Method and structure for a 3D wire block

    公开(公告)号:US10559476B2

    公开(公告)日:2020-02-11

    申请号:US15688238

    申请日:2017-08-28

    摘要: The present invention provides for a structure and a mechanism by which by utilizing additive manufacturing processes electrical connections are created that connect the top and bottom of a block in a customizable pattern. Specifically connection points can be created on the surface of the block and route them to alternate locations transforming the original pattern to a smaller, larger, or alternate pattern.

    Trace anywhere interconnect
    4.
    发明授权

    公开(公告)号:US10257930B2

    公开(公告)日:2019-04-09

    申请号:US15189435

    申请日:2016-06-22

    摘要: The present invention provides for a method and structure for forming three-dimensionally routed dielectric wires between discrete points on the two or more parallel circuit planes. The wires may be freely routed in three-dimensional space as to create the most efficient routing between the two arbitrarily defined points on the two or more parallel circuit planes. Metalizing the outer surfaces of these three dimensional dielectric wires electrically coupling the discrete wires to their respective discrete contact points. Two or more of these wires may be in intimate contact to one another electrically coupling to each other as well as to two or more discrete contact pads. These electrically coupled contact pads may be on opposite sides or on the same side of the structure and the formed metalized wires may originate on one side and terminate on the other or originate and terminate from the same side.

    SYSTEM AND METHOD FOR DETECTING DEFECTIVE BACK-DRILLS IN PRINTED CIRCUIT BOARDS

    公开(公告)号:US20220252660A1

    公开(公告)日:2022-08-11

    申请号:US17173441

    申请日:2021-02-11

    摘要: The present invention provides a method for detecting failed back-drills in PCBs in the process of fabricating a PCB so that the failed back-drill can be screened out or repaired. The present invention accomplishes this by adding a short to ground connection for every back-drill via that will be cut when the back-drill removes the via stub. If the back-drill is bad or failed the short to ground will fail the subsequent electrical tests. The PCB can be repaired by re-drilling the hole or via. The present invention allows for detecting failed back-drills with easy detection in the manufacturing stage using standard equipment and test procedures. This process creates a simple pass-fail measurement that uses an existing common test process to catch failed back drills in the PCB fabrication facility. This allows for easy and cost-effective repair and guarantees back-drill failures do not pass into the field.

    CAPACITOR IN SOCKET
    7.
    发明申请

    公开(公告)号:US20210376535A1

    公开(公告)日:2021-12-02

    申请号:US16887640

    申请日:2020-05-29

    IPC分类号: H01R13/66 H01R13/17 G01R1/073

    摘要: The present invention provides for an improved method and structure for forming an electrical interconnects mechanism in a Power Distribution Network (PDN) by placing capacitors on the top of the pin array on the printed circuit board (PCB) of the structure to decouple the PDN and results in lower impedance benefitting the frequency range of the PDN effecting a significant performance improvement in the spring-pin inductance from the transmission line. This reduction in impedance reduces the power supply ripple.

    Structure and Implementation Method for implementing an embedded serial data test loopback, residing directly under the device within a printed circuit board
    10.
    发明申请
    Structure and Implementation Method for implementing an embedded serial data test loopback, residing directly under the device within a printed circuit board 审中-公开
    用于实现嵌入式串行数据测试环回的结构和实现方法,位于印刷电路板内的设备的正下方

    公开(公告)号:US20160065334A1

    公开(公告)日:2016-03-03

    申请号:US14833928

    申请日:2015-08-24

    IPC分类号: H04L1/24 H04L12/26

    摘要: A method and a structure with multiple implementations is provided that depends on the specific need, for placing (embedding) a serial loopback circuit of known design in a printed circuit board directly beneath the device under test. Micro-vias and traces connect components including transmitter components (TX) and receiver components (RX) that are formed into a loopback circuit for connection to a device under test (DUT). The connection is accomplished by a coupling capacitor with a shortest possible electrical length approximating a straight line between said components and said DUT and said distance is a length of said short straight line times a square root of 2 so that said receiver components are beneath the DUT.

    摘要翻译: 提供了具有多个实现的方法和结构,其取决于具体需要,将已知设计的串行回送电路放置(嵌入)在正在被测器件正下方的印刷电路板中。 微通孔和迹线连接组件,包括发射器组件(TX)和接收器组件(RX),其形成为用于连接到被测设备(DUT)的环回电路。 该连接由耦合电容器实现,其具有近似于所述部件和所述DUT之间的直线的最短电长度,并且所述距离是所述短直线的长度乘以2的平方根,使得所述接收器部件在DUT下方 。