Nucleation Interface for High-K Layer on Germanium
    53.
    发明申请
    Nucleation Interface for High-K Layer on Germanium 有权
    锗上高K层的成核界面

    公开(公告)号:US20140252565A1

    公开(公告)日:2014-09-11

    申请号:US14198480

    申请日:2014-03-05

    Abstract: A germanium-containing semiconductor surface is prepared for formation of a dielectric overlayer (e.g., a thin layer of high-k gate dielectric) by (1) removal of native oxide, for example by wet cleaning, (2) additional cleaning with hydrogen species, (3) in-situ formation of a controlled monolayer of GeO2, and (4) in-situ deposition of the dielectric overlayer to prevent uncontrolled regrowth of native oxide. The monolayer of GeO2 promotes uniform nucleation of the dielectric overlayer, but it too thin to appreciably impact the effective oxide thickness of the dielectric overlayer.

    Abstract translation: 制备含锗的半导体表面,用于通过(1)去除天然氧化物,例如通过湿法清洁来形成电介质覆盖层(例如,高k栅极电介质的薄层),(2)用氢物质进行额外的清洁 ,(3)原位形成受控单层的GeO 2,以及(4)电介质覆层的原位沉积,以防止天然氧化物的不受控制的再生长。 GeO2的单层促进电介质覆盖层的均匀成核,但它太薄而不能明显影响电介质覆盖层的有效氧化物厚度。

    Sputter Gun
    54.
    发明申请
    Sputter Gun 审中-公开
    溅射枪

    公开(公告)号:US20140174918A1

    公开(公告)日:2014-06-26

    申请号:US13721419

    申请日:2012-12-20

    Abstract: A sputter gun is provided. The sputter gun includes a target and a first plate coupled to a surface of the target. A first magnet is disposed over a second magnet. A second plate coupled to a surface of the first magnet and a gap is defined between a surface of the second magnet and a surface of the first plate. A fluid inlet and a fluid outlet are disposed above a surface of the first magnet. A restriction bar is coupled to the second plate, wherein the restriction bar is configured to prevent a flow path of fluid through the first inlet to the second inlet unless the fluid traverses the gap defined between a surface of the second magnet and a surface of the first plate. Alternative configurations of the sputter gun are included.

    Abstract translation: 提供溅射枪。 溅射枪包括目标和耦合到靶的表面的第一板。 第一磁体设置在第二磁体上。 耦合到第一磁体的表面的第二板和间隙限定在第二磁体的表面和第一板的表面之间。 流体入口和流体出口设置在第一磁体的表面上方。 限制杆联接到第二板,其中限制杆被配置为防止流体通过第二入口的第一入口的流动路径,除非流体穿过限定在第二磁体的表面与第二磁体的表面之间的间隙 第一盘。 包括溅射枪的替代配置。

    Methods and Systems for Reducing Particles During Physical Vapor Deposition
    55.
    发明申请
    Methods and Systems for Reducing Particles During Physical Vapor Deposition 审中-公开
    物理气相沉积过程中减少颗粒的方法和系统

    公开(公告)号:US20140174914A1

    公开(公告)日:2014-06-26

    申请号:US13938781

    申请日:2013-07-10

    Inventor: Chi-I Lang

    CPC classification number: C23C14/3414

    Abstract: Embodiments provided herein describe methods and systems for depositing material onto a surface. A target including a material in a porous state is provided. The density of the material in the porous state is less than 93% of the absolute density of the material. The target is positioned over a surface. At least some of the material is caused to be ejected from the target and deposited onto the surface. Films deposited from the porous targets exhibit significantly fewer particle defects than films of the same material deposited from the conventionally preferred higher-density targets. Brittle materials, such as alloys of refractory metals and silicon, seem to particularly benefit. The larger, less-uniform layered grains of the porous targets seem less prone to 10-micron-scale delamination than the smaller, more uniform grains of denser targets.

