公开(公告)号：US20060043608A1

公开(公告)日：2006-03-02

申请号：US10711185

申请日：2004-08-31

Applicant: William Bernier ,  Marie Cole ,  Mukta Farooq ,  John Knickerbocker ,  Tasha Lopez ,  Roger Quon ,  David Welsh

Inventor： William Bernier ,  Marie Cole ,  Mukta Farooq ,  John Knickerbocker ,  Tasha Lopez ,  Roger Quon ,  David Welsh

IPC: H01L23/48

CPC classification number: H05K3/321 ,  H01L24/05 ,  H01L24/12 ,  H01L24/16 ,  H01L24/29 ,  H01L24/83 ,  H01L2224/0401 ,  H01L2224/05557 ,  H01L2224/13076 ,  H01L2224/13078 ,  H01L2224/1308 ,  H01L2224/131 ,  H01L2224/1319 ,  H01L2224/1329 ,  H01L2224/133 ,  H01L2224/13339 ,  H01L2224/13464 ,  H01L2224/29101 ,  H01L2224/29111 ,  H01L2224/2919 ,  H01L2224/2929 ,  H01L2224/293 ,  H01L2224/838 ,  H01L2924/00013 ,  H01L2924/01006 ,  H01L2924/01028 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01046 ,  H01L2924/01047 ,  H01L2924/0105 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/0132 ,  H01L2924/014 ,  H01L2924/0665 ,  H01L2924/0781 ,  H01L2924/09701 ,  H01L2924/14 ,  H01L2924/15787 ,  H01L2924/15788 ,  H01L2924/1579 ,  H05K2201/0212 ,  H05K2201/0248 ,  H05K2201/0373 ,  H05K2201/1025 ,  H01L2924/00014 ,  H01L2224/13099 ,  H01L2924/00 ,  H01L2924/01026 ,  H01L2924/00015 ,  H01L2224/29099 ,  H01L2224/29199 ,  H01L2224/29299

Abstract: Disclosed is a laminated (or non-laminated) conductive interconnection for joining an integrated circuit device to a device carrier, where the conductive interconnection comprises alternating metal layers and polymer layers. In addition, the polymer can include dendrites, metal projections from the carrier or device, and/or micelle brushes on the outer portion of the polymer. The polymer layers include metal particles and the alternating metal layers and polymer layers form either a cube-shaped structure or a cylinder-shaped structure.

Abstract translation: 公开了用于将集成电路器件连接到器件载体的层压（或非层叠）导电互连，其中导电互连包括交替的金属层和聚合物层。 此外，聚合物可以包括枝晶，来自载体或器件的金属突起，和/或聚合物外部的胶束刷。 聚合物层包括金属颗粒，并且交替的金属层和聚合物层形成立方体结构或圆柱形结构。

公开(公告)号：US20110290402A1

公开(公告)日：2011-12-01

申请号：US12788832

申请日：2010-05-27

Applicant: Paul Andry ,  Bing Dang ,  John Knickerbocker ,  Aparna Prabhakar ,  Peter Sorce ,  Robert E. Trzcinski ,  Cornelia K. Tsang

Inventor： Paul Andry ,  Bing Dang ,  John Knickerbocker ,  Aparna Prabhakar ,  Peter Sorce ,  Robert E. Trzcinski ,  Cornelia K. Tsang

IPC: B32B33/00 ,  B29C65/16

CPC classification number: H01L21/67132 ,  C09J5/06 ,  C09J2203/326 ,  C09J2479/08 ,  H01L21/6835 ,  H01L2221/6835 ,  H01L2221/68381 ,  Y10T156/1158

Abstract: A method for attaching a handler to a wafer, the wafer comprising an integrated circuit (IC), includes forming a layer of an adhesive on the wafer, the adhesive comprising a polyimide-based polymer configured to withstand processing at a temperature of over about 280° C.; and adhering a handler to the wafer using the layer of adhesive. A system for attaching a handler to a wafer, the wafer comprising IC, includes a layer of an adhesive located on the wafer, the adhesive comprising a polyimide-based polymer configured to withstand processing at a temperature of over about 280° C.; and a handler adhered to the wafer using the layer of adhesive.

