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    METHODS FOR OPTICAL AMPLIFIED IMAGING USING A TWO-DIMENSIONAL SPECTRAL BRUSH
    21.
    发明申请
    METHODS FOR OPTICAL AMPLIFIED IMAGING USING A TWO-DIMENSIONAL SPECTRAL BRUSH 有权
    使用二维光学刷的光学放大成像方法

    公开(公告)号：US20150205090A1

    公开(公告)日：2015-07-23

    申请号：US14610851

    申请日：2015-01-30

    Applicant: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA

    Inventor： Bahram Jalali ,  Keisuke Goda ,  Kevin Kin-Man Tsia

    IPC: G02B21/36

    CPC classification number: G02B21/361 ,  A61B1/00009 ,  A61B1/00193 ,  A61B1/0638 ,  A61B5/0062 ,  A61B5/0066 ,  A61B5/0075 ,  A61B5/0086 ,  A61B5/7257 ,  G01B9/02004 ,  G01B9/02014 ,  G01B9/02028 ,  G01B9/02044 ,  G01B9/02091 ,  G01B11/2441 ,  G01B2290/20 ,  G01B2290/65 ,  G06K9/2036 ,  G06K2209/05 ,  H04N9/045

    Abstract: An apparatus and method for ultrafast real-time optical imaging that can be used for imaging dynamic events such as microfluidics or laser surgery is provided. The apparatus and methods encode spatial information from a sample into a back reflection of a two-dimensional spectral brush that is generated with a two-dimensional disperser and a light source that is mapped in to the time domain with a temporal disperser. The temporal waveform is preferably captured by an optical detector, converted to an electrical signal that is digitized and processed to provide two dimensional and three dimensional images. The produced signals can be optically or electronically amplified. Detection may be improved with correlation matching against a database in the time domain or the spatial domain. Embodiments for endoscopy, microscopy and simultaneous imaging and laser ablation with a single fiber are illustrated.

    Abstract translation: 提供了一种用于超快速实时光学成像的装置和方法，可用于成像诸如微流体或激光手术的动态事件成像。 该装置和方法将来自样本的空间信息编码成二维光谱刷的背反射，其由二维分散器和用时间分散器映射到时域的光源产生。 时间波形优选地由光学检测器捕获，转换成被数字化和处理以提供二维和三维图像的电信号。 产生的信号可以是光学或电子放大的。 可以通过与时域或空间域中的数据库的相关匹配来改进检测。 示出了用于内窥镜检查，显微镜和同时成像以及使用单纤维的激光烧蚀的实施例。

    QUANTITATIVE PHASE MICROSCOPY FOR HIGH-CONTRAST CELL IMAGING USING FREQUENCY DOMAIN PHASE SHIFT
    22.
    发明申请
    QUANTITATIVE PHASE MICROSCOPY FOR HIGH-CONTRAST CELL IMAGING USING FREQUENCY DOMAIN PHASE SHIFT 有权
    使用频域相移的高对比度细胞成像的定量相位显微镜

    公开(公告)号：US20130335548A1

    公开(公告)日：2013-12-19

    申请号：US13523816

    申请日：2012-06-14

    Applicant: Evgenia Mikhailovna Kim ,  Robert John Filkins ,  Chulmin Joo

    Inventor： Evgenia Mikhailovna Kim ,  Robert John Filkins ,  Chulmin Joo

    IPC: H04N7/18

    CPC classification number: G02B21/14 ,  G01B9/04 ,  G01B2290/20 ,  G02B21/0088 ,  G02B21/361

    Abstract: Some systems described herein include a frequency dependent phase plate for generating multiple phase-contrast images of a sample, each from a different frequency range of light, each phase-contrast image for frequency range of light formed from light diffracted by the sample interfered with undiffracted light that has a frequency-dependent baseline relative phase shift from the phase plate. In some embodiments, the multiple phase-contrast images may be used to generate a quantitative phase image of a sample. The phase-contrast images or the produced quantitative phase image may have sufficient contrast for label-free auto-segmentation of cell bodies and nuclei.

