公开(公告)号：US20070267738A1

公开(公告)日：2007-11-22

申请号：US11751464

申请日：2007-05-21

申请人： Hyun-Soo CHUNG ,  Cha-Jea JO ,  Dong-Ho LEE ,  Seong-Deok HWANG

发明人： Hyun-Soo CHUNG ,  Cha-Jea JO ,  Dong-Ho LEE ,  Seong-Deok HWANG

IPC分类号： H01L23/34 ,  H01L21/00

CPC分类号： H01L23/473 ,  H01L25/0657 ,  H01L25/50 ,  H01L2225/06513 ,  H01L2225/06524 ,  H01L2225/06541 ,  H01L2225/06589 ,  H01L2924/0002 ,  H01L2924/10158 ,  H01L2924/00

摘要： Provided is a semiconductor device having a cooling path on its bottom surface. The stack-type semiconductor device having a cooling path comprises a stack-type semiconductor chip comprising a first semiconductor chip and a second semiconductor chip. The first semiconductor chip comprises a first surface in which a circuit unit is formed and a second surface in which a first cooling path is formed, and the second semiconductor chip comprises a first surface in which a circuit unit is formed and a second surface in which a second cooling path is formed. The second surface of the first semiconductor chip and the second surface of the second semiconductor chip are bonded to each other, and a third cooling path is formed in the middle of the stack-type semiconductor chip using the first and second cooling paths. Warpage of the stack-type semiconductor device is suppressed and heat is easily dissipated.

摘要翻译： 提供了在其底面上具有冷却路径的半导体器件。 具有冷却路径的叠层型半导体器件包括：堆叠型半导体芯片，包括第一半导体芯片和第二半导体芯片。 第一半导体芯片包括其中形成有电路单元的第一表面和形成有第一冷却路径的第二表面，并且第二半导体芯片包括其中形成电路单元的第一表面和第二表面，其中第二表面 形成第二冷却路径。 第一半导体芯片的第二表面和第二半导体芯片的第二表面彼此接合，并且使用第一和第二冷却路径在堆叠型半导体芯片的中间形成第三冷却路径。 堆叠型半导体器件的翘曲被抑制，并且易于散热。

公开(公告)号：US20090168382A1

公开(公告)日：2009-07-02

申请号：US12344817

申请日：2008-12-29

申请人： Hyun-Soo CHUNG ,  Dong-Ho LEE ,  Dong-Han KIM ,  Seong-Deok HWANG ,  Ki-Hyuk KIM

发明人： Hyun-Soo CHUNG ,  Dong-Ho LEE ,  Dong-Han KIM ,  Seong-Deok HWANG ,  Ki-Hyuk KIM

IPC分类号： H05K7/06

CPC分类号： H05K1/185 ,  H01L23/49816 ,  H01L23/5389 ,  H01L24/19 ,  H01L24/82 ,  H01L2224/04105 ,  H01L2224/12105 ,  H01L2224/32145 ,  H01L2224/73267 ,  H01L2924/01013 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01082 ,  H05K3/3457 ,  H05K3/4694 ,  H05K2201/10719

摘要： A semiconductor module can include a printed circuit board (PCB) and a semiconductor package inserted into an inner space of the PCB. The semiconductor package may be electrically connected to the PCB. The PCB may thus surround the semiconductor package so that cracks may not be generated in the outer terminals.

摘要翻译： 半导体模块可以包括插入到PCB的内部空间中的印刷电路板（PCB）和半导体封装。 半导体封装可以电连接到PCB。 因此，PCB可以围绕半导体封装，从而可能不会在外部端子中产生裂纹。

公开(公告)号：US20080014735A1

公开(公告)日：2008-01-17

申请号：US11775120

申请日：2007-07-09

申请人： Hyun-Soo CHUNG ,  Seung-Kwan RYU ,  Ju-Il CHOI ,  Dong-Ho LEE ,  Seong-Deok HWANG

发明人： Hyun-Soo CHUNG ,  Seung-Kwan RYU ,  Ju-Il CHOI ,  Dong-Ho LEE ,  Seong-Deok HWANG

IPC分类号： H01L21/44

CPC分类号： H01L21/76898 ,  H01L23/3128 ,  H01L23/3178 ,  H01L23/481 ,  H01L24/03 ,  H01L24/05 ,  H01L24/06 ,  H01L24/16 ,  H01L24/19 ,  H01L24/20 ,  H01L24/82 ,  H01L25/0657 ,  H01L25/105 ,  H01L25/50 ,  H01L2224/02313 ,  H01L2224/02372 ,  H01L2224/02379 ,  H01L2224/0239 ,  H01L2224/036 ,  H01L2224/0401 ,  H01L2224/04105 ,  H01L2224/05009 ,  H01L2224/05548 ,  H01L2224/06181 ,  H01L2224/11334 ,  H01L2224/11462 ,  H01L2224/12105 ,  H01L2224/13024 ,  H01L2224/13025 ,  H01L2224/16145 ,  H01L2224/16235 ,  H01L2224/94 ,  H01L2225/06513 ,  H01L2225/06517 ,  H01L2225/06541 ,  H01L2225/06586 ,  H01L2225/1058 ,  H01L2924/00 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01015 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01073 ,  H01L2924/01074 ,  H01L2924/01079 ,  H01L2924/014 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/18162 ,  H01L2924/01028 ,  H01L2224/03