Abstract translation: 一种用于将处理器附接到晶片的方法，所述晶片包括集成电路（IC），包括在所述晶片上形成粘合剂层，所述粘合剂包括基于聚酰亚胺的聚合物，所述聚酰亚胺基聚合物构造成经受超过约280℃的温度下的加工 C。; 以及使用所述粘合剂层将处理器粘附到所述晶片。 一种用于将处理器附接到晶片的系统，包括IC的晶片包括位于晶片上的粘合剂层，所述粘合剂包括基于聚酰亚胺的聚合物，其被配置为经受超过约280℃的温度下的加工; 以及使用粘合剂层粘附到晶片的处理器。

公开(公告)号：US20070138657A1

公开(公告)日：2007-06-21

申请号：US11314272

申请日：2005-12-21

Applicant: Vincenzo Condorelli ,  Claudius Feger ,  Kevin Gotze ,  Nihad Hadzic ,  John Knickerbocker ,  Edmund Sprogis

Inventor： Vincenzo Condorelli ,  Claudius Feger ,  Kevin Gotze ,  Nihad Hadzic ,  John Knickerbocker ,  Edmund Sprogis

IPC: H01L23/28

CPC classification number: H01L23/576 ,  H01L23/5383 ,  H01L2224/16 ,  H01L2224/16225 ,  H01L2224/73204 ,  H01L2924/01078 ,  H01L2924/10253 ,  H01L2924/15311 ,  H01L2924/19103 ,  H01L2924/19107 ,  Y10T29/53039 ,  Y10T29/53052 ,  Y10T29/53178 ,  H01L2924/00

Abstract: A physically secure processing assembly is provided that includes dies mounted on a substrate so as to sandwich the electrical contacts of the dies between the dies and the substrate. The substrate is provided with substrate contacts and conductive pathways that are electrically coupled to the die contacts and extend through the substrate. Electrical conductors surround the conductive pathways. A monitoring circuit detects a break in continuity of one or more of the electrical conductors, and preferably renders the assembly inoperable. Preferably, an epoxy encapsulation is provided to prevent probing tools from being able to reach the die or substrate contacts.

Abstract translation: 提供了一种物理上安全的处理组件，其包括安装在基板上的模具，以便将模具的电触点夹在模具和基板之间。 衬底设置有电连接到管芯触点并延伸穿过衬底的衬底触点和导电路径。 电导体围绕导电路径。 监控电路检测一个或多个电导体的连续性的断裂，并且优选地使组件不可操作。 优选地，提供环氧树脂封装以防止探测工具能够到达管芯或衬底接触。

公开(公告)号：US20070084629A1

公开(公告)日：2007-04-19

申请号：US11538823

申请日：2006-10-05

Applicant: William Bernier ,  Marie Cole ,  Mukta Farooq ,  John Knickerbocker ,  Tasha Lopez ,  Roger Quon ,  David Welsh

Inventor： William Bernier ,  Marie Cole ,  Mukta Farooq ,  John Knickerbocker ,  Tasha Lopez ,  Roger Quon ,  David Welsh

