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公开(公告)号:US6160715A
公开(公告)日:2000-12-12
申请号:US149804
申请日:1998-09-08
CPC分类号: H01L23/49827 , H01L23/13 , H01L23/147 , H01L23/3128 , H01L2224/16 , H01L2924/01046 , H01L2924/01078 , H01L2924/01079 , H01L2924/15153 , H01L2924/15173 , H05K2201/10477
摘要: The specification describes a recessed chip IC package in which the IC chip is bonded to a translator, and power and ground planes for IC power and ground interconnections are formed on separate interconnect levels of the translator. The multilevel interconnection capability of the translator allows crossovers, and allows power and ground pins from the IC chip to be both isolated from signal I/Os, and consolidated into fewer interconnections going to the next board level. The translator also has a large area outboard of the IC chip area to allow fan out from high pin count chips to large pitch interconnection sites for interconnection to the next board level.
摘要翻译: 本说明书描述了一种嵌入式芯片IC封装,其中IC芯片与转换器接合,并且用于IC电源和接地互连的电源和接地层形成在转换器的单独互连电平上。 转换器的多电平互联能力允许交叉,并允许IC芯片的电源和接地引脚与信号I / O隔离,并且整合到进入下一个电路板级别的较少互连。 翻译器还具有IC芯片面积大的外部面积,可将风扇从高引脚数芯片到大间距互连位置互连到下一个板级。
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公开(公告)号:US5608262A
公开(公告)日:1997-03-04
申请号:US393628
申请日:1995-02-24
申请人: Yinon Degani , Thomas D. Dudderar , Byung J. Han , Alan M. Lyons , King L. Tai
发明人: Yinon Degani , Thomas D. Dudderar , Byung J. Han , Alan M. Lyons , King L. Tai
IPC分类号: H01L25/18 , H01L23/13 , H01L23/14 , H01L23/31 , H01L23/498 , H01L25/04 , H01L25/065 , H01L25/07 , H05K3/30 , H01L23/34
CPC分类号: H01L23/3107 , H01L23/13 , H01L23/147 , H01L23/4985 , H01L2224/16145 , H01L2224/16225 , H01L2224/48091 , H01L2224/48227 , H01L2224/48465 , H01L2224/73207 , H01L24/48 , H01L2924/00014 , H01L2924/01019 , H01L2924/01078 , H01L2924/01079 , H01L2924/01322 , H01L2924/10253 , H01L2924/14 , H01L2924/15151 , H01L2924/15311 , H01L2924/15321 , H01L2924/157 , H01L2924/16152 , H01L2924/19041
摘要: Described is a novel packaging of MCM tiles without wire-bond interconnections and in a total thickness which is reduced relative to conventional MCM packaging. The MCM tile includes a substrate with a plurality of peripheral metallizations and at least one chip flip-chip mounted on the substrate. The PWB is provided with an aperture which is smaller than the size of the silicon substrate but larger than the outside dimensions of the mounted chips. The substrate is positioned on the PWB so that its ends overlap areas of the PWB adjacent the aperture and the chips fit into the aperture. Peripheral metallizations on the substrate are interconnected to metallizations on the PWB by either solder reflow technology or conductive adhesive technology.
摘要翻译: 描述了一种新颖的MCM瓦片封装,无需引线键合互连,并且相对于常规MCM封装而言,其总厚度减小。 MCM瓦片包括具有多个外围金属化的基板和安装在基板上的至少一个芯片倒装芯片。 PWB设置有小于硅基板的尺寸但大于安装的芯片的外部尺寸的孔径。 基板被定位在PWB上,使得其端部与邻近孔径的PWB的区域重叠,并且芯片装配到孔中。 衬底上的外围金属化通过焊料回流技术或导电粘合剂技术与PWB上的金属化相互连接。
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公开(公告)号:US5385290A
公开(公告)日:1995-01-31
申请号:US158131
申请日:1993-11-24
申请人: Yinon Degani
发明人: Yinon Degani
IPC分类号: B23K35/363 , B23K1/00 , B23K35/22 , H05K3/34 , B23K31/02
CPC分类号: B23K1/0016 , H05K3/3484 , B23K2201/42 , H05K2201/0266
摘要: The quality of soldering produced on devices such as printed circuit boards and multichip modules is significantly improved through use of a specific size distribution of solder particles. In particular, the solder includes a vehicle and solder particles of specific size. In general, an appropriate distribution of both large and small particles should be employed. Through this expedient short circuits and soldering defects in fine line devices are reduced.
