摘要:
A protection system that protects a booster circuit used to boost operating signals in a memory device. The system includes a protection circuit for protecting an output transistor of the booster circuit. The protection circuit includes a transfer gate coupled to the output transistor and coupled to receive a first boost signal and a second boost signal. The transfer gate opens and closes in response to the second boost signal. When the transfer gate is closed, the first boost signal is uncoupled from the output transistor, and when the transfer gate is opened, the first boost signal is coupled to the output transistor. The circuit also includes a protection transistor coupled to the second boost signal, a supply voltage and the output transistor, where the protection transistor couples the supply voltage to the output transistor when the transfer gate is closed.
摘要:
Reading data from a core memory consumes more power when the data sets being driven change state, especially when bursting out the data at high speed. Power saving for a burst mode implementation improves the power consumed by inverting the data sets whenever a majority of the data changes states from set to set and including a separate output indicating whether the data being driven is inverted. Present data is selected from the core memory and clocked into the power saving arrangement. The present data is compared with previously selected data to determine whether the majority of data presently selected has changed from the previously selected data. In addition, the present selected data is also delayed and then subjected to a logical XOR function with the majority determination above. Finally, the data subjected to the logical XOR function and the majority determination are driven separately to external elements requesting the present data. Thus, power is saved as the state of the majority of the data being driven from one data set to the next remains unchanged.
摘要:
A system and a method are disclosed for providing a power saving mode during reading a memory device. A new memory content is read from the memory and, before being put at the memory output bus, is compared with the previously read memory content, which is currently on the output bus of the memory device. If the result of the comparison indicates that more than half of the memory output bits have to be toggled in order to put the new memory content on the memory output bus, the new data is inverted internally in order to reduce the number of output pins toggles. Then, the memory device sends a signal to the microprocessor or microcontroller indicating that the new data is inverted, and that the new data has to be inverted back before being put on the memory output bus.
摘要:
An address transition signal generator for a dual bank flash memory device is disclosed. The generator includes signal transition detectors which monitor control signals of the device for transitions in their logical values. Upon detection of a signal transition, the transition detectors send a signal across equidistant signal paths to bank address transition detect signal generator circuits. This results in simultaneous generation of the address transition detect signal from each of the bank address transition detect signal generator circuits.
摘要:
A flash-erasable semiconductor memory device comprises a memory cell array including a plurality of memory cell transistors each having an insulated floating gate for storing information and a control electrode provided on said floating gate, wherein the flash-erasable semiconductor memory device includes a write control circuit supplied with a write control signal, when writing information. The write control circuit produces a control signal such that a leading edge of the drain control signal appears after a leading edge of the gate control signal. Further, the gate control circuit shuts off the gate control signal such that a trailing edge of the gate control signal appears after a trailing edge of the drain control signal.
摘要:
A flash memory performs channel erasing or source erasing by applying a negative voltage to a control gate. The device includes a voltage restriction device which restricts the negative voltage to be applied to the control gate so that the negative voltage will be a constant value relative to the voltage of the channel or source. Alternatively, two voltage restricting devices restrict the negative voltage applied to the control gate and the voltage to be applied to the source so that the voltages will be a constant value relative to a common reference voltage.
摘要:
The present invention relates to improvements in erasing a flash memory. An object of the present invention is to shorten the erasing time. During pre-erase writing, at least either word lines or bit lines are selected in units of multiple lines at a time, and data are written in multiple selective transistors simultaneously.
摘要:
A semiconductor memory having address buffer means, memory cell means, word line selection means, bit line selection means, an output buffer, first address generation means connected to the address buffer means, for providing and address for specifying a group of data pieces, and second address generation means for providing addresses for specifying the data pieces, respectively, the semiconductor memory comprising first reading means for selecting and reading a group of data pieces through one of the word line selection means and bit line selection means according to an address provided by the first address generation means, second reading means for selecting the data pieces, which have been selected and read according to the address provided by the first address generation means, through one of the bit line selection means and word line selection means according addresses provided by the second address generation means and providing them to the output buffer; and pre-reading means for reading another group of data pieces according the another address to be provided by the first address generation means while the preceding data pieces are being read according to the preceding address provided by the first address generation means and being selectively provided to the output buffer according to the addresses provided by the second address generation means.
摘要:
A non-volatile semiconductor memory device includes a semiconductor substrate with a first conductivity type, a first well of a second conductivity type formed on the semiconductor substrate, a second well of the first conductivity type formed on the first well, a plurality of memory cells provided in the second well and each including a tunneling insulation film having a thickness allowing a tunneling of carriers, a floating gate electrode provided on the tunneling insulation film, an interlayer insulation film provided on the floating gate electrode, a control electrode provided on the interlayer insulation film, and a pair of diffusion regions of the first conductivity type formed on the second well at both sides of a channel region. An erasing circuit is provided for dissipating electric charges held in the floating gate electrode into the channel region through the tunneling insulation film in the form of a tunneling current, wherein the erasing circuit applies, in response to a start signal indicative of commencement of erasing, a first erase signal to the first well and a second erase signal having a polarity identical to the first erase signal to the second well, such that the first erase signal is applied in advance to the second erase signal.
摘要:
A semiconductor memory device has 2.sup.n word lines, a plurality of bit lines, a plurality of nonvolatile memory cells disposed at each intersection of the word lines and the bit lines, a write circuit for writing data to a memory cell located at an intersection of selected ones of the word lines and the bit lines, and a sense amplifier for reading data out of the memory cells. Further, the semiconductor memory device comprises a first unit for simultaneously selecting a block of 2.sup.m (n>m) word lines among the 2.sup.n word lines, and a second unit for not selecting a block of 2.sup.k (m>k) word lines among the 2.sup.m word lines. The second unit does not select the block of 2.sup.k word lines, and selects a block of 2.sup.k word lines prepared outside the 2.sup.n word lines when any one of the 2.sup.k word lines among the 2.sup.m word lines is defective. Consequently, redundant word lines are effectively employed, write and verify operations are stable, and thereby the yield and performance of the semiconductor memory device are improved.