    Abstract translation: 本文描述的一些系统包括频率相关相位板，用于产生每个来自不同频率范围的样品的多个相位对比图像，用于由被样品干涉的未衍射的光形成的光的频率范围的每个相位对比度图像 具有频率相关基准的相对于相位板相对相移的光。 在一些实施例中，多个相位对比图像可用于产生样本的定量相位图像。 相位对比图像或产生的定量相位图像可以具有足够的对比度，用于无标记的细胞体和核的自动分割。

    MULTIPLE MEASURING POINT CONFIGURATION FOR A CHROMATIC POINT SENSOR
    24.
    发明申请
    MULTIPLE MEASURING POINT CONFIGURATION FOR A CHROMATIC POINT SENSOR 有权
    一个色度点传感器的多个测量点配置

    公开(公告)号：US20120050722A1

    公开(公告)日：2012-03-01

    申请号：US12869687

    申请日：2010-08-26

    Applicant: Casey Edward Emtman ,  Yong Xie

    Inventor： Casey Edward Emtman ,  Yong Xie

    IPC: G01J1/00

    CPC classification number: G01B11/026 ,  G01B2290/20

    Abstract: A dual beam assembly is provided for attachment to a chromatic confocal point sensor optical pen. The optical pen provides a single source beam having a measurement range R in the absence of the dual beam assembly. The dual beam assembly includes a first reflective element that is positioned in the source beam and divides it into a first measurement beam and a second measurement beam. The dual beam assembly outputs the first and second measurement beams along first and second measurement axes to different workpiece regions and returns workpiece measurement light arising from the first and second measurement beams back to the optical pen. A second reflective element may be included and configured to deflect the second measurement beam along a desired direction. An offset may be provided between the measuring ranges of the first and second measurement beams.

    Abstract translation: 提供双光束组件用于附着到彩色共焦点传感器光笔。 光笔在不存在双光束组件的情况下提供具有测量范围R的单个光源光束。 双光束组件包括位于源光束中的第一反射元件，并将其分成第一测量光束和第二测量光束。 双光束组件将第一和第二测量光束沿着第一和第二测量轴输出到不同的工件区域，并将从第一和第二测量光束产生的工件测量光返回到光笔。 第二反射元件可以被包括并且被配置成沿着期望的方向偏转第二测量光束。 可以在第一和第二测量光束的测量范围之间提供偏移。

    OPTICAL MEASURING DEVICE
    25.
    发明申请
    OPTICAL MEASURING DEVICE 有权
    光学测量装置

    公开(公告)号：US20100183188A1

    公开(公告)日：2010-07-22

    申请号：US12631419

    申请日：2009-12-04

    Applicant: Jochen STRAEHLE ,  Steffen Rath

    Inventor： Jochen STRAEHLE ,  Steffen Rath

    IPC: G06K9/00 ,  G01B11/24 ,  G01B11/06 ,  G01N21/00 ,  H04N5/335

    CPC classification number: G01B11/2441 ,  G01B9/02004 ,  G01B9/0209 ,  G01B11/0625 ,  G01B11/0675 ,  G01B2290/20 ,  G01B2290/45

    Abstract: A method for determining the surface topography of a coated object and for the simultaneous spatially resolved determination of the thickness of the layer on the coated object. It is provided that the surface topography is measured with the aid of white-light interferometry, the thickness of the layer is measured by the principle of reflectometry, and by using, for both measurements, a shared radiation source having an electromagnetic radiation spectrum, which is reflected from the layer surface in a first wavelength range contained in the radiation spectrum and which penetrates into the layer in a second wavelength range contained in the radiation spectrum. Also described is a corresponding optical measuring instrument. The method and the optical measuring instrument make simultaneous highly accurate surface measurement of the surface topography and of the layer thickness of coated objects possible.