摘要： Provided are methods of fabricating semiconductor chips, semiconductor chips formed by the methods, and chip-stack packages having the semiconductor chips. One embodiment specifies a method that includes patterning a scribe line region of a semiconductor substrate to form a semiconductor strut spaced apart from edges of a chip region of the semiconductor substrate.

摘要翻译： 提供制造半导体芯片的方法，通过该方法形成的半导体芯片和具有半导体芯片的芯片堆叠封装。 一个实施例规定了一种方法，其包括图案化半导体衬底的划线区域以形成与半导体衬底的芯片区域的边缘间隔开的半导体支柱。

公开(公告)号：US20090206464A1

公开(公告)日：2009-08-20

申请号：US12432003

申请日：2009-04-29

申请人： Hyun-Soo CHUNG ,  Seung-Kwan RYU ,  Ju-Il CHOI ,  Dong-Ho LEE ,  Seong-Deok HWANG

发明人： Hyun-Soo CHUNG ,  Seung-Kwan RYU ,  Ju-Il CHOI ,  Dong-Ho LEE ,  Seong-Deok HWANG

IPC分类号： H01L23/52 ,  H01L23/48

CPC分类号： H01L21/76898 ,  H01L23/3128 ,  H01L23/3178 ,  H01L23/481 ,  H01L24/03 ,  H01L24/05 ,  H01L24/06 ,  H01L24/16 ,  H01L24/19 ,  H01L24/20 ,  H01L24/82 ,  H01L25/0657 ,  H01L25/105 ,  H01L25/50 ,  H01L2224/02313 ,  H01L2224/02372 ,  H01L2224/02379 ,  H01L2224/0239 ,  H01L2224/036 ,  H01L2224/0401 ,  H01L2224/04105 ,  H01L2224/05009 ,  H01L2224/05548 ,  H01L2224/06181 ,  H01L2224/11334 ,  H01L2224/11462 ,  H01L2224/12105 ,  H01L2224/13024 ,  H01L2224/13025 ,  H01L2224/16145 ,  H01L2224/16235 ,  H01L2224/94 ,  H01L2225/06513 ,  H01L2225/06517 ,  H01L2225/06541 ,  H01L2225/06586 ,  H01L2225/1058 ,  H01L2924/00 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01015 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01073 ,  H01L2924/01074 ,  H01L2924/01079 ,  H01L2924/014 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/18162 ,  H01L2924/01028 ,  H01L2224/03

摘要： Provided are methods of fabricating semiconductor chips, semiconductor chips formed by the methods, and chip-stack packages having the semiconductor chips. One embodiment specifies a method that includes patterning a scribe line region of a semiconductor substrate to form a semiconductor strut spaced apart from edges of a chip region of the semiconductor substrate.

摘要翻译： 提供制造半导体芯片的方法，通过该方法形成的半导体芯片和具有半导体芯片的芯片堆叠封装。 一个实施例规定了一种方法，其包括图案化半导体衬底的划线区域以形成与半导体衬底的芯片区域的边缘间隔开的半导体支柱。

公开(公告)号：US20090267211A1

公开(公告)日：2009-10-29

申请号：US12498913

申请日：2009-07-07

申请人： Hyun-Soo CHUNG ,  In-Young LEE ,  Son-Kwan HWANG ,  Dong-Ho LEE ,  Seong-Deok HWANG

发明人： Hyun-Soo CHUNG ,  In-Young LEE ,  Son-Kwan HWANG ,  Dong-Ho LEE ,  Seong-Deok HWANG

IPC分类号： H01L23/52 ,  H01L23/538 ,  H01L23/48

CPC分类号： H01L25/50 ,  H01L21/76898 ,  H01L25/0657 ,  H01L29/0657 ,  H01L2224/0401 ,  H01L2224/05548 ,  H01L2224/05567 ,  H01L2224/0557 ,  H01L2224/06181 ,  H01L2224/13025 ,  H01L2224/94 ,  H01L2225/06513 ,  H01L2225/06541 ,  H01L2225/06555 ,  H01L2225/06586 ,  H01L2924/0002 ,  H01L2924/01006 ,  H01L2924/01024 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01038 ,  H01L2924/01047 ,  H01L2924/01074 ,  H01L2924/01079 ,  H01L2924/01093 ,  H01L2224/11 ,  H01L2224/05552

摘要： Wafer level packages and methods of fabricating the same are provided. In one embodiment, one of the methods comprises forming semiconductor chips having a connection pad on a wafer, patterning a bottom surface of the wafer to form a trench under the connection pad, patterning a bottom surface of the trench to form a via hole exposing the bottom surface of the connection pad, and forming a connecting device connected to the connection pad through the via hole. The invention provides a wafer level package having reduced thickness, lower fabrication costs, and increased reliability compared to conventional packages.

