signals to or from the first integrated circuit.

    Abstract translation: 一种系统包括被配置为在至少正常模式和测试模式下工作的第一集成电路和第二集成电路,其中第一集成电路和第二集成电路均设置在相同的半导体器件封装内。 该系统还包括电子耦合到第一集成电路和第二集成电路的半导体器件封装外部的第一端子。 第一端子电耦合到第二集成电路中的缓冲器,并用于将信号传送到第一集成电路或从第一集成电路传送信号。

    Integrated circuit having a multiplying injection-locked oscillator
    354.
    发明授权
    Integrated circuit having a multiplying injection-locked oscillator 有权
    具有倍增注入锁定振荡器的集成电路

    公开(公告)号:US09564911B2

    公开(公告)日:2017-02-07

    申请号:US14858830

    申请日:2015-09-18

    Applicant: Rambus Inc.

    Abstract: Methods and apparatuses featuring a multiplying injection-locked oscillator are described. Some embodiments include a pulse-generator-and-injector and one or more injection-locked oscillators. The outputs of the pulse-generator-and-injector can be injected into corresponding injection points of an injection-locked oscillator. In embodiments that include multiple injection-locked oscillators, the outputs of each injection-locked oscillator can be injected into the corresponding injection points of the next injection-locked oscillator. Some embodiments reduce deterministic jitter by dynamically modifying the loop length of an injection-locked oscillator, and/or by using a duty cycle corrector, and/or by multiplexing/blending the outputs from multiple delay elements of an injection-locked oscillator.

    Abstract translation: 描述了具有乘法注入锁定振荡器的方法和装置。 一些实施例包括脉冲发生器和注射器以及一个或多个注入锁定的振荡器。 脉冲发生器和注射器的输出可以注入到注入锁定振荡器的相应注入点。 在包括多个注入锁定的振荡器的实施例中,每个注入锁定振荡器的输出可以被注入到下一个注入锁定振荡器的相应注入点。 一些实施例通过动态地修改注入锁定振荡器的环路长度和/或通过使用占空比校正器和/或通过复用/混合来自注入锁定振荡器的多个延迟元件的输出来减少确定性抖动。

    Receiver clock test circuitry and related methods and apparatuses
    356.
    发明授权
    Receiver clock test circuitry and related methods and apparatuses 有权
    接收机时钟测试电路及相关方法和装置

    公开(公告)号:US09537617B2

    公开(公告)日:2017-01-03

    申请号:US15019483

    申请日:2016-02-09

    Applicant: Rambus Inc.

    Abstract: An integrated circuit includes a plurality of receivers, each having a clock and data recovery circuit. A first local clock recovery circuit in a first receiver can be caused to produce a test clock which simulates a condition to be tested, and while a second receiver in the plurality of receivers that includes a second local clock recovery circuit is caused to use the test clock in place of the reference clock while receiving a test data sequence at its input. The clock and data recovery circuits in the receivers can include clock control loops responsive to loop control signals to modify the selected reference clock to generate the local clock in response to selective one of (i) a corresponding data signal for normal operation or during a test, and (ii) a test signal applied to the clock control loop in which case the test clock is produced.

    Abstract translation: 集成电路包括多个接收器,每个接收器具有时钟和数据恢复电路。 可以使第一接收机中的第一本地时钟恢复电路产生模拟要测试的条件的测试时钟,并且使包括第二本地时钟恢复电路在内的多个接收机中的第二接收机使用该测试 时钟代替参考时钟,同时在其输入端接收测试数据序列。 接收机中的时钟和数据恢复电路可以包括响应于环路控制信号的时钟控制环路,以响应于(i)用于正常操作或在测试期间的相应数据信号中的选择性的一个来选择性地修改所选择的参考时钟以产生本地时钟 ,以及(ii)施加到时钟控制回路的测试信号,在这种情况下产生测试时钟。

    Image sensor architecture with power saving readout
    357.
    发明授权
    Image sensor architecture with power saving readout 有权
    具有省电读数的图像传感器架构

    公开(公告)号:US09521349B2

    公开(公告)日:2016-12-13

    申请号:US14727869

    申请日:2015-06-02

    Applicant: Rambus Inc.

    CPC classification number: H04N5/378 H04N5/3454 H04N5/3698 H04N5/376

    Abstract: Pixels within an image sensor pixel array are sampled by corresponding conditional read circuitry. A zero pixel value is outputted for each pixel associated with a sample less than a conversion threshold, and a saturated pixel value is outputted for each pixel associated with a sample greater than or equal to a saturation threshold. Samples greater than or equal to the conversion threshold and less than the saturation threshold are converted by an ADC, and a converted pixel value is output for each associated above threshold pixel. The ADC (along with any corresponding amplifiers) are powered on for a variable period depending on the number of pixels needing conversion during the conversion of such samples during a read period, and are powered off for the remainder of the read period.

    Abstract translation: 图像传感器像素阵列内的像素通过相应的条件读取电路进行采样。 对于与小于转换阈值的样本相关联的每个像素输出零像素值,并且对于与大于或等于饱和阈值的样本相关联的每个像素输出饱和像素值。 通过ADC转换大于或等于转换阈值且小于饱和阈值的样本,并为每个相关联的上述阈值像素输出转换的像素值。 取决于在读取周期期间这样的样本的转换期间需要转换的像素的数量,ADC(以及任何相应的放大器)以及可变周期被加电,并且在读取周期的其余部分中断电。

    Reset-marking pixel sensor
    358.
    发明授权
    Reset-marking pixel sensor 有权
    复位标记像素传感器

    公开(公告)号:US09521337B1

    公开(公告)日:2016-12-13

    申请号:US13936985

    申请日:2013-07-08

    Applicant: Rambus Inc.

    Abstract: A self-resetting pixel having a memory element to record occurrence of an asynchronous pixel reset and circuitry to enable the memory element to be digitally sampled and cleared is disclosed, together with embodiments of digital image sensors formed by arrays or other collections of such pixels. By marking occurrence of asynchronous reset events within an in-pixel memory element that may be digitally oversampled during an exposure interval (i.e., repeatedly read-out in the form of, for example, a single-bit), it becomes possible to check for and detect asynchronous pixel reset events frequently and efficiently.

    Abstract translation: 公开了具有用于记录异步像素复位的存储元件以及使存储器元件能够被数字采样和清除的电路的自复位像素,以及由这些像素的阵列或其他集合形成的数字图像传感器的实施例。 通过标记可能在曝光间隔期间被数字过采样的像素内存储元件内的异步复位事件的出现(例如,以例如单位形式重复读出),可以检查 并频繁且高效地检测异步像素复位事件。

    Offset and decision feedback equalization calibration

    公开(公告)号:US09515856B2

    公开(公告)日:2016-12-06

    申请号:US14720518

    申请日:2015-05-22

    Applicant: Rambus Inc.

    CPC classification number: H04L25/03057 H04B1/123 H04L25/03063 H04L25/03885

    Abstract: A decision feedback equalizer is calibrated to compensate for estimated inter-symbol interference in a received signal and offsets of sampling devices. The decision feedback equalizer is configured so that an output signal of a sampling circuit represents a comparison between an input signal and a reference of the sampling circuit under calibration. An input signal is received over a communication channel that includes a predetermined pattern. The predetermined pattern is compared to the output signal to determine an adjusted reference for configuring the sampling circuit that accounts for both offset and inter-symbol interference effects.

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