DOUBLE-SIDE EXPOSED SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
    80.
    发明申请
    DOUBLE-SIDE EXPOSED SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD 有权
    双面暴露半导体器件及其制造方法

    公开(公告)号:US20130026615A1

    公开(公告)日:2013-01-31

    申请号:US13193474

    申请日:2011-07-28

    IPC分类号: H01L21/60 H01L23/495

    摘要: A double-side exposed semiconductor device includes an electric conductive first lead frame attached on top of a thermal conductive but electrical nonconductive second lead frame and a semiconductor chip flipped and attached on top of the first lead frame. The gate and source electrodes on top of the flipped chip form electrical connections with gate and source pins of the first lead frame respectively. The flipped chip and center portions of the first and second lead frames are then encapsulated with a molding compound, such that the heat sink formed at the center of the second lead frame and the drain electrode at bottom of the semiconductor chip are exposed on two opposite sides of the semiconductor device. Thus, heat dissipation performance of the semiconductor device is effectively improved without increasing the size of the semiconductor device.

    摘要翻译: 双面露出的半导体器件包括安装在导热但不导电的第二引线框架的顶部的导电第一引线框架和翻转并附接在第一引线框架顶部上的半导体芯片。 翻转芯片顶部的栅极和源极电极分别与第一引线框架的栅极和源极引脚形成电连接。 第一和第二引线框架的翻转芯片和中心部分然后用模塑料封装,使得形成在第二引线框架的中心处的散热器和在半导体芯片的底部的漏电极暴露在两个相对的 半导体器件的侧面。 因此,在不增加半导体器件的尺寸的情况下,有效地提高了半导体器件的散热性能。