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公开(公告)号:CN100380650C
公开(公告)日:2008-04-09
申请号:CN01104622.8
申请日:2001-02-16
Applicant: 株式会社日立制作所
CPC classification number: H01L24/85 , H01L21/565 , H01L23/3114 , H01L23/49582 , H01L24/27 , H01L24/29 , H01L24/32 , H01L24/45 , H01L24/48 , H01L24/49 , H01L24/73 , H01L24/743 , H01L24/78 , H01L24/83 , H01L2224/29 , H01L2224/29007 , H01L2224/29101 , H01L2224/29111 , H01L2224/2929 , H01L2224/29339 , H01L2224/29393 , H01L2224/32014 , H01L2224/32245 , H01L2224/45015 , H01L2224/45144 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/48455 , H01L2224/48465 , H01L2224/48599 , H01L2224/48664 , H01L2224/49171 , H01L2224/73265 , H01L2224/743 , H01L2224/78303 , H01L2224/83192 , H01L2224/83801 , H01L2224/85181 , H01L2224/85205 , H01L2224/85464 , H01L2224/92 , H01L2224/92247 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01015 , H01L2924/01019 , H01L2924/01027 , H01L2924/01028 , H01L2924/01029 , H01L2924/0103 , H01L2924/01047 , H01L2924/0105 , H01L2924/01051 , H01L2924/01074 , H01L2924/01078 , H01L2924/01079 , H01L2924/01083 , H01L2924/0132 , H01L2924/01322 , H01L2924/0133 , H01L2924/014 , H01L2924/078 , H01L2924/14 , H01L2924/15763 , H01L2924/181 , H01L2924/20751 , H01L2924/20752 , H01L2924/20753 , H01L2924/351 , H01L2924/00014 , H01L2924/00 , H01L2924/01026 , H01L2924/01082 , H01L2924/00012 , H01L2924/3512 , H01L2924/01046 , H01L2924/00015
Abstract: 本发明提供一种能有效地防止由于施加到半导体集成电路器件的卡路里增加产生的线断开的措施。构成半导体集成电路器件以使含有Pd层的金属层提供在具有导电性的连接部件连接的部分中,熔点高于Sn-Pb共晶焊料熔点并含有无Pb作为主要组成金属的合金层提供在树脂模塑部分之外。此外,具有导电性的连接部分接合的部分中厚度等于或大于10μm的金属层提供在连接部件中。
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公开(公告)号:CN1309425A
公开(公告)日:2001-08-22
申请号:CN01104622.8
申请日:2001-02-16
Applicant: 株式会社日立制作所
CPC classification number: H01L24/85 , H01L21/565 , H01L23/3114 , H01L23/49582 , H01L24/27 , H01L24/29 , H01L24/32 , H01L24/45 , H01L24/48 , H01L24/49 , H01L24/73 , H01L24/743 , H01L24/78 , H01L24/83 , H01L2224/29 , H01L2224/29007 , H01L2224/29101 , H01L2224/29111 , H01L2224/2929 , H01L2224/29339 , H01L2224/29393 , H01L2224/32014 , H01L2224/32245 , H01L2224/45015 , H01L2224/45144 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/48455 , H01L2224/48465 , H01L2224/48599 , H01L2224/48664 , H01L2224/49171 , H01L2224/73265 , H01L2224/743 , H01L2224/78303 , H01L2224/83192 , H01L2224/83801 , H01L2224/85181 , H01L2224/85205 , H01L2224/85464 , H01L2224/92 , H01L2224/92247 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01015 , H01L2924/01019 , H01L2924/01027 , H01L2924/01028 , H01L2924/01029 , H01L2924/0103 , H01L2924/01047 , H01L2924/0105 , H01L2924/01051 , H01L2924/01074 , H01L2924/01078 , H01L2924/01079 , H01L2924/01083 , H01L2924/0132 , H01L2924/01322 , H01L2924/0133 , H01L2924/014 , H01L2924/078 , H01L2924/14 , H01L2924/15763 , H01L2924/181 , H01L2924/20751 , H01L2924/20752 , H01L2924/20753 , H01L2924/351 , H01L2924/00014 , H01L2924/00 , H01L2924/01026 , H01L2924/01082 , H01L2924/00012 , H01L2924/3512 , H01L2924/01046 , H01L2924/00015