    Abstract translation: 一种用于确定涂覆物体的表面形貌的方法，以及用于同时空间解析确定涂覆物体上的层的厚度的方法。 提供的是通过白光干涉测量来测量表面形貌，层的厚度是通过反射测量原理测量的，并且通过对两个测量使用具有电磁辐射光谱的共享辐射源，其中 在包含在辐射光谱中的第一波长范围内的层表面反射，并且穿透辐射光谱中包含的第二波长范围内的层。 还描述了相应的光学测量仪器。 该方法和光学测量仪器可以对表面形貌和涂层物体的层厚度进行同时高精度的表面测量。

    APPARATUS AND METHOD FOR OPTICALLY AMPLIFIED IMAGING
    26.
    发明申请
    APPARATUS AND METHOD FOR OPTICALLY AMPLIFIED IMAGING 有权
    用于光放大成像的装置和方法

    公开(公告)号：US20100141829A1

    公开(公告)日：2010-06-10

    申请号：US12621496

    申请日：2009-11-18

    Applicant: Bahram Jalali ,  Keisuke Goda ,  Kevin Kin-Man Tsia

    Inventor： Bahram Jalali ,  Keisuke Goda ,  Kevin Kin-Man Tsia

    IPC: H04N5/225 ,  G06K9/36

    CPC classification number: G02B21/361 ,  A61B1/00009 ,  A61B1/00193 ,  A61B1/0638 ,  A61B5/0062 ,  A61B5/0066 ,  A61B5/0075 ,  A61B5/0086 ,  A61B5/7257 ,  G01B9/02004 ,  G01B9/02014 ,  G01B9/02028 ,  G01B9/02044 ,  G01B9/02091 ,  G01B11/2441 ,  G01B2290/20 ,  G01B2290/65 ,  G06K9/2036 ,  G06K2209/05 ,  H04N9/045

    Abstract: An apparatus and method for ultrafast real-time optical imaging that can be used for imaging dynamic events such as microfluidics or laser surgery is provided. The apparatus and methods encode spatial information from a sample into a back reflection of a two-dimensional spectral brush that is generated with a two-dimensional disperser and a light source that is mapped in to the time domain with a temporal disperser. The temporal waveform is preferably captured by an optical detector, converted to an electrical signal that is digitized and processed to provide two dimensional and three dimensional images. The produced signals can be optically or electronically amplified. Detection may be improved with correlation matching against a database in the time domain or the spatial domain. Embodiments for endoscopy, microscopy and simultaneous imaging and laser ablation with a single fiber are illustrated.

    Abstract translation: 提供了一种用于超快速实时光学成像的装置和方法，可用于成像诸如微流体或激光手术的动态事件成像。 该装置和方法将来自样本的空间信息编码成二维光谱刷的背反射，其由二维分散器和用时间分散器映射到时域的光源产生。 时间波形优选地由光学检测器捕获，转换成被数字化和处理以提供二维和三维图像的电信号。 产生的信号可以是光学或电子放大的。 可以通过与时域或空间域中的数据库的相关匹配来改进检测。 示出了用于内窥镜检查，显微镜和同时成像以及使用单纤维的激光烧蚀的实施例。

    Low-coherence inferometric device for light-optical scanning of an object
    27.
    发明授权
    Low-coherence inferometric device for light-optical scanning of an object 有权
    用于物体的光学扫描的低相干测量装置

    公开(公告)号：US07170610B2

    公开(公告)日：2007-01-30

    申请号：US10504397

    申请日：2003-02-01

    Applicant: Alexander Knüttel

    Inventor： Alexander Knüttel

    IPC: G01B9/02 ,  G01B11/02 ,  G01J3/45

    CPC classification number: G01B9/0209 ,  G01B11/24 ,  G01B2290/20 ,  G01B2290/35 ,  G01B2290/40 ,  G01N21/4795

    Abstract: Low-coherence interferometric apparatus for light-optical scanning of an object (18) with a low-coherence interferometer (6) comprising a low-coherent light source (7), a reference reflector (21) and a detector (25), wherein light emitted by the light source (7) is split into two optical paths (11,12), a first fraction of the light being irradiated as measurement light (16) onto the object and a second fraction of the light being irradiated as reference light (22) upon the reference reflector (21), and wherein, after reflection on the object (18) or the reference reflector (21) respectively, the measurement light (16) and the reference light (22) are combined at a beam junction (10) in such a manner that an interference signal which contains information about the reflection intensity of the measurement light, relative to the respective scan position is generated.In order to enable a very fast scan, a variable wavelength selection device (30) is positioned in the light path of the detection light between the beam junction (10) and the detector (25). A wavelength-dependent selection of the detection light (24) is performed by this device in such a manner that the detector (25) selectively receives preferentially light with wavelengths which correspond to a predetermined sequence of wavenumbers k. For varying the scan position along the scan path (27) different sequences of wavenumbers k can be set.

