Apparatus and method for containing semiconductor chips to identify known good dies
    9.
    发明授权
    Apparatus and method for containing semiconductor chips to identify known good dies 失效
    用于包含半导体芯片以识别已知的良好裸片的装置和方法

    公开(公告)号:US06340838B1

    公开(公告)日:2002-01-22

    申请号:US09241655

    申请日:1999-02-02

    IPC分类号: G01R3102

    摘要: An apparatus for identifying a known good die according to an embodiment of the present invention includes a carrier for containing a bare semiconductor chip, a lid for covering the carrier, and a stopper for sealing the apparatus. The carrier includes: a body, in which a chip mount cavity and multiple vacuum suction holes are formed; inner connection terminals formed on a bottom surface of the chip mount cavity to communicate electrically with the bare chip; and outer connection terminals extending from the inner connection terminals to outside the body. The apparatus has an outer configuration of a conventional semiconductor package, so that the apparatus can fit into conventional test equipment. Therefore, the carrier can have a configuration of a plastic package, such as the SOP or SOJ, without a semiconductor chip. Accordingly, the apparatus according to the present invention can use conventional handling and burn-in test equipment in identifying of known good dies and thereby reduce production cost of the known good dies.

    摘要翻译: 根据本发明的实施例的用于识别已知的良好裸片的装置包括用于容纳裸半导体芯片的载体,用于覆盖载体的盖和用于密封该装置的止动件。 载体包括:其中形成有芯片安装腔和多个真空吸孔的主体; 内部连接端子形成在芯片安装腔的底表面上以与裸芯片电气连通; 以及从内部连接端子延伸到主体外部的外部连接端子。 该装置具有常规半导体封装的外部结构,使得该装置可以装配到常规的测试设备中。 因此,载体可以具有没有半导体芯片的诸如SOP或SOJ的塑料封装的构造。 因此,根据本发明的装置可以使用常规的处理和老化测试设备来识别已知的良好模具,从而降低已知的良好模具的生产成本。