Apparatus and Method for Thermally Controlled Processing of Microelectronic Workpieces
    12.
    发明申请
    Apparatus and Method for Thermally Controlled Processing of Microelectronic Workpieces 审中-公开
    微电子工件热处理设备及方法

    公开(公告)号:US20080011450A1

    公开(公告)日:2008-01-17

    申请号:US11776952

    申请日:2007-07-12

    IPC分类号: B05B1/00 F17D3/00

    摘要: Apparatus and method for thermally controlled processing of microelectronic workpieces with liquids. An apparatus in accordance with and embodiment of the invention includes a process vessel configured to carry a processing liquid, such as an electroless processing liquid. The vessel has a thermally transmissive wall for transferring heat to and/or from the processing liquid within. A heat transfer device, such as a reservoir that receives processing liquid spilling over from the process vessel, transfers heat to or from the processing liquid within the process vessel. The heat transfer device can also transfer heat to or from an internal or external heat source, such as a conduit carrying a heat transfer fluid, or an electrical resistance heater. The interaction between the microelectronic workpiece and the processing liquid can be further controlled by controlling the rate at which the microelectronic workpiece rotates and/or the manner in which the microelectronic workpiece is introduced to and/or withdrawn from the processing liquid.

    摘要翻译: 用液体对微电子工件进行热处理的装置和方法。 根据本发明的实施例的装置包括配置成承载诸如无电处理液体的处理液体的处理容器。 容器具有用于将热量传递到和/或内部的处理液体的热传递壁。 传热装置,例如容纳从处理容器溢出的处理液体的储存器,将热量传递到处理容器内或从处理容器内的处理液体。 传热装置还可以将热量传递到内部或外部热源,例如承载传热流体的导管或电阻加热器。 通过控制微电子工件旋转的速度和/或微电子工件被引入和/或从处理液中取出的方式,可以进一步控制微电子工件和处理液之间的相互作用。

    Die-level wafer contact for direct-on-barrier plating
    14.
    发明申请
    Die-level wafer contact for direct-on-barrier plating 审中-公开
    用于直接屏蔽电镀的晶片级晶片接触

    公开(公告)号:US20060226019A1

    公开(公告)日:2006-10-12

    申请号:US11399762

    申请日:2006-04-07

    IPC分类号: C25D7/12

    摘要: The present invention provides a semiconductor workpiece support and contact assembly for providing localized electrical connections with the device side of the workpiece. The additional contact points help overcome the terminal effect caused by very high sheet resistance of thin barrier layers and enable plating a conformal seed layer or feature filling directly on thin barrier layers. By utilizing the streets that separate individual dice on a workpiece to make electrical connections with the workpiece and provide localized distribution of plating chemistry, the present invention provides a more uniform and conformal metallization layer.

    摘要翻译: 本发明提供一种用于提供与工件的装置侧的局部电连接的半导体工件支撑和接触组件。 额外的接触点有助于克服由薄阻挡层的非常高的薄层电阻引起的终端效应,并且能够将保形种子层或特征直接填充在薄的阻挡层上。 通过利用在工件上分离单个骰子以与工件电连接并且提供电镀化学物质的局部分布的街道,本发明提供了更均匀和保形的金属化层。

    ELECTROLYTIC PROCESS USING CATION PERMEABLE BARRIER
    18.
    发明申请
    ELECTROLYTIC PROCESS USING CATION PERMEABLE BARRIER 有权
    电解工艺使用渗透性阻挡层

    公开(公告)号:US20120292194A1

    公开(公告)日:2012-11-22

    申请号:US13559494

    申请日:2012-07-26

    IPC分类号: C25D5/02

    摘要: Processes and systems for electrolytically processing a microfeature workpiece with a first processing fluid and an anode are described. Microfeature workpieces are electrolytically processed using a first processing fluid, an anode, a second processing fluid, and a cation permeable barrier layer. The cation permeable barrier layer separates the first processing fluid from the second processing fluid while allowing certain cationic species to transfer between the two fluids. The described processes produce deposits over repeated plating cycles that exhibit deposit properties (e.g., resistivity) within desired ranges.

    摘要翻译: 描述了利用第一处理流体和阳极电解处理微特征工件的工艺和系统。 使用第一处理流体,阳极,第二处理流体和阳离子可渗透阻挡层对微特征工件进行电解处理。 阳离子可渗透阻隔层将第一处理流体与第二处理流体分离,同时允许某些阳离子物质在两种流体之间转移。 所描述的方法在反复电镀循环中产生沉积物,其在所需范围内具有沉积性质(例如电阻率)。