摘要翻译: 通过使用焊料颗粒的特定尺寸分布,显着提高了在诸如印刷电路板和多芯片组件的器件上产生的焊接的质量。 特别地,焊料包括车辆和特定尺寸的焊料颗粒。 通常,应该使用大颗粒和小颗粒的适当分布。 通过这种方便的方式,减少细线装置中的短路和焊接缺陷。
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公开(公告)号:US5125560A
公开(公告)日:1992-06-30
申请号:US787290
申请日:1991-11-04
申请人: Yinon Degani , Dean P. Kossives
发明人: Yinon Degani , Dean P. Kossives
CPC分类号: H01L24/81 , B23K1/0016 , B23K1/203 , H05K3/3489 , B23K2201/40 , H01L2224/81801 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01033 , H01L2924/01075 , H01L2924/014 , H01L2924/10253 , H01L2924/14 , H01L2924/15787
摘要: Soldering is performed and the residues associated with the soldering process are removed through the use of a specific process. Components such as two integrated circuits or an integrated circuit and mounting board are initially tacked by compression bonding or through the use of adhesives. Flux is introduced, and the components to be soldered are brought to reflow temperature. The flux is chosen so that upon reflow and subsequent cooling to a temperature of 100.degree. C., or lower, the flux remains in liquid state. The flux is then easily removed by cleaning with a miscible liquid that is subsequently removed through processes such as spinning and evaporation.
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公开(公告)号:US06680212B2
公开(公告)日:2004-01-20
申请号:US09879759
申请日:2001-06-12
IPC分类号: H01L2166
CPC分类号: H01L22/20 , H01L2224/16 , H01L2224/48091 , H01L2924/00014 , H01L2924/014 , H01L2924/10253 , H01L2924/15311 , H01L2924/19041 , H01L2924/00 , H01L2224/0401
摘要: The specification describes electrical testing strategies for multi-chip modules (MCMs). The MCMs are fabricated on double sided substrates, which are then solder bump bonded to a motherboard to form a BGA package. Untested chips are attached permanently to one side of the substrate to form a partially completed MCM package (PCMP), and the PCMPs are tested. PCMPs that pass are then completed by assembling known good die on the other side of the substrate.
摘要翻译: 该规范描述了多芯片模块(MCM)的电气测试策略。 MCM制造在双面基板上,然后焊料凸块接合到母板上以形成BGA封装。 未经测试的芯片永久性地连接到基板的一侧以形成部分完成的MCM封装(PCMP),并且对PCMP进行测试。 然后通过在基板的另一侧上组装已知的良好模具来完成通过的PCMP。
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公开(公告)号:US06678167B1
公开(公告)日:2004-01-13
申请号:US09498005
申请日:2000-02-04
IPC分类号: H05K702
CPC分类号: H01L23/36 , H01L25/0652 , H01L2224/16225 , H01L2924/15311 , H01L2924/15321 , H05K1/141 , H05K1/189 , H05K3/3436
摘要: The specification describes a multi-chip IC package in which IC chips are flip-chip bonded to both sides of a flexible substrate. The upper (or lower) surface of the flexible substrate is bonded to a rigid support substrate with openings in the support substrate to accommodate the IC chips bonded to the upper (or lower) surface of the flexible substrate. In a preferred embodiment a plurality of IC memory chips are mounted on one side of the flexible substrate and one or more logic chips to the other. A very thin flexible substrate is used to optimize the length of through hole interconnections between the memory and logic devices. If logic chips are flip-chip mounted in the cavity formed by the openings, a heat sink plate can be used to both cap the cavity and make effective thermal contact the backside of the logic chips.
摘要翻译: 该说明书描述了一种多芯片IC封装,其中IC芯片倒装芯片结合到柔性基板的两侧。 柔性基板的上表面(或下表面)与支撑基板上具有开口的刚性支撑基板接合,以容纳粘合到柔性基板的上(或下)表面的IC芯片。 在优选实施例中,多个IC存储器芯片安装在柔性基板的一侧和一个或多个逻辑芯片之间。 使用非常薄的柔性基板来优化存储器和逻辑器件之间的通孔互连的长度。 如果将逻辑芯片倒装安装在由开口形成的空腔中,则可以使用散热板来盖住空腔并使逻辑芯片的背面有效的热接触。
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公开(公告)号:US06597069B1
公开(公告)日:2003-07-22
申请号:US09661741
申请日:2000-09-14
申请人: Yinon Degani , Jeffrey Alan Gregus
发明人: Yinon Degani , Jeffrey Alan Gregus
IPC分类号: H01L2350
CPC分类号: H01L24/13 , H01L24/11 , H01L2224/05001 , H01L2224/05022 , H01L2224/05027 , H01L2224/0508 , H01L2224/05572 , H01L2224/13099 , H01L2224/131 , H01L2924/0001 , H01L2924/01004 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01018 , H01L2924/01019 , H01L2924/01024 , H01L2924/01029 , H01L2924/01033 , H01L2924/01051 , H01L2924/01072 , H01L2924/01074 , H01L2924/01082 , H01L2924/01322 , H01L2924/014 , H01L2924/14 , H01L2924/19041 , H01L2224/05647 , H01L2924/00014 , H01L2224/05671 , H01L2224/05124 , H01L2224/05147
摘要: The specification describes techniques for applying under bump metallization (UBM) for solder bump interconnections on IC chips with Al bonding sites. The UBM of the invention comprises a copper layer applied directly to the aluminum bonding sites. Reliable bonds are obtained if the Al surface is a nascent surface. Such a surface can be provided by back sputtering an aluminum bonding site, or by a freshly sputtered aluminum layer. The copper layer is deposited on the nascent aluminum surface in e.g. a cluster tool without breaking vacuum. The UBM can be patterned using subtractive techniques.
