Lift pin alignment and operation methods and apparatus
    112.
    发明授权
    Lift pin alignment and operation methods and apparatus 失效
    提升针对准和操作方法和装置

    公开(公告)号:US06935466B2

    公开(公告)日:2005-08-30

    申请号:US09797459

    申请日:2001-03-01

    CPC分类号: H01L21/68742 Y10S414/135

    摘要: A lifting mechanism includes a plurality of lift pins which may be driven separately and independently upward to engage an alignment surface of the chamber using ambient atmospheric pressure as the chamber is evacuated by a pump. In the illustrated embodiment, each lift pin includes a piston which is exposed to the internal chamber pressure on one side of the piston, and is exposed to the external ambient pressure on the other side of the piston. As the pump evacuates the chamber, the internal chamber pressure decreases, causing each lift pin piston to drive the associated lift pin upward. Once all the lift pins have securely engaged the alignment surface, the lift pins may be clamped to a linking mechanism to permit a motor to actuate the lift pins during processing operations.

    摘要翻译: 提升机构包括多个提升销,所述提升销可以单独驱动并且独立地向上驱动,以便当所述室被泵排空时,使用环境大气压与室的对准表面接合。 在所示的实施例中,每个提升销包括活塞,该活塞暴露于活塞的一侧上的内部室压力,并且暴露于活塞另一侧的外部环境压力。 当泵排空室时,内部室压力降低,导致每个升降销活塞向上驱动相关联的升降销。 一旦所有升降销牢固地接合到对准表面上,升降销可以被夹紧到连接机构,以允许马达在加工操作期间致动提升销。

    Measurement techniques for controlling aspects of a electroless deposition process
    115.
    发明申请
    Measurement techniques for controlling aspects of a electroless deposition process 有权
    用于控制无电沉积工艺方面的测量技术

    公开(公告)号:US20050084615A1

    公开(公告)日:2005-04-21

    申请号:US10794592

    申请日:2004-03-05

    摘要: Embodiments of the invention generally provide a fluid processing chamber, sensors and a controller and method for using the same. The fluid processing chamber includes an inlet region, a processing region and an outlet region. The inlet region generally contains one or more sensors and an external controller to monitor the characteristics of the processing fluid at the inlet to the processing region. The outlet region generally contains one or more sensors and an external controller to monitor the characteristics of the processing fluid leaving the processing region of the chamber. In one embodiment the processing region contains one or more sensors and an external controller to monitor the characteristics of the processing fluid in the processing region. The sensors may include, for example, an ORP probe, a temperature sensor, a conductivity sensor, a dissolved hydrogen sensor, a dissolved oxygen sensor, and a pH sensor. The fluid processing chamber is generally useful for all process steps done to deposit an electroless deposited film on a substrate including, for example, all pre-clean process steps (substrate preparation steps), all electroless activation process steps, all electroless deposition steps, and all post electroless deposition cleaning steps.

    摘要翻译: 本发明的实施例通常提供流体处理室,传感器以及使用该流体处理室的控制器和方法。 流体处理室包括入口区域,处理区域和出口区域。 入口区域通常包含一个或多个传感器和外部控制器,以监控处理区域入口处的处理流体的特性。 出口区域通常包含一个或多个传感器和外部控制器,以监测离开室的处理区域的处理流体的特性。 在一个实施例中,处理区域包含一个或多个传感器和外部控制器,用于监视处理区域中处理流体的特性。 传感器可以包括例如ORP探针,温度传感器,电导率传感器,溶解氢传感器,溶解氧传感器和pH传感器。 流体处理室通常可用于在基底上沉积无电沉积膜的所有工艺步骤,包括例如所有预清洁工艺步骤(衬底制备步骤),所有无电解激活工艺步骤,所有无电沉积步骤和 所有后期无电沉积清洗步骤。

    System for planarizing metal conductive layers
    118.
    发明授权
    System for planarizing metal conductive layers 失效
    用于平坦化金属导电层的系统

    公开(公告)号:US06770565B2

    公开(公告)日:2004-08-03

    申请号:US10043561

    申请日:2002-01-08

    IPC分类号: H01L2302

    摘要: A method of planarizing a metal conductive layer on a substrate is provided. In one embodiment, a substrate having a metal conductive layer disposed on a top surface of the substrate is provided on a substrate support. The substrate support is rotated and the top surface of the substrate is contacted with a liquid etching composition. The metal conductive layer is then exposed to an etchant gas in order to planarize the top surface of the metal conductive layer. Also provided is an apparatus for etching a metal conductive layer on a substrate. The apparatus comprises a container, a substrate support disposed in the container, a rotation actuator attached to the substrate support, and a fluid delivery assembly disposed in the container.

    摘要翻译: 提供了在基板上平面化金属导电层的方法。 在一个实施例中,在衬底支架上设置具有设置在衬底顶表面上的金属导电层的衬底。 衬底支撑件旋转并且衬底的顶表面与液体蚀刻组合物接触。 然后将金属导电层暴露于蚀刻剂气体,以平坦化金属导电层的顶表面。 还提供了一种用于在基板上蚀刻金属导电层的装置。 该装置包括容器,设置在容器中的基板支撑件,附接到基板支撑件的旋转致动器以及设置在容器中的流体输送组件。