Abstract: 本发明提供一种能有效地防止由于施加到半导体集成电路器件的卡路里增加产生的线断开的措施。构成半导体集成电路器件以使含有Pd层的金属层提供在具有导电性的连接部件连接的部分中,熔点高于Sn-Pb共晶焊料熔点并含有无Pb作为主要组成金属的合金层提供在树脂模塑部分之外。此外,具有导电性的连接部分接合的部分中厚度等于或大于10μm的金属层提供在连接部件中。
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公开(公告)号:CN1121261A
公开(公告)日:1996-04-24
申请号:CN95106029.5
申请日:1995-05-15
Applicant: 株式会社日立制作所
IPC: H01L23/48
CPC classification number: H01L23/49558 , H01L21/565 , H01L23/49541 , H01L23/49548 , H01L24/48 , H01L24/49 , H01L2224/451 , H01L2224/48091 , H01L2224/48247 , H01L2224/49171 , H01L2924/00014 , H01L2924/01078 , H01L2924/01087 , H01L2924/181 , H01L2924/00 , H01L2224/05599 , H01L2924/00012 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
Abstract: 一种供塑封半导体器件用的引线框架,包括其上安装半导体芯片的托片、芯片衬垫支撑引线、与半导体芯片电连接的内引线、以整体结构方式与内引线一起形成的外引线,以及支撑芯片衬垫支撑引线和外引线的框架。在引线框架中,只在外引线之间配置堵封件。或者,在框架与其相邻的引线之间形成虚设外引线,以便通过堵封件将虚设引线连到外引线。在组装半导体器件后,将该框架切除。
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公开(公告)号:CN1098822A
公开(公告)日:1995-02-15
申请号:CN94107982.1
申请日:1994-07-19
Abstract: 一种封装电子器件具有一个电子器件和一些细长引线。电子器件和细长引线的一部分用模塑材料包封起来。支持用的绝缘材料插入在从封装件伸出的相邻引线之间用以支持细长引线的伸出部分。支持用绝缘材料与模塑材料连成一件,并由绝缘连接材料在引线外端处彼此连接。模塑材料、支持用绝缘材料和连接材料在同一模塑步骤中形成,后者最终可被切去。
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公开(公告)号:CN101026139A
公开(公告)日:2007-08-29
申请号:CN200610103046.1
申请日:2001-02-16
Applicant: 株式会社日立制作所
CPC classification number: H01L24/85 , H01L21/565 , H01L23/3114 , H01L23/49582 , H01L24/27 , H01L24/29 , H01L24/32 , H01L24/45 , H01L24/48 , H01L24/49 , H01L24/73 , H01L24/743 , H01L24/78 , H01L24/83 , H01L2224/29 , H01L2224/29007 , H01L2224/29101 , H01L2224/29111 , H01L2224/2929 , H01L2224/29339 , H01L2224/29393 , H01L2224/32014 , H01L2224/32245 , H01L2224/45015 , H01L2224/45144 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/48455 , H01L2224/48465 , H01L2224/48599 , H01L2224/48664 , H01L2224/49171 , H01L2224/73265 , H01L2224/743 , H01L2224/78303 , H01L2224/83192 , H01L2224/83801 , H01L2224/85181 , H01L2224/85205 , H01L2224/85464 , H01L2224/92 , H01L2224/92247 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01015 , H01L2924/01019 , H01L2924/01027 , H01L2924/01028 , H01L2924/01029 , H01L2924/0103 , H01L2924/01047 , H01L2924/0105 , H01L2924/01051 , H01L2924/01074 , H01L2924/01078 , H01L2924/01079 , H01L2924/01083 , H01L2924/0132 , H01L2924/01322 , H01L2924/0133 , H01L2924/014 , H01L2924/078 , H01L2924/14 , H01L2924/15763 , H01L2924/181 , H01L2924/20751 , H01L2924/20752 , H01L2924/20753 , H01L2924/351 , H01L2924/00014 , H01L2924/00 , H01L2924/01026 , H01L2924/01082 , H01L2924/00012 , H01L2924/3512 , H01L2924/01046 , H01L2924/00015
Abstract: 本发明提供一种半导体集成电路器件,其包括:焊丝,电连接到半导体芯片的表面电极;多个内引线,位于半导体芯片周围;钯层,形成在多个内引线的每一个内引线的焊丝键合部分上方;粘合部分,通过焊丝与内引线的连接而形成;以及树脂,用于模塑半导体芯片、多个内引线、焊丝和粘合部分;其中焊丝的直径为30μm或更小;其中粘合部分具有粘合宽度和粘合长度;其中粘合宽度为焊丝的直径的1.5倍或更大,并且粘合宽度为焊丝的直径的3.5倍或更小;以及其中粘合长度为焊丝的直径的1.5倍或更大,并且粘合长度为焊丝的直径的3.5倍或更小。由此能有效地防止由于施加到半导体集成电路器件的卡路里增加产生的线断开。
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公开(公告)号:CN1424757A