摘要翻译: 本说明书描述了在具有Al键合位置的IC芯片上应用凸块下金属化(UBM)用于焊料凸块互连的技术。 本发明的UBM包括直接施加到铝结合部位的铜层。 如果Al表面是初生表面,则可获得可靠的粘结。 这样的表面可以通过背面溅射铝结合部位或通过新溅射的铝层来提供。 铜层沉积在例如新生铝表面上。 一个不破坏真空的集群工具。 UBM可以使用减法技术进行图案化。
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公开(公告)号:US06433411B1
公开(公告)日:2002-08-13
申请号:US09575883
申请日:2000-05-22
IPC分类号: H01L2302
CPC分类号: B81B7/0041 , B81B7/0048 , B81B7/0067 , B81B7/007 , H01L2224/48091 , H01L2224/48227 , H01L2924/01039 , H01L2924/10253 , H01L2924/00014 , H01L2924/00
摘要: The specification describes packaging assemblies for micro-electronic machined mechanical systems (MEMS). The MEMS devices in these package assemblies are based on silicon MEMS devices on a silicon support and the MEMS devices and the silicon support are mechanically isolated from foreign materials. Foreign materials pose the potential for differential thermal expansion that deleteriously affects optical alignment in the MEMS devices. In a preferred embodiment the MEMS devices are enclosed in an all-silicon chamber. Mechanical isolation is also aided by using a pin contact array for interconnecting the silicon support substrate for the MEMS devices to the next interconnect level. The use of the pin contact array also allows the MEMS devices to be easily demountable for replacement or repair.
摘要翻译: 该规范描述了用于微电子机械加工机械系统(MEMS)的包装组件。 这些封装组件中的MEMS器件基于硅载体上的硅MEMS器件,并且MEMS器件和硅支撑体与异物机械隔离。 外来材料构成差分热膨胀的潜力,这有害影响MEMS器件中的光学对准。 在优选实施例中,MEMS器件封装在全硅室中。 通过使用针式接触阵列来将MEMS器件的硅支撑衬底互连到下一个互连级别也有助于机械隔离。 使用引脚触点阵列也可以使MEMS器件容易拆卸以进行更换或维修。
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公开(公告)号:US06175158B1
公开(公告)日:2001-01-16
申请号:US09149803
申请日:1998-09-08
IPC分类号: H01L2348
CPC分类号: H01L23/49833 , H01L23/49838 , H01L2224/16
摘要: The specification describes a recessed chip IC package in which the IC chip is bonded to a silicon translator, and power and ground planes for IC power and ground interconnections are formed on separate interconnect levels of the translator. The multilevel interconnection capability of the translator allows crossovers, and allows power and ground pins from the IC chip to be both isolated from signal I/Os, and consolidated into fewer interconnections going to the next board level. The thermal mismatch between the silicon translator and conventional printed wiring board materials is addressed by using an interposer which is essentially a ball grid array of plated-through holes that transfers the interconnect pattern from the translator to the printed wiring board. The interposer may have a composition with a coefficient of thermal expansion (CTE) that lies between the CTE of silicon and the CTE of the board material. It may also be provided with holes or slots for additional stress relief.
摘要翻译: 该说明书描述了一种嵌入式芯片IC封装,其中IC芯片被结合到硅转换器,并且用于IC电源和接地互连的电源和接地层形成在转换器的分开的互连级上。 转换器的多电平互联能力允许交叉,并允许IC芯片的电源和接地引脚与信号I / O隔离,并且整合到进入下一个电路板级别的较少互连。 硅转换器和常规印刷线路板材料之间的热失配通过使用插入器来解决,该插入器本质上是将互连图案从转换器传送到印刷线路板的电镀通孔的球栅阵列。 插入件可以具有位于硅的CTE和板材料的CTE之间的热膨胀系数(CTE)的组成。 它还可以设置有用于额外的应力释放的孔或槽。
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公开(公告)号:US6154370A
公开(公告)日:2000-11-28
申请号:US120148
申请日:1998-07-21
申请人: Yinon Degani , Robert Charles Frye , Yee Leng Low
发明人: Yinon Degani , Robert Charles Frye , Yee Leng Low
IPC分类号: H01L23/12 , H01L23/498 , H01L23/50 , H05K1/18
CPC分类号: H01L23/49827 , H01L23/49838 , H01L23/50 , H01L24/17 , H05K1/182 , H01L2224/16145 , H01L2224/16225 , H01L2924/00014 , H01L2924/01019 , H01L2924/01078 , H01L2924/14 , H01L2924/15311 , H01L2924/1532
摘要: The specification describes a recessed chip IC package in which the cavity in the printed wiring board into which the IC chip is recessed is used as a through hole interconnection, thus increasing the interconnection density. If the through cavity interconnections are used as power and ground the signal I/O pads and the signal runners are effectively isolated.
摘要翻译: 该说明书描述了一种嵌入式芯片IC封装,其中将IC芯片凹入的印刷电路板中的空腔用作通孔互连,从而增加了互连密度。 如果使用通孔互连作为电源和接地,则信号I / O焊盘和信号通道有效隔离。
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