Abstract:
A memory system includes a memory controller that writes data to and reads data from a memory device. A write data strobe accompanying the write data indicates to the memory device when the write data is valid, whereas a read strobe accompanying data from the memory device indicates to the memory controller when the read data is valid. The memory controller adaptively controls the phase of the write data strobe to compensate for timing drift at the memory device. The memory controller uses read signals as a measure of the drift.
Abstract:
A memory controller includes an interface to receive a data strobe signal and corresponding read data. The data strobe signal and the read data correspond to a read command issued by the memory controller, and the read data is received in accordance with the data strobe signal and an enable signal. A circuit in the memory controller is to dynamically adjust a timing offset between the enable signal and the data strobe signal, and control logic is to issue a supplemental read command in accordance with a determination that a time interval since a last read command issued by the memory controller exceeds a predetermined value.
Abstract:
A method of operation in a memory device, comprising storing data in a first group of storage locations in the memory device, storing error information associated with the stored data in a second group of storage locations in the memory device, and selectively evaluating the error information based on a state of an error enable bit, the state based on whether a most recent access to the first group of storage locations involved a partial access.
Abstract:
A memory system includes a memory controller with a plurality N of memory-controller blocks, each of which conveys independent transaction requests over external request ports. The request ports are coupled, via point-to-point connections, to from one to N memory devices, each of which includes N independently addressable memory blocks. All of the external request ports are connected to respective external request ports on the memory device or devices used in a given configuration. The number of request ports per memory device and the data width of each memory device changes with the number of memory devices such that the ratio of the request-access granularity to the data granularity remains constant irrespective of the number of memory devices.
Abstract:
An integrated circuit die includes conductive connection sites located at least on a surface of the integrated circuit die within a contiguous region thereof. The integrated circuit also includes a core circuit located outside the contiguous region. The core circuit is coupled to at least one of the connection sites.
Abstract:
A stacked semiconductor device is disclosed that includes a plurality of semiconductor dies. Each die has oppositely disposed first and second surfaces, with pads formed on each of the surfaces. A plurality of through-vias connect respective pads on the first surface to respective pads on the second surface. The through-vias include a first group of through-vias coupled to respective I/O circuitry on the semiconductor die and a second group of through-vias not coupled to I/O circuitry on the semiconductor die. The plurality of semiconductor dies are stacked such that the first group of through-vias in a first one of the plurality of semiconductor dies are aligned with respective ones of at least a portion of the second group of through-vias in a second one of the plurality of semiconductor dies.
Abstract:
In an integrated circuit device that outputs data values during respective transmit intervals defined by transitions of a transmit clock, the phase of the transmit clock is shifted by half a transmit interval to enable a timing calibration operation. Thereafter, a sequence of data values is transmitted to another integrated circuit device in response to the phase-shifted transmit clock and a samples of the sequence of data values are received from the other integrated circuit device. The received samples are compared with the sequence of data values to determine a phase update value, including comparing at least one received sample with two adjacent data values within the sequence of data values, and the phase of the transmit clock is incrementally advanced or retarded according to the phase update value.
Abstract:
A memory module having integrated circuit (IC) components, a termination structure, an address/control signal path, a clock signal path, multiple data signal paths and multiple strobe signal paths. The strobe signal paths and data signal paths are coupled to respective IC components, and the address/control signal path and clock signal path are coupled in common to all the IC components. The address/control signal path extends along the IC components to the termination structure such that control signals propagating toward the termination structure arrive at address/control inputs of respective IC components at progressively later times corresponding to relative positions of the IC components.
Abstract:
A memory controller is transitioned to a low-power mode in which an active-mode resource required to transmit memory access commands to a memory device at a first command-signaling frequency is disabled. The memory controller transmits a first memory access command to the memory device using an alternative signaling resource during a transitional interval in which the active-mode resource is re-enabled.
Abstract:
A controller includes a link interface that is to couple to a first link to communicate bi-directional data and a second link to transmit unidirectional error-detection information. An encoder is to dynamically add first error-detection information to at least a portion of write data. A transmitter, coupled to the link interface, is to transmit the write data. A delay element is coupled to an output from the encoder. A receiver, coupled to the link interface, is to receive second error-detection information corresponding to at least the portion of the write data. Error-detection logic is coupled to an output from the delay element and an output from the receiver. The error-detection logic is to determine errors in at least the portion of the write data by comparing the first error-detection information and the second error-detection information, and, if an error is detected, is to assert an error condition.