公开(公告)日:2003-06-18
申请号:CN02151384.8
申请日:2002-11-20
Applicant: 株式会社日立制作所 , 日立超大规模集成电路系统株式会社
CPC classification number: H01L24/85 , H01L21/4821 , H01L21/561 , H01L21/565 , H01L23/49503 , H01L23/49506 , H01L23/49517 , H01L23/49541 , H01L23/49548 , H01L23/49551 , H01L23/49555 , H01L23/49558 , H01L23/49568 , H01L23/49582 , H01L24/05 , H01L24/06 , H01L24/32 , H01L24/45 , H01L24/48 , H01L24/49 , H01L24/78 , H01L24/97 , H01L2224/04042 , H01L2224/05554 , H01L2224/05556 , H01L2224/05599 , H01L2224/32014 , H01L2224/32055 , H01L2224/32245 , H01L2224/45144 , H01L2224/48011 , H01L2224/48091 , H01L2224/48095 , H01L2224/48247 , H01L2224/48465 , H01L2224/48599 , H01L2224/48639 , H01L2224/48664 , H01L2224/49171 , H01L2224/49175 , H01L2224/49431 , H01L2224/49433 , H01L2224/73265 , H01L2224/78301 , H01L2224/82181 , H01L2224/85001 , H01L2224/85181 , H01L2224/85399 , H01L2224/85439 , H01L2224/85464 , H01L2224/92 , H01L2224/92247 , H01L2224/97 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01015 , H01L2924/01023 , H01L2924/01028 , H01L2924/01029 , H01L2924/01047 , H01L2924/0105 , H01L2924/01074 , H01L2924/01078 , H01L2924/01079 , H01L2924/0132 , H01L2924/014 , H01L2924/07802 , H01L2924/15311 , H01L2924/1532 , H01L2924/181 , H01L2224/85 , H01L2224/83 , H01L2924/20647 , H01L2924/00 , H01L2924/01026 , H01L2924/00012
Abstract: 本发明的课题在于推进QFN(四方扁平无引线封装)的多管脚化。半导体芯片2在被安装在管芯底座部4上的状态下被配置在密封体3的中央部。在管芯底座部4的周围,以由与管芯底座部4和悬吊引线5b相同的金属构成的多条引线5包围管芯底座部4的方式进行了配置。这些引线5的一个端部一侧5a经Au焊丝6与半导体芯片2的主面的键合焊盘导电性地连接,另一个端部一侧5c以密封体3的侧面为终端。为了缩短每一条引线5与半导体芯片2的距离,一个端部一侧5a分布在管芯底座部4的附近,一个端部一侧5a的与邻接的引线5的间距比另一个端部一侧5c的与邻接的引线5的间距小。
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公开(公告)号:CN1097312C
公开(公告)日:2002-12-25
申请号:CN95106029.5
申请日:1995-05-15
Applicant: 株式会社日立制作所
IPC: H01L23/48
CPC classification number: H01L23/49558 , H01L21/565 , H01L23/49541 , H01L23/49548 , H01L24/48 , H01L24/49 , H01L2224/451 , H01L2224/48091 , H01L2224/48247 , H01L2224/49171 , H01L2924/00014 , H01L2924/01078 , H01L2924/01087 , H01L2924/181 , H01L2924/00 , H01L2224/05599 , H01L2924/00012 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
Abstract: 一种供塑封半导体器件用的引线框架,包括其上安装半导体芯片的托片、芯片衬垫支撑引线、与半导体芯片电连接的内引线、以整体结构方式与内引线一起形成的外引线,以及支撑芯片衬垫支撑引线和外引线的框架。在引线框架中,只在外引线之间配置堵封件。或者,在框架与其相邻的引线之间形成虚设外引线,以便通过堵封件将虚设引线连到外引线。在组装半导体器件后,将该框架切除。
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公开(公告)号:CN1242105A
公开(公告)日:2000-01-19
申请号:CN96180555.2
申请日:1996-12-26
Applicant: 株式会社日立制作所 , 日立超大规模集成电路系统株式会社
CPC classification number: H01L24/06 , H01L24/73 , H01L2224/04042 , H01L2224/05554 , H01L2224/06179 , H01L2224/32014 , H01L2224/32055 , H01L2224/32245 , H01L2224/45124 , H01L2224/45144 , H01L2224/45147 , H01L2224/45565 , H01L2224/4569 , H01L2224/48091 , H01L2224/48247 , H01L2224/48465 , H01L2224/49171 , H01L2224/73265 , H01L2924/181 , H01L2924/00014 , H01L2924/00 , H01L2924/00012
