Abstract:
A dual-band Doherty amplifier and method therefor are provided. The dual-band Doherty amplifier includes a first amplifier gain element, a first transmission line coupled to a first output of the first amplifier gain element, a second amplifier gain element, a second transmission line coupled to a second output of the second amplifier gain element, and a controller configured, when a signal to be amplified is in a first band, to provide a first bias signal to a first bias input of the first amplifier gain element and a second bias signal to a second bias input of the second amplifier gain element and, when the signal is in a second band, to provide the second bias signal to the first bias input of the first amplifier gain element and the first bias signal to the second bias input of the second amplifier gain element.
Abstract:
An electronic device comprises a secured module arranged to store secured data. A component outside the secured module has a normal operating mode with a normal mode operating voltage. An interface is arranged to provide access to the secured module. A voltage monitoring unit is connected to the component and arranged to monitor an operating voltage Vsup of the component. An interface control unit is connected to the voltage monitoring unit and the interface. The interface control unit is arranged to inhibit access to the secured module through the interface when the operating voltage is below a predetermined secure access voltage level, the secure access voltage being higher than the normal mode operating voltage.
Abstract:
An LDMOS device implements a substrate having a buried isolation layer, a first well region that incorporates two stacked sub-regions to provide a PN junction with a RESURF effect, and a second well region laterally offset from the first well region. A source region is formed in one of the well regions and a drain region is formed in the other well region. An extension region is disposed immediately adjacent to the first well region and laterally distal to the second well region. An extension biasing region is formed at least partially within the extension region, and is separated from the first well region by a portion of the extension region. One or more metallization structures electrically couple the extension biasing region to the one of the source/drain region in the second well region. A gate structure at least partially overlaps both well regions.
Abstract:
A method for 3D device packaging utilizes through-substrate pillars to mechanically and electrically bond two or more dice. The first die includes a set of access holes extending from a surface of the first die to a set of pads at a metal layer of the first die. The second die includes a set of metal pillars. The first die and the second die are stacked such that each metal pillar extends from a surface of the second die to a corresponding pad via a corresponding access hole. The first die and second die are mechanically and electrically bonded via solder joints formed between the metal pillars and the corresponding pads.
Abstract:
An operating voltage and reference current are adjusted in a memory device. At least a portion of an array of memory cells is preconditioned to an erased state using an erase verify voltage on word lines coupled to the memory cells and a first reference current in sense amplifiers coupled to bit lines for the array. A test reference current is set for the sense amplifiers. A bitcell gate voltage is set on the word lines to a present overdrive voltage. The at least a portion of the array is read. If any of the memory cells in the at least a portion of the array are read as being programmed, the present overdrive voltage is increased until none of the memory cells in the at least a portion of the array are read as being programmed.
Abstract:
A microelectromechanical systems (MEMS) device includes at least two rate sensors (20, 50) suspended above a substrate (30), and configured to oscillate parallel to a surface (40) of the substrate (30). Drive elements (156, 158) in communication with at least one of the rate sensors (20, 50) provide a drive signal (168) exhibiting a drive frequency. One or more coupling spring structures (80, 92, 104, 120) interconnect the rate sensors (20, 50). The coupling spring structures enable oscillation of the rate sensors (20, 50) in a drive direction dictated by the coupling spring structures. The drive direction for the rate sensors (20) is a rotational drive direction (43) associated with a first axis (28), and the drive direction for the rate sensors (50) is a translational drive direction (64) associated with a second axis (24, 26) that is perpendicular to the first axis (28).
Abstract:
A differential line driver circuit comprising a plurality of driver stages is described. Each driver stage is operably coupled to at least one output of the line driver circuit and arranged to receive at least one control signal and to drive at least one output signal on the at least one output of the line driver circuit in accordance with the at least one control signal received thereby. The line driver circuit further comprises at least one delay component arranged to receive the at least one control signal, and to sequentially propagate the at least one control signal to the driver stages with time delays between the propagation of the at least one control signal to sequentially adjacent driver stages. The delay component is arranged to sequentially propagate the at least one control signal to the driver stages such that such that the at least one control signal is propagated with at least one of: a progressively increasing time delay between sequentially adjacent driver stages; and a progressively decreasing time delay between sequentially adjacent driver stages.
Abstract:
In various embodiments, a semiconductor package includes a carrier amplifier connected to a first output of a power divider, and a first output matching network connected to the carrier amplifier and an output combining node. The first output matching network exhibits a phase delay during operation of the carrier amplifier. The semiconductor package includes a phase advance network connected to the first output matching network. The phase advance network is configured to offset at least a portion of the phase delay of the first output matching network. The semiconductor package includes a peaking amplifier connected to a second output of the power divider and the output combining node, and a second output matching network connected to the peaking amplifier.
Abstract:
An on-board reset circuit for a system-on-chip (SOC) addresses the problem of meta-stability in flip-flops on asynchronous reset that arises when different power domains or reset domains receive resets from different sources. To ameliorate the problem, a reset signal is asserted and de-asserted while the clocks are gated. The clocks are re-instated for a minimum period of time following assertion (or de-assertion) so that logic having synchronous reset can also receive the reset.
Abstract:
A semiconductor device is provided which comprises an ESD protection device. The ESD protection device is being formed by one or more pnp transistors which are present in the structure of the semiconductor device. The semiconductor device comprises two portions, of an isolated p-doped region which are separated by an N-doped region. Two p-doped regions are provided within the two portions. The p-dopant concentration of the two-doped region is higher than the p-dopant concentration of the isolated p-doped region. A first electrical contact is connected only via a highly doped p-contact region to the first p-doped region and a second electrical contact is connected only via another highly doped p-contact region to the second p-doped region.