    Abstract translation: 本文提供的实施例描述了将材料沉积到表面上的方法和系统。 提供了包括多孔状态的材料的靶。 多孔态的材料密度小于材料绝对密度的93%。 目标位于表面上方。 使至少一些材料从靶上喷出并沉积在表面上。 从多孔靶沉积的膜比常规优选的较高密度靶沉积的相同材料的膜显示出显着更少的颗粒缺陷。 脆性材料,如难熔金属和硅的合金似乎特别有益。 多孔靶的较大的,较不均匀的层状颗粒似乎比较致密的靶的较小的,更均匀的颗粒更不容易发生10微米级的分层。

    High Throughput Quantum Efficiency Combinatorial Characterization Tool and Method for Combinatorial Solar Test Substrates
    57.
    发明申请
    High Throughput Quantum Efficiency Combinatorial Characterization Tool and Method for Combinatorial Solar Test Substrates 审中-公开
    组合太阳能测试基板的高通量量子效率组合表征工具和方法

    公开(公告)号:US20140071435A1

    公开(公告)日:2014-03-13

    申请号:US14077545

    申请日:2013-11-12

    CPC classification number: G01R31/26 G01N21/55 G01R31/2607 H02S50/10

    Abstract: Simultaneous measurement of an internal quantum efficiency and an external quantum efficiency of a solar cell using an emitter that emits light; a three-way beam splitter that splits the light into solar cell light and reference light, wherein the solar cell light strikes the solar cell; a reference detector that detects the reference light; a reflectance detector that detects reflectance light, wherein the reflectance light comprises a portion of the solar cell light reflected off the solar cell; a source meter operatively coupled to the solar cell; a multiplexer operatively coupled to the solar cell, the reference detector, and the reflectance detector; and a computing device that simultaneously computes the internal quantum efficiency and the external quantum efficiency of the solar cell.

    Abstract translation: 使用发射光的同时测量太阳能电池的内部量子效率和外部量子效率; 三光束分离器,其将光分解成太阳能电池光和参考光,其中太阳能电池光照射到太阳能电池; 检测参考光的参考检测器; 反射光检测器,其检测反射光,其中所述反射光包括从太阳能电池反射的太阳能电池光的一部分; 可操作地耦合到太阳能电池的源计量器; 可操作地耦合到太阳能电池,参考检测器和反射检测器的多路复用器; 以及同时计算太阳能电池的内部量子效率和外部量子效率的计算装置。

    High throughput current-voltage combinatorial characterization tool and method for combinatorial solar test substrates

    公开(公告)号:US08552755B2

    公开(公告)日:2013-10-08

    申请号:US13849749

    申请日:2013-03-25

    CPC classification number: G01R31/26 G01N21/55 G01R31/2607 H02S50/10

    Abstract: Measuring current-voltage (I-V) characteristics of a solar cell using a lamp that emits light, a substrate that includes a plurality of solar cells, a positive electrode attached to the solar cells, and a negative electrode peripherally deposited around each of the solar cells and connected to a common ground, an articulation platform coupled to the substrate, a multi-probe switching matrix or a Z-stage device, a programmable switch box coupled to the multi-probe switching matrix or Z-stage device and selectively articulating the probes by raising the probes until in contact with at least one of the positive electrode and the negative electrode and lowering the probes until contact is lost with at least one of the positive electrode and the negative electrode, a source meter coupled to the programmable switch box and measuring the I-V characteristics of the substrate.

    Method and System of Improved Uniformity Testing
    59.
    发明申请
    Method and System of Improved Uniformity Testing 审中-公开
    改进均匀性测试方法与系统

    公开(公告)号:US20130122614A1

    公开(公告)日:2013-05-16

    申请号:US13713421

    申请日:2012-12-13

    Abstract: A method and system includes a first substrate and a second substrate, each substrate comprising a predetermined baseline transmittance value at a predetermine wavelength of light, processing regions on the first substrate by combinatorially varying at least one of materials, process conditions, unit processes, and process sequences associated with the graphene production, performing a first characterization test on the processed regions on the first substrate to generate first results, processing regions on a second substrate in a combinatorial manner by varying at least one of materials, process conditions, unit processes, and process sequences associated with the graphene production based on the first results of the first characterization test, performing a second characterization test on the processed regions on the second substrate to generate second results, and determining whether at least one of the first substrate and the second substrate meet a predetermined quality threshold based on the second results.

    Abstract translation: 一种方法和系统包括第一衬底和第二衬底,每个衬底在光的预定波长处包括预定的基线透射率值,第一衬底上的处理区域通过组合地改变材料,工艺条件,单元工艺中的至少一个和 与所述石墨烯生产相关联的工艺序列,对所述第一衬底上的所述经处理区域执行第一表征测试以产生第一结果,通过改变材料,工艺条件,单位过程中的至少一种以组合方式处理第二衬底上的区域, 以及基于第一表征测试的第一结果与石墨烯生产相关联的处理顺序,对第二衬底上的经处理区域执行第二表征测试以产生第二结果,以及确定第一衬底和第二衬底中的至少一个 基板满足预定的质量阈值 基于第二个结果。

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