PROGRAMMABLE DEVICES WITH CURRENT-FACILITATED MIGRATION AND FABRICATION METHODS

    公开(公告)号:US20170092373A1

    公开(公告)日:2017-03-30

    申请号:US14867331

    申请日:2015-09-28

    CPC classification number: G11C17/16 H01L23/5256 H01L29/0673 H01L29/785

    Abstract: Programmable devices and fabrication methods thereof are presented. The programmable devices include, for instance, a first electrode and a second electrode electrically connected by a link portion. The link portion includes one material of a metal material or a semiconductor material and the first and second electrodes includes the other material of the metal material or the semiconductor material. For example, the link portion facilitates programming the programmable device by applying a programming current between the first electrode and the second electrode to facilitate migration of the one material of the link portion towards at least one of the first or second electrodes. In one embodiment, the programming current is configured to heat the link portion to facilitate the migration of the one material of the link portion towards the at least one of the first or second electrodes.

    PROCESS FOR FACILTIATING FIN ISOLATION SCHEMES
    16.
    发明申请
    PROCESS FOR FACILTIATING FIN ISOLATION SCHEMES 有权
    制定分离方案的程序

    公开(公告)号:US20150024572A1

    公开(公告)日:2015-01-22

    申请号:US13945445

    申请日:2013-07-18

    Abstract: Semiconductor fabrication methods are provided which include facilitating fabricating semiconductor fin structures by: providing a wafer with at least one fin extending above a substrate, the at least one fin including a first layer disposed above a second layer; mechanically stabilizing the first layer; removing at least a portion of the second layer of the fin(s) to create a void below the first layer; filling the void, at least partially, below the first layer with an isolation material to create an isolation layer within the fin(s); and proceeding with forming a fin device(s) of a first architectural type in a first fin region of the fin(s), and a fin device(s) of a second architectural type in a second fin region of the fin(s), where the first architectural type and the second architectural type are different fin device architectures.

    Abstract translation: 提供了半导体制造方法,其包括:通过以下方式制造半导体鳍片结构:提供具有在衬底上延伸的至少一个翅片的晶片,所述至少一个鳍片包括设置在第二层上方的第一层; 机械稳定第一层; 去除所述翅片的所述第二层的至少一部分以在所述第一层下面形成空隙; 至少部分地用隔离材料填充第一层下面的空隙,以在散热片内产生隔离层; 并且在翅片的第一翅片区域中形成第一结构类型的翅片装置,并且在翅片的第二翅片区域中形成第二结构类型的翅片装置, ,其中第一种架构类型和第二种架构类型是不同的鳍设备架构。

    PROGRAMMABLE VIA DEVICES WITH METAL/SEMICONDUCTOR VIA LINKS AND FABRICATION METHODS THEREOF

    公开(公告)号:US20180033726A1

    公开(公告)日:2018-02-01

    申请号:US15724563

    申请日:2017-10-04

    CPC classification number: H01L23/5256 H01L23/5226

    Abstract: Programmable via devices and fabrication methods thereof are presented. The programmable via devices include, for instance, a first metal layer and a second metal layer electrically connected by a via link. The via link includes a semiconductor portion and a metal portion, where the via link facilitates programming of the programmable via device by applying a programming current through the via link to migrate materials between the semiconductor portion and the metal portion to facilitate a change of an electrical resistance of the via link. In one embodiment, the programming current facilitates formation of at least one gap region within the via link, the at least one gap region facilitating the change of the electrical resistance of the via link.

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