IPC: H05K1/16

CPC classification number: H05K3/321 ,  H01L24/05 ,  H01L24/12 ,  H01L24/16 ,  H01L24/29 ,  H01L24/83 ,  H01L2224/0401 ,  H01L2224/05557 ,  H01L2224/13076 ,  H01L2224/13078 ,  H01L2224/1308 ,  H01L2224/131 ,  H01L2224/1319 ,  H01L2224/1329 ,  H01L2224/133 ,  H01L2224/13339 ,  H01L2224/13464 ,  H01L2224/29101 ,  H01L2224/29111 ,  H01L2224/2919 ,  H01L2224/2929 ,  H01L2224/293 ,  H01L2224/838 ,  H01L2924/00013 ,  H01L2924/01006 ,  H01L2924/01028 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01046 ,  H01L2924/01047 ,  H01L2924/0105 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/0132 ,  H01L2924/014 ,  H01L2924/0665 ,  H01L2924/0781 ,  H01L2924/09701 ,  H01L2924/14 ,  H01L2924/15787 ,  H01L2924/15788 ,  H01L2924/1579 ,  H05K2201/0212 ,  H05K2201/0248 ,  H05K2201/0373 ,  H05K2201/1025 ,  H01L2924/00014 ,  H01L2224/13099 ,  H01L2924/00 ,  H01L2924/01026 ,  H01L2924/00015 ,  H01L2224/29099 ,  H01L2224/29199 ,  H01L2224/29299

Abstract: Disclosed is a laminated (or non-laminated) conductive interconnection for joining an integrated circuit device to a device carrier, where the conductive interconnection comprises alternating metal layers and polymer layers. In addition, the polymer can include dendrites, metal projections from the carrier or device, and/or micelle brushes on the outer portion of the polymer. The polymer layers include metal particles and the alternating metal layers and polymer layers form either a cube-shaped structure or a cylinder-shaped structure.

Abstract translation: 公开了用于将集成电路器件连接到器件载体的层压（或非层叠）导电互连，其中导电互连包括交替的金属层和聚合物层。 此外，聚合物可以包括枝晶，来自载体或器件的金属突起，和/或聚合物外部的胶束刷。 聚合物层包括金属颗粒，并且交替的金属层和聚合物层形成立方体结构或圆柱形结构。

公开(公告)号：US20060255442A1

公开(公告)日：2006-11-16

申请号：US11125499

申请日：2005-05-10

Applicant: Michael Gaynes ,  Kathleen Hinge ,  John Knickerbocker

Inventor： Michael Gaynes ,  Kathleen Hinge ,  John Knickerbocker

IPC: H01L23/02

CPC classification number: H05K1/0271 ,  H01L23/562 ,  H01L2224/16 ,  H01L2224/83102 ,  H01L2224/92125 ,  H01L2924/00011 ,  H01L2924/00014 ,  H01L2924/10253 ,  H01L2924/15311 ,  H05K1/181 ,  H05K3/0058 ,  H05K2201/068 ,  H05K2201/10734 ,  H05K2201/10977 ,  H05K2201/2009 ,  H01L2924/00 ,  H01L2224/0401

Abstract: Apparatus and methods are provided for constructing balanced semiconductor chip package structures that minimize bowing, in-plane strain and/or other thermally induced mechanical strains that may arise during thermal cycling, to thus prevent structural damage to chip package structures.

公开(公告)号：US20090181476A1

公开(公告)日：2009-07-16

申请号：US11972129

申请日：2008-01-10

Applicant: Stephen L. Buchwalter ,  Bing Dang ,  Claudius Feger ,  Peter A. Gruber ,  John Knickerbocker

Inventor： Stephen L. Buchwalter ,  Bing Dang ,  Claudius Feger ,  Peter A. Gruber ,  John Knickerbocker

IPC: H01L21/02

CPC classification number: H01L25/0657 ,  H01L25/50 ,  H01L2225/06513 ,  H01L2225/06596 ,  H01L2924/0002 ,  H01L2924/00

Abstract: A method of stacking a chip, including an integrated circuit, onto a substrate including applying an anisotropic conductive film (ACF) or a solder-filled conductive film onto a surface thereof, the surface being configured to electrically couple to the film, placing the chip onto the film, the chip being configured to electrically couple to the film, compressively pressurizing the chip, the film and the surface such that the chip is electrically coupled to the surface via the film,, testing the chip to determine whether the chip is operating normally, reworking the placement of the chip onto the film and repeating the compressive pressurization if the chip is determined to not be operating normally, repeating the testing to determine whether the chip is operating normally, and once the chip is determined to be operating normally, bonding the chip, the film and the surface.