    Abstract translation: 一种用于用包括低相干光源（7），参考反射器（21）和检测器（25）的低相干干涉仪（6）对物体（18）进行光学扫描的低相干干涉仪，其中 由光源（7）发射的光被分成两个光路（11,12），第一部分的光作为测量光（16）照射到物体上，第二部分的光被照射作为参考光 （22）在参考反射器（21）上，并且其中，在物体（18）或参考反射器（21）上分别反射之后，测量光（16）和参考光（22）在光束结 （10），使得产生包含关于测量光的反射强度的信息相对于相应扫描位置的干扰信号。 为了实现非常快的扫描，可变波长选择装置（30）位于光束结（10）和检测器（25）之间的检测光的光路中。 检测光（24）的波长相关选择由该装置以这样一种方式进行，使得检测器（25）有选择地接收波长对应于预定波数k序列的光。 为了沿着扫描路径（27）改变扫描位置，可以设定波数k的不同序列。

    Apparatus, systems and methods for detecting light
    29.
    发明授权
    Apparatus, systems and methods for detecting light 有权

    公开(公告)号：US12072188B2

    公开(公告)日：2024-08-27

    申请号：US17605946

    申请日：2020-04-16

    Applicant: PANTECH CORPORATION

    Inventor： Xin Yuan ,  Paul Wilford ,  Mu Qiao ,  Xuan Liu

    IPC: G01B9/02091 ,  G01B9/02015 ,  G01J3/02 ,  G01B9/02004

    CPC classification number: G01B9/02091 ,  G01B9/02027 ,  G01B9/0203 ,  G01J3/0224 ,  G01J3/0229 ,  G01B9/02004 ,  G01B2290/20 ,  G01B2290/70

    Abstract: An apparatus comprising: a double path interferometer comprising a sample path for an object and a reference path; a source of linearly polarized light for the double path interferometer, a phase plate positioned in the sample path; means for superposing the sample path and reference path to create a beam of light for detection; means for spatially modulating the beam of light to produce a modulated beam of light; means for dispersing the modulated beam of light to produce a spatially modulated and dispersed beam of light; a first detector; a second detector, and means for splitting the spatially modulated and dispersed beam of light, wherein light of a first linear polarization is directed to the first detector and light of a second linear polarization, orthogonal to the first linear polarization, is directed to the second detector.

    BROADBAND INTERFEROMETRY AND METHOD FOR MEASUREMENT RANGE EXTENSION BY USING SAME
    30.
    发明公开
    BROADBAND INTERFEROMETRY AND METHOD FOR MEASUREMENT RANGE EXTENSION BY USING SAME 审中-公开

    公开(公告)号：US20230324165A1

    公开(公告)日：2023-10-12

    申请号：US17716266

    申请日：2022-04-08

    Applicant: AUTOMATED PRECISION INC.

    Inventor： Yongwoo PARK ,  Shuai SUN ,  Kam LAU

    IPC: G01B9/0209

    CPC classification number: G01B9/0209 ,  G01B2290/20 ,  G01B2290/70 ,  G01B2290/35 ,  G01B2290/25

    Abstract: A broadband interferometry for a measurement range extension beyond a coherence length of a light source includes a wavelength tunable laser as the light source outputting a coherence wavelength beam; and an interferometer disposed between the wavelength tunable laser and a target to be measured and including a reference arm, a measurement arm and a device combining a reference beam and measurement mean to produce a combined interference beam, wherein a local oscillation of the reference beam is replicated by a cavity multiplication or cascading optical delayed lines with a fiber optic cavity, and quantifiable optical properties including a wavelength group delay, a chromatic dispersion, a polarization mode dispersion and a model dispersion are inserted into the local oscillation of the reference beam to incrementally quantify the replicated copies of the local oscillation as the number of the delayed copies of the local oscillation increase for extension of a measurement rage to the target.

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