Substrate and method for inspection
    64.
    发明公开
    Substrate and method for inspection 审中-公开
    Substrat und Verfahren zurPrüfung

    公开(公告)号:EP1014096A2

    公开(公告)日:2000-06-28

    申请号:EP99310179.9

    申请日:1999-12-17

    Abstract: A substrate (50) is used for inspecting an electronic device (40) having bump-shaped connection terminals (42), and is used for an electrical test on the electronic device (40). The substrate includes opening sections (11), the diameter of which are determined so that a connection terminal (42) can be inserted into and drawn out from the opening (11), which are formed in a region on one side of an insulating substrate (10). The substrate (10) has an arrangement of connection terminals (20); and wiring patterns (14, 16) which corresponds to those of the electronic device (40). Each of the wiring patterns is composed of a pad section (16) exposed on a bottom face of the opening (11) so that the pad (16) can come into contact with the connection terminal (42) to accomplish electrical continuity, a connecting pad section (20) which is formed in a region outside of the region in which the pad section (16) is formed, and which comes into contact with a contact terminal (35) of an inspection device so as to accomplish electrical continuity, and a wiring section (14) for electrically connecting the pad section (16) with the connecting pad section (20). The wiring patterns (14, 16, 20) are formed on the other side of the insulating substrate (10).

    Abstract translation: 基板(50)用于检查具有凸起状连接端子(42)的电子设备(40),并用于电子设备(40)的电气测试。 衬底包括开口部分(11),其直径被确定为使得可以将连接端子(42)插入并从开口(11)中拉出,该开口部分形成在绝缘衬底的一侧的区域中 (10)。 基板(10)具有连接端子(20)的布置。 以及对应于电子设备(40)的布线图案(14,16)。 每个布线图案由露出在开口(11)的底面上的垫部分(16)组成,使得垫(16)可以与连接端子(42)接触以实现电连续性,连接 衬垫部分(20),其形成在形成有所述衬垫部分(16)的区域的外侧的区域中,并且与所述检查装置的接触端子(35)接触以实现电连续性;以及 用于将焊盘部分(16)与连接焊盘部分(20)电连接的接线部分(14)。 布线图案(14,16,20)形成在绝缘基板(10)的另一侧。

Patent Agency Ranking