Abstract translation: 一种将包括集成电路的芯片堆叠在基板上的方法，包括将各向异性导电膜（ACF）或焊料填充导电膜施加到其表面上，该表面被配置为电耦合到膜，将芯片 芯片被配置为电耦合到膜，对芯片，膜和表面进行压缩加压，使得芯片经由膜电耦合到表面，测试芯片以确定芯片是否正在操作 通常，如果芯片被确定为不正常工作，重复测试以确定芯片是否正常工作，并且一旦芯片确定正常工作，则将芯片放置在膜上并重复压缩加压， 粘合芯片，薄膜和表面。

公开(公告)号：US20060172565A1

公开(公告)日：2006-08-03

申请号：US10906111

申请日：2005-02-03

Applicant: William Bernier ,  David Eichstadt ,  Mukta Farooq ,  John Knickerbocker

Inventor： William Bernier ,  David Eichstadt ,  Mukta Farooq ,  John Knickerbocker

IPC: H01R12/00

CPC classification number: H01L24/13 ,  G01R1/06716 ,  G01R1/07314 ,  G01R3/00 ,  H01L21/6835 ,  H01L24/11 ,  H01L24/81 ,  H01L2221/68377 ,  H01L2224/11003 ,  H01L2224/114 ,  H01L2224/11505 ,  H01L2224/116 ,  H01L2224/1308 ,  H01L2224/13082 ,  H01L2224/131 ,  H01L2224/13144 ,  H01L2224/13147 ,  H01L2224/13155 ,  H01L2224/13169 ,  H01L2224/1318 ,  H01L2224/13184 ,  H01L2224/81205 ,  H01L2224/8121 ,  H01L2224/81815 ,  H01L2224/8384 ,  H01L2924/00011 ,  H01L2924/00013 ,  H01L2924/00014 ,  H01L2924/01004 ,  H01L2924/01027 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01042 ,  H01L2924/01046 ,  H01L2924/01074 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/14 ,  H01L2924/1461 ,  H01L2924/30105 ,  H01L2924/30107 ,  H05K3/06 ,  H05K3/3436 ,  H05K2201/10242 ,  Y02P70/613 ,  Y10T29/49124 ,  Y10T29/49204 ,  H01L2224/13099 ,  H01L2924/00 ,  H01L2224/0401

Abstract: A method of forming compliant electrical contacts includes patterning a conductive layer into an array of compliant members. The array of compliant members is then positioned to be in contact with electrical connection pads on an integrated circuit wafer and the compliant members are joined to the pads. Then, the supporting layer that supported the compliant members is removed to leave the compliant members connected to the pads.

Abstract translation: 形成顺应性电触头的方法包括将导电层图案化为顺应构件阵列。 然后将顺应构件阵列定位成与集成电路晶片上的电连接焊盘接触，并且柔性构件连接到焊盘。 然后，移除支撑柔顺构件的支撑层，以使与柔性构件连接的衬垫离开。

公开(公告)号：US20050152650A1

公开(公告)日：2005-07-14

申请号：US10756782

申请日：2004-01-13

Applicant: John Knickerbocker ,  How Lin

Inventor： John Knickerbocker ,  How Lin

IPC: G02B6/36 ,  G02B6/38

CPC classification number: G02B6/3672 ,  G02B6/3644 ,  G02B6/3692 ,  G02B6/3696 ,  G02B6/3885

Abstract: A method is provided for making ferrules for connecting optical fibers to other optical fibers or to an optical input device such as an optical chip. The method utilizes ceramic greensheets or silicon wafers. In one method, the greensheets are stacked and laminated and then fiber optic through openings are provided in the laminate for holding the fibers. The laminate is then sintered forming the ferrule.