摘要翻译： 提供了晶片级封装及其制造方法。 在一个实施例中，方法之一包括形成在晶片上具有连接焊盘的半导体芯片，图案化晶片的底表面以在连接焊盘下方形成沟槽，图案化沟槽的底表面以形成通孔， 并且通过通孔形成连接到连接垫的连接装置。 本发明提供了与传统封装相比，具有减小的厚度，较低的制造成本和增加的可靠性的晶片级封装。

公开(公告)号：US20090302418A1

公开(公告)日：2009-12-10

申请号：US12478365

申请日：2009-06-04

申请人： Hyun-Soo CHUNG ,  Dong-Ho LEE ,  Dong-Hyeon JANG ,  Eun-Chul AHN ,  Kun-Gu LEE ,  Chang-Woo SHIN

发明人： Hyun-Soo CHUNG ,  Dong-Ho LEE ,  Dong-Hyeon JANG ,  Eun-Chul AHN ,  Kun-Gu LEE ,  Chang-Woo SHIN

IPC分类号： H01L23/525

CPC分类号： H01L23/5258 ,  H01L2924/0002 ,  H01L2924/00

摘要： Provided is a fuse structure of a semiconductor device. The fuse structure may include an insulating layer pattern structure, a fuse and a protecting layer pattern. The insulating layer pattern structure may be formed on a substrate. The insulating layer pattern structure may have an opening. The fuse may be formed in the opening. The protecting layer pattern may be formed in the opening of the insulating layer pattern structure to cover the fuse.

摘要翻译： 提供半导体器件的熔丝结构。 熔丝结构可以包括绝缘层图案结构，熔丝和保护层图案。 绝缘层图案结构可以形成在基板上。 绝缘层图案结构可以具有开口。 保险丝可以形成在开口中。 保护层图案可以形成在绝缘层图案结构的开口中以覆盖保险丝。

公开(公告)号：US20080128905A1

公开(公告)日：2008-06-05

申请号：US11950251

申请日：2007-12-04

申请人： In-Young LEE ,  Dong-Ho LEE ,  Nam-Seog KIM ,  Hyun-Soo CHUNG ,  Ho-Jin LEE ,  Myeong-Soo PARK

发明人： In-Young LEE ,  Dong-Ho LEE ,  Nam-Seog KIM ,  Hyun-Soo CHUNG ,  Ho-Jin LEE ,  Myeong-Soo PARK

IPC分类号： H01L23/488 ,  H01L21/44

CPC分类号： H01L23/525 ,  H01L23/3114 ,  H01L24/11 ,  H01L24/12 ,  H01L24/16 ,  H01L2224/05001 ,  H01L2224/05008 ,  H01L2224/05026 ,  H01L2224/05124 ,  H01L2224/05147 ,  H01L2224/05166 ,  H01L2224/05548 ,  H01L2224/05569 ,  H01L2224/056 ,  H01L2224/05647 ,  H01L2224/05666 ,  H01L2224/11334 ,  H01L2224/1147 ,  H01L2224/13099 ,  H01L2224/13144 ,  H01L2224/13147 ,  H01L2224/13155 ,  H01L2224/16 ,  H01L2924/01013 ,  H01L2924/01022 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/014 ,  H01L2924/351 ,  H01L2924/00 ,  H01L2924/00014 ,  H01L2924/013

摘要： Provided are a wafer level chip scale package in which a redistribution process is applied at a wafer level, a manufacturing method thereof, and a semiconductor chip module including the wafer level chip scale package. The wafer level chip scale package includes a semiconductor chip having a bonding pad, a first insulating layer disposed on the semiconductor chip so as to expose the bonding pad, a redistribution line disposed on the exposed bonding pad and the first insulating layer, a sacrificial layer disposed below a redistribution pad of the redistribution line, a second insulating layer disposed on the redistribution line so as to expose the redistribution pad and including a crack inducement hole disposed beside the sacrificial layer, and an external connection terminal attached to the redistribution pad.

