Abstract:
The present invention provides an epoxy resin composition including 2,2',7,7'-tetraglycidyloxy-1,1'-binaphthalene as an epoxy resin (A), and a filler (B). Further, the present invention provides an epoxy resin composition in which the filler (B) in the epoxy resin composition is a thermally conductive filler and an epoxy resin composition in which the filler (B) is silica. Further, the present invention provides a cured product produced by curing the epoxy resin composition of the present invention and a heat dissipation material and an electronic material each including the cured product.
Abstract:
Reconstitution techniques for semiconductor packages are provided. One reconstitution technique is used to encapsulate (348) a plurality of semiconductor packages (336,354,356) into a single multi-chip module (fig. 3e). Solder balls (326) coupled to each package may be partially exposed after reconstitution, which enables the packages to be coupled to another device. Another reconstitution technique is used to couple a plurality of semiconductor packages into a package-on-package module using self-alignment feature(s) (fig. 6k). The self-alignment feature(s) are exposed solder ball(s) (626) that are included in the bottom package of the package-on-package module. The exposed solder ball(s) serve as a frame of reference to other solder balls (624) that are encapsulated by an encapsulation material (634). After the location of these other solders balls are determined, through-mold vias (636a,636b) may be formed in the encapsulation material at locations corresponding to the other solder balls. The top package of the package-on-package module may then be coupled to the bottom package using these solder balls.
Abstract:
Disclosed herein is a thermally conductive composition, comprising 20 to 80 wt % of a thermoplastic or thermosetting polymer; 10 to 70 wt % of a metal hydroxide; and a polymeric char forming agent, where the polymeric char forming agent provides the thermally conductive composition with a flame retardancy of V-0 at a thickness of 1.5 millimeters or less when tested as per a UL-94 testing protocol; where the weight percents are based on a total weight of the thermally conductive composition.
Abstract:
A semiconductor device according to an embodiment includes a first semiconductor unit including a plurality of first semiconductor chips (12a,12b), an organic resin (16) provided between the first semiconductor chips, a wiring layer (18) provided above the first semiconductor chips to electrically connect the first semiconductor chips to each other, and a plurality of connecting terminals (24) provided on an upper portion of the wiring layer and a second semiconductor unit (22) fixed to a wiring layer side of the first semiconductor unit, the second semiconductor unit fixed to a region sandwiched between the connecting terminals, the second semiconductor unit having a second semiconductor chip, the second semiconductor unit electrically connected to the first semiconductor unit.
Abstract:
The present invention provides a composition of which viscosity does not cause the problem of use at high temperature in the mounting process of electronic device. The present invention relates to a composition for electronic device comprising (a) a (meth)acrylic compound and (c) a particle having a functional group having metal scavenging functionality.