Membrane probe with anchored elements
    6.
    发明授权
    Membrane probe with anchored elements 失效
    带有锚定元件的膜探针

    公开(公告)号:US07011531B2

    公开(公告)日:2006-03-14

    申请号:US11031859

    申请日:2005-01-07

    IPC分类号: H01R12/00

    摘要: A structure and method to establish an electrical connection between a tester and an electrical component. A flexible dielectric layer has a first side and a second side. A through via extends through the first side and the second side of the dielectric layer. A blind via is placed in a position that is offset from the through via and extends laterally in a first direction from a section of the first through via to a section of the flexible dielectric layer. The blind via extends in a second direction from the first side of the flexible dielectric layer to a section of the flexible dielectric layer that is between the first side and the second side of the dielectric layer. An electrically conductive member extends through the through via and extends into the blind via, thereby filling the through via and the blind via. The electrically conductive member has a first surface and a second surface. Any distance between the first surface and the second surface is greater than a distance between the first side of the dielectric layer and the second side of the dielectric layer.

    摘要翻译: 一种在测试仪和电气部件之间建立电气连接的结构和方法。 柔性介电层具有第一面和第二面。 通孔延伸穿过电介质层的第一侧和第二侧。 盲通孔放置在从通孔偏移的位置,并且在从第一通孔的一部分到柔性介电层的一部分的第一方向上横向延伸。 盲孔从柔性介电层的第一侧沿第二方向延伸到介电层的第一侧和第二侧之间的柔性介电层的一部分。 导电构件延伸穿过通孔并延伸到盲孔中,从而填充通孔和盲孔。 导电构件具有第一表面和第二表面。 第一表面和第二表面之间的任何距离都大于电介质层的第一面和电介质层的第二面之间的距离。