摘要翻译： 提供了其中在晶片级应用再分配处理的晶片级芯片级封装，其制造方法以及包括晶片级芯片级封装的半导体芯片模块。 晶片级芯片级封装包括具有接合焊盘的半导体芯片，设置在半导体芯片上以暴露焊盘的第一绝缘层，设置在暴露的焊盘和第一绝缘层上的再分配线，牺牲层 设置在所述再分配线的再分配衬垫的下方，设置在所述再分配线上的第二绝缘层，以暴露所述再分配衬垫并且包括设置在所述牺牲层旁边的裂纹诱导孔，以及附接到所述再分布衬垫的外部连接端子。

公开(公告)号：US20070164431A1

公开(公告)日：2007-07-19

申请号：US11549933

申请日：2006-10-16

申请人： In Young LEE ,  Hyun-Soo CHUNG ,  Dong-Ho LEE ,  Sung-Min SIM ,  Dong-Soo SEO ,  Seung-Kwan RYU ,  Myeong-Soon PARK

发明人： In Young LEE ,  Hyun-Soo CHUNG ,  Dong-Ho LEE ,  Sung-Min SIM ,  Dong-Soo SEO ,  Seung-Kwan RYU ,  Myeong-Soon PARK

IPC分类号： H01L23/48 ,  H01L21/44

CPC分类号： H01L23/3114 ,  H01L23/5222 ,  H01L23/525 ,  H01L24/11 ,  H01L24/12 ,  H01L2224/0231 ,  H01L2224/02313 ,  H01L2224/0236 ,  H01L2224/024 ,  H01L2224/0401 ,  H01L2224/11334 ,  H01L2224/13099 ,  H01L2224/16 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01022 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01075 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/014 ,  H01L2924/30105 ,  H01L2924/351 ,  H01L2924/00

摘要： A wafer level chip scale package capable of reducing parasitic capacitances between a rerouting and the metal wiring of a wafer, and a method for manufacturing the same are provided. An embodiment of the wafer level chip scale package includes a wafer arranged with a plurality of bonding pads and an insulating member formed on the wafer so that the bonding pads are exposed. A rerouting is further formed on the insulating member in contact with the exposed bonding pads and an external connecting terminal is electrically connected to a portion of the rerouting. Here, the insulating member overlapping the rerouting is provided with a plurality of spaces in which air is trapped.

摘要翻译： 提供能够降低重新布线和晶片的金属布线之间的寄生电容的晶片级芯片级封装及其制造方法。 晶片级芯片级封装的实施例包括具有多个接合焊盘的晶片和形成在晶片上的绝缘部件，使得焊盘露出。 在与暴露的接合焊盘接触的绝缘构件上进一步形成再路由，并且外部连接端子电连接到重新布线的一部分。 这里，与重新路由重叠的绝缘构件设置有空气被捕获的多个空间。

公开(公告)号：US20110298902A1

公开(公告)日：2011-12-08

申请号：US12962406

申请日：2010-12-07

申请人： So-Young KIM ,  Seung-Ho AHN ,  Dong-Ho LEE

发明人： So-Young KIM ,  Seung-Ho AHN ,  Dong-Ho LEE

IPC分类号： H04N13/04 ,  G02B26/02

CPC分类号： G02B27/2264 ,  G02B27/2242 ,  H04N13/341 ,  H04N2213/008

摘要： Provided are a shutter glasses for a 3D image display, a 3D image display system including the same, and a manufacturing method thereof. Shutter glasses for a 3D image display system according to an exemplary embodiment of the present invention include a left eye shutter and a right eye shutter. At least one of the left eye shutter and the right eye shutter includes a MEMS element controlling an opening and a closing of the at least one of the left eye shutter and the right eye shutter.

摘要翻译： 提供了一种用于3D图像显示器的快门眼镜，包括其的3D图像显示系统及其制造方法。 根据本发明的示例性实施例的用于3D图像显示系统的快门眼镜包括左眼快门和右眼快门。 左眼快门和右眼快门中的至少一个包括控制左眼快门和右眼快门中的至少一个的开口和关闭的MEMS元件。

公开(公告)号：US20110194064A1

公开(公告)日：2011-08-11

申请号：US13088839

申请日：2011-04-18

申请人： Dong-Ho LEE

发明人： Dong-Ho LEE

IPC分类号： G02F1/1339

CPC分类号： G02F1/13454 ,  G02F1/133345 ,  G02F1/1339 ,  G02F1/136227 ,  G02F1/136286 ,  G02F1/1368 ,  G02F2203/09

摘要： An LCD device provides enhanced display quality. An insulating layer is formed on a first substrate. The insulating layer covers the contact portion of a switching device in which the switching device is electrically connected to a transparent electrode and has an opening for exposing a portion of the transparent electrode. A reflection electrode is electrically connected to the transparent electrode through the opening. The insulation layer covers a first portion of a driving circuit formed on the first substrate. A sealant is interposed between the first and second substrate to engage the first and second substrate and to cover a second portion of the driving circuit. Therefore, the driver circuit may operate normally, and the distortion of the signal outputted from the driver circuit may be prevented.