Abstract: 一种制造树脂密封半导体器件的方法,所说半导体器件中管芯垫具有小于安装于管芯垫主表面上的半导体芯片的面积,半导体芯片和管芯垫密封在模制树脂体中。半导体芯片和管芯垫设置于模具的凹腔中,使管芯垫背面和凹腔的相对内表面间的间距比半导体芯片主表面和凹腔的相对内表面间的间距窄相当于管芯垫厚度的距离。通过中部浇口同时向凹腔内注入树脂,从而模制树脂体。于是半导体芯片不会因注入到芯片背侧空间的树脂而向上移动。因此,由于防止了半导体芯片、键合线等暴露于模制树脂体外的缺陷,所以可以提高树脂密封半导体器件的成品率。
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公开(公告)号:CN101013683A
公开(公告)日:2007-08-08
申请号:CN200610103048.0
申请日:2001-02-16
Applicant: 株式会社日立制作所
CPC classification number: H01L24/85 , H01L21/565 , H01L23/3114 , H01L23/49582 , H01L24/27 , H01L24/29 , H01L24/32 , H01L24/45 , H01L24/48 , H01L24/49 , H01L24/73 , H01L24/743 , H01L24/78 , H01L24/83 , H01L2224/29 , H01L2224/29007 , H01L2224/29101 , H01L2224/29111 , H01L2224/2929 , H01L2224/29339 , H01L2224/29393 , H01L2224/32014 , H01L2224/32245 , H01L2224/45015 , H01L2224/45144 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/48455 , H01L2224/48465 , H01L2224/48599 , H01L2224/48664 , H01L2224/49171 , H01L2224/73265 , H01L2224/743 , H01L2224/78303 , H01L2224/83192 , H01L2224/83801 , H01L2224/85181 , H01L2224/85205 , H01L2224/85464 , H01L2224/92 , H01L2224/92247 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01015 , H01L2924/01019 , H01L2924/01027 , H01L2924/01028 , H01L2924/01029 , H01L2924/0103 , H01L2924/01047 , H01L2924/0105 , H01L2924/01051 , H01L2924/01074 , H01L2924/01078 , H01L2924/01079 , H01L2924/01083 , H01L2924/0132 , H01L2924/01322 , H01L2924/0133 , H01L2924/014 , H01L2924/078 , H01L2924/14 , H01L2924/15763 , H01L2924/181 , H01L2924/20751 , H01L2924/20752 , H01L2924/20753 , H01L2924/351 , H01L2924/00014 , H01L2924/00 , H01L2924/01026 , H01L2924/01082 , H01L2924/00012 , H01L2924/3512 , H01L2924/01046 , H01L2924/00015
Abstract: 本发明提供一种半导体集成电路器件,其包括:管芯衬垫;半导体芯片,安装在管芯衬垫上方;多个内引线部分,布置在管芯衬垫周围;多个外引线部分,分别与多个内引线部分连续地形成;多个焊丝,将半导体芯片与多个内引线部分电连接;第一金属层,形成在内引线部分的每一个的末端部分的表面上,多个焊丝的每一个焊丝的一端与第一金属层相接触;树脂,密封半导体芯片、多个焊丝和多个内引线部分,多个外引线部分从树脂向外突出;以及第二金属层,形成在多个外引线部分的每一个的表面上,其中第一金属层是钯层。由此能有效地防止由于施加到半导体集成电路器件的卡路里增加产生的线断开。
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公开(公告)号:CN1457094A
公开(公告)日:2003-11-19
申请号:CN03122392.3
申请日:2003-05-09
Applicant: 株式会社日立制作所 , 日立超大规模集成电路系统株式会社
CPC classification number: H01L21/561 , H01L21/4828 , H01L21/565 , H01L23/3107 , H01L23/49503 , H01L23/49506 , H01L23/49548 , H01L23/544 , H01L24/45 , H01L24/48 , H01L24/49 , H01L24/73 , H01L24/78 , H01L24/85 , H01L24/97 , H01L2223/54473 , H01L2224/05554 , H01L2224/32014 , H01L2224/32055 , H01L2224/32245 , H01L2224/45015 , H01L2224/45144 , H01L2224/48091 , H01L2224/48247 , H01L2224/49171 , H01L2224/73265 , H01L2224/78301 , H01L2224/78703 , H01L2224/85 , H01L2224/85181 , H01L2224/92247 , H01L2224/97 , H01L2924/014 , H01L2924/07802 , H01L2924/12041 , H01L2924/181 , H01L2924/3025 , H01L2924/00014 , H01L2224/83 , H01L2924/00 , H01L2924/00012
Abstract: 一种半导体器件及其制造方法,提高在封装的背面上具有外部连接端子的QFN(方形扁平无引脚封装)的装配精度。QFN1的密封体3在沿着其背面一侧的对角线方向的2个拐角部分上设置有切口部分8。在从这些切口部分8露出来的悬空引线5b的一部分上,设置具有圆形的平面形状的识别标记15,成为使得在把QFN1装配到布线基板上时,可以有光学方法从密封体3的上方检测该识别标记15。识别标记15,可采用用蚀刻除去或用冲压机冲压构成悬空引线5b的金属板的一部分的办法形成。
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