Method for Deposition
    41.
    发明申请
    Method for Deposition 审中-公开
    沉积方法

    公开(公告)号:US20150187981A1

    公开(公告)日:2015-07-02

    申请号:US14640595

    申请日:2015-03-06

    CPC classification number: H01L31/1828 C23C14/0021 C23C14/024 C23C14/0629

    Abstract: Embodiments of the present invention include a method. The method includes producing a first vapor from a solid source material, reacting hydrogen telluride to form a second vapor comprising tellurium, and depositing on a support a coating material comprising tellurium within a deposition environment, the deposition environment comprising the first vapor and the second vapor. Another embodiment is a system. The system includes a deposition chamber disposed to contain a deposition environment in fluid communication with a support; a solid source material disposed in fluid communication with the deposition chamber; and a hydrogen telluride source in fluid communication in fluid communication with the deposition chamber.

    Abstract translation: 本发明的实施例包括一种方法。 该方法包括从固体源材料制备第一蒸气,使碲化碲反应形成包含碲的第二蒸气,以及在沉积环境中在载体上沉积包含碲的涂层材料,沉积环境包括第一蒸气和第二蒸气 。 另一个实施例是系统。 该系统包括沉积室,其设置成容纳与载体流体连通的沉积环境; 设置成与沉积室流体连通的固体源材料; 和与沉积室流体连通的流体连通的碲化氢源。

    Ultraviolet sensor and method for manufacturing the same
    42.
    发明授权
    Ultraviolet sensor and method for manufacturing the same 有权
    紫外线传感器及其制造方法

    公开(公告)号:US09064990B2

    公开(公告)日:2015-06-23

    申请号:US13706435

    申请日:2012-12-06

    Abstract: An ultraviolet sensor has a p-type semiconductor layer composed of a solid solution of NiO and ZnO, and an n-type semiconductor layer composed of ZnO and joined to the p-type semiconductor layer such that a part of the surface of the p-type semiconductor layer is exposed. In the p-type semiconductor layer, trivalent Ni is contained in a crystal grain in a state of being solid-solved with the solid solution of NiO and ZnO. The trivalent Ni can be contained in the crystal grain of the p-type semiconductor layer by adding NiOOH to NiO and ZnO, and firing the resulting mixture. Thereby, an inexpensive ultraviolet sensor capable of being downsized, which can easily detect the intensity of ultraviolet light by a photovoltaic power without utilizing a peripheral circuit can be realized.

    Abstract translation: 紫外线传感器具有由NiO和ZnO的固溶体构成的p型半导体层和由ZnO构成的n型半导体层,并与p型半导体层接合,使得p型半导体层的p型半导体层的一部分, 型半导体层露出。 在p型半导体层中,利用NiO和ZnO的固溶体固溶的状态,在晶粒中含有3价Ni。 通过向NiO和ZnO中添加NiOOH,可以在p型半导体层的晶粒中含有三价Ni,并烧结所得到的混合物。 因此,可以实现能够小型化的便宜的紫外线传感器,其可以在不利用外围电路的情况下容易地通过光伏电力检测紫外光的强度。

    Back Contact Paste with Te Enrichment and Copper Doping Control in Thin Film Photovoltaic Devices
    48.
    发明申请
    Back Contact Paste with Te Enrichment and Copper Doping Control in Thin Film Photovoltaic Devices 有权
    在薄膜光伏器件中的Te浓缩和铜掺杂控制的背面接触膏

    公开(公告)号:US20150031163A1

    公开(公告)日:2015-01-29

    申请号:US13950605

    申请日:2013-07-25

    Abstract: Methods for forming a back contact on a thin film photovoltaic device are provided that include applying a conductive paste onto a surface defined by a p-type absorber layer (e.g., comprising cadmium telluride) of a p-n junction and curing the conductive paste to form a conductive coating on the surface defined by a p-type absorber layer of the p-n junction. The conductive paste can include a conductive material, a solvent system, and a binder such that during curing an acid from the conductive paste reacts to enrich the surface with tellurium while copper is deposited onto the Te enriched surface. The acid is then substantially consumed during curing.

    Abstract translation: 提供了在薄膜光伏器件上形成背接触的方法,其包括将导电浆料涂覆在由pn结的p型吸收层(例如,包含碲化镉)所限定的表面上,并固化导电糊以形成 在由pn结的p型吸收层限定的表面上的导电涂层。 导电浆料可以包括导电材料,溶剂系统和粘合剂,使得在固化过程中,来自导电浆料的酸反应以使碲表面富集,同时铜沉积到富Te表面上。 然后酸在固化过程中基本消耗。

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