Abstract translation: 提供了一种用于制造用于将光纤连接到其它光纤或光输入装置（例如光学芯片）的套圈的方法。 该方法采用陶瓷片或硅片。 在一种方法中，将绿色纸堆叠并层压，然后在用于保持纤维的层压体中设置光纤通孔。 然后将层压体烧结形成套圈。

公开(公告)号：US08388782B2

公开(公告)日：2013-03-05

申请号：US12788832

申请日：2010-05-27

Applicant: Paul S. Andry ,  Bing Dang ,  John Knickerbocker ,  Aparna Prahbakar ,  Peter J. Sorce ,  Robert E. Trzcinski ,  Cornelia K. Tsang

Inventor： Paul S. Andry ,  Bing Dang ,  John Knickerbocker ,  Aparna Prahbakar ,  Peter J. Sorce ,  Robert E. Trzcinski ,  Cornelia K. Tsang

IPC: B32B38/10 ,  B32B37/12

CPC classification number: H01L21/67132 ,  C09J5/06 ,  C09J2203/326 ,  C09J2479/08 ,  H01L21/6835 ,  H01L2221/6835 ,  H01L2221/68381 ,  Y10T156/1158

Abstract: A method for attaching a handler to a wafer, the wafer comprising an integrated circuit (IC), includes forming a layer of an adhesive on the wafer, the adhesive comprising a polyimide-based polymer configured to withstand processing at a temperature of over about 280° C.; and adhering a handler to the wafer using the layer of adhesive. A system for attaching a handler to a wafer, the wafer comprising IC, includes a layer of an adhesive located on the wafer, the adhesive comprising a polyimide-based polymer configured to withstand processing at a temperature of over about 280° C.; and a handler adhered to the wafer using the layer of adhesive.

Abstract translation: 一种用于将处理器附接到晶片的方法，所述晶片包括集成电路（IC），包括在所述晶片上形成粘合剂层，所述粘合剂包括基于聚酰亚胺的聚合物，所述聚酰亚胺基聚合物构造成经受超过约280℃的温度下的加工 C。; 以及使用所述粘合剂层将处理器粘附到所述晶片。 一种用于将处理器附接到晶片的系统，包括IC的晶片包括位于晶片上的粘合剂层，所述粘合剂包括基于聚酰亚胺的聚合物，其被配置为经受超过约280℃的温度下的加工; 以及使用粘合剂层粘附到晶片的处理器。

公开(公告)号：US20110290413A1

公开(公告)日：2011-12-01

申请号：US12788839

申请日：2010-05-27

Applicant: Bing Dang ,  Matthew Farinelli ,  John Knickerbocker ,  Aparna Prabhakar ,  Robert E. Trzcinski ,  Cornelia K. Tsang

Inventor： Bing Dang ,  Matthew Farinelli ,  John Knickerbocker ,  Aparna Prabhakar ,  Robert E. Trzcinski ,  Cornelia K. Tsang

IPC: B32B38/10 ,  B29C65/16

CPC classification number: H01L21/6835 ,  B23K26/0622 ,  B23K26/0823 ,  B23K26/361 ,  B23K26/57 ,  B23K2101/40 ,  B23K2103/42 ,  B23K2103/50 ,  C09J5/00 ,  C09J2203/326 ,  C09J2205/302 ,  C09J2400/22 ,  H01L2221/68381 ,  Y10T156/1158 ,  Y10T156/1917

Abstract: A method for releasing a handler from a wafer, the wafer comprising an integrated circuit (IC), includes attaching the handler to the wafer using an adhesive comprising a thermoset polymer, the handler comprising a material that is transparent in a wavelength range of about 193 nanometers (nm) to about 400 nm; ablating the adhesive through the handler using a laser, wherein a wavelength of the laser is selected based on the transparency of the handler material; and separating the handler from the wafer.

Abstract translation: 一种用于从晶片释放处理器的方法，所述晶片包括集成电路（IC），包括使用包含热固性聚合物的粘合剂将所述处理器附接到所述晶片，所述处理器包括在约193的波长范围内是透明的材料 纳米（nm）至约400nm; 使用激光器通过处理器烧蚀粘合剂，其中基于处理材料的透明度选择激光的波长; 并将处理器与晶片分离。