LOW PROFILE IMAGE SENSOR PACKAGE
    25.
    发明申请
    LOW PROFILE IMAGE SENSOR PACKAGE 审中-公开
    低剖面图像传感器包装

    公开(公告)号:WO2007059193A2

    公开(公告)日:2007-05-24

    申请号:PCT/US2006044301

    申请日:2006-11-14

    Abstract: A microelectronic element such as an imaging semiconductor chip (72) is packaged by bonding a lid wafer (20') having recesses (32) open to its bottom surface to a device wafer (50) including a plurality of the microelectronic elements or chips, so that the recesses overlie active regions such as imaging regions (58) of the device wafer. Where the devices include microlenses (60) associated with an imaging region of each chip, the microlenses may be received in the recesses. Land regions (24') of the lid wafer may be disposed very close to the top surface (52) of the device wafer, as for example, abutting the top surface of the device wafer or separated from such top surface only by an extremely thin coating of a bonding material such as an adhesive or solder. The bonded lid wafer and device wafer may be severed to form individual units (70) . The top surface (22) of the lid wafer may be precisely parallel with the top surface of the device wafer.

    Abstract translation: 诸如成像半导体芯片(72)的微电子元件通过将具有其底表面开口的凹口(32)的盖晶片(20')结合到包括多个微电子元件或芯片的器件晶片(50)而被封装, 使得凹槽覆盖诸如器件晶片的成像区域(58)的有源区域。 在装置包括与每个芯片的成像区域相关联的微透镜(60)的情况下,微透镜可以被容纳在凹部中。 盖晶片的区域(24')可以非常靠近器件晶片的顶表面(52)设置,例如,邻接器件晶片的顶表面或与顶表面分离,仅极薄 粘合材料如粘合剂或焊料的涂覆。 接合的盖子晶片和器件晶片可以被切断以形成单独的单元(70)。 盖晶片的顶表面(22)可以精确地平行于器件晶片的顶表面。

    MICRO PIN GRID ARRAY WITH WIPING ACTION
    28.
    发明申请
    MICRO PIN GRID ARRAY WITH WIPING ACTION 审中-公开
    微型网格阵列与WIPING动作

    公开(公告)号:WO2005065424A3

    公开(公告)日:2006-07-20

    申请号:PCT/US2004044088

    申请日:2004-12-21

    Abstract: A microelectronic package includes a mounting structure (136), a microelectronic element associated with the mounting structure, and a plurality of conductive posts (146) physically connected to the mounting structure and electrically connected to the microelectronic element. The conductive posts (146) project from the mounting structure (136) in an upward direction (Z), at least one of the conductive posts being an offset post. Each offset post has a base (154) connected to the mounting structure (136), the base of each offset post defining a centroid (156). Each offset post also defines an upper extremity (178) having a centroid (160), the centroid of the upper extremity being offset from the centroid (156) of the base (154) in a horizontal offset direction transverse to the upward direction (Z). The mounting structure (136) is adapted to permit tilting of each offset post about a horizontal axis so that the upper extremities (178) may wipe across a contact pad of an opposing circuit board.

    Abstract translation: 微电子封装包括安装结构(136),与安装结构相关联的微电子元件以及物理连接到安装结构并电连接到微电子元件的多个导电柱(146)。 导电柱(146)从安装结构(136)沿向上的方向(Z)突出,至少一个导电柱是偏移柱。 每个偏移柱具有连接到安装结构(136)的基部(154),每个偏移柱的基部限定重心(156)。 每个偏移柱还限定具有质心(160)的上端(178),上端的质心在垂直于向上方向(Z)的水平偏移方向上偏离基座(154)的重心(156) )。 安装结构(136)适于允许每个偏移柱绕水平轴线倾斜,使得上端(178)可以擦拭相对电路板的接触垫。

    WAFER LEVEL MICROELECTRONIC PACKAGING WITH DOUBLE ISOLATION

    公开(公告)号:WO2006044219A3

    公开(公告)日:2006-04-27

    申请号:PCT/US2005/035962

    申请日:2005-10-06

    Abstract: A microelectronic package may include front and rear covers (46', 60') overlying the front and rear surfaces of a microelectronic element (22') such as an infrared sensor and spaces between the microelectronic element and the covers to provide thermal isolation. A sensing unit including a microelectronic package may include a reflector (76) spaced from the front cover to provide an analyte space, and the microelectronic element may include an emitter (28) and a detector (30) so that radiation directed from the emitter will be reflected by the sensor to the detector, and such radiation will be affected by the properties of the analyte in the analyte space. Such a unit provides a compact, economical chemical sensor. Other packages include elements such as valves (515, 521) for passing fluids into and out of the spaces within the package itself.

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