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公开(公告)号:JPWO2017082122A1
公开(公告)日:2018-08-23
申请号:JP2016082465
申请日:2016-11-01
申请人: 三菱電機株式会社
CPC分类号: H01L23/10 , H01L23/057 , H01L23/20 , H01L23/24 , H01L23/28 , H01L24/48 , H01L25/07 , H01L25/072 , H01L25/18 , H01L2224/48091 , H01L2224/48137 , H01L2224/48472 , H01L2224/73265 , H01L2924/163 , H01L2924/181 , H01L2924/19107 , H01L2924/00012 , H01L2924/00014
摘要: 高温時、低温時や使用電圧が高電圧時の気泡の発生やシリコーンゲルと絶縁基板との剥離を抑制することで、ヒートサイクルによる絶縁性能の劣化を抑制し、絶縁性能の確保が可能なパワーモジュールを得る。上面に半導体素子(3)が搭載された絶縁基板(2)と、絶縁基板(2)の下面に接合されたベース板(1)と、絶縁基板(2)を取り囲み、ベース板(1)に接着されたケース部材(6)と、ベース板(1)とケース部材(6)とで囲まれた領域に充填され、絶縁基板(2)を封止する封止樹脂(8)と、ケース部材(6)の内壁から絶縁基板(2)の外周部の上方へ突出して内壁に固着され、封止樹脂(8)に接した押さえ板(9)とを備えたことを特徴とするパワーモジュール。
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公开(公告)号:JP2006066808A
公开(公告)日:2006-03-09
申请号:JP2004250443
申请日:2004-08-30
申请人: Fujitsu Ltd , Matsushita Electric Ind Co Ltd , Nec Corp , Oki Electric Ind Co Ltd , Renesas Technology Corp , Rohm Co Ltd , Sanyo Electric Co Ltd , Sharp Corp , Sony Corp , Tadatomo Suga , Toshiba Corp , シャープ株式会社 , ソニー株式会社 , ローム株式会社 , 三洋電機株式会社 , 富士通株式会社 , 日本電気株式会社 , 松下電器産業株式会社 , 株式会社ルネサステクノロジ , 株式会社東芝 , 沖電気工業株式会社 , 唯知 須賀
发明人: SUGA TADATOMO , ITO HISAHIRO
CPC分类号: H01L23/10 , H01L21/50 , H01L23/20 , H01L24/11 , H01L24/13 , H01L24/83 , H01L24/90 , H01L2224/05001 , H01L2224/05022 , H01L2224/05572 , H01L2224/11 , H01L2224/1134 , H01L2224/13 , H01L2224/13111 , H01L2224/1319 , H01L2224/16225 , H01L2224/29111 , H01L2224/838 , H01L2924/00013 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01018 , H01L2924/01019 , H01L2924/01023 , H01L2924/01029 , H01L2924/01033 , H01L2924/0105 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/0132 , H01L2924/014 , H01L2924/10253 , H01L2924/10329 , H01L2924/14 , H01L2924/157 , H01L2924/3025 , H01L2924/351 , H01L2224/13099 , H01L2924/00 , H01L2224/05599 , H01L2224/05099
摘要: PROBLEM TO BE SOLVED: To provide a highly reliable semiconductor device electrically connecting a semiconductor chip with a wiring substrate, suitable for repair and recycle and easy in disassembling. SOLUTION: An electrode formed on the semiconductor chip and an electrode formed on the wiring substrate are sealed by using a frame structure that is a vacuum structure or is sealed with gas that does not react with the electrodes. Consequently, the deterioration of the electrodes by an attach from oxygen and water can be prevented without the use of a sealing resin. Moreover, possibility in separation can be improved by achieving electrical connection by the contact of the electrode formed on the semiconductor chip and the electrode formed on the wiring substrate. COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译: 要解决的问题:提供一种高度可靠的将半导体芯片与布线基板电连接的半导体器件,适用于修理和再循环并易于拆卸。 解决方案:通过使用作为真空结构的框架结构或用不与电极反应的气体密封形成在半导体芯片上形成的电极和形成在布线基板上的电极。 因此,不用使用密封树脂就可以防止由氧气和水附着的电极的劣化。 此外,通过利用形成在半导体芯片上的电极和形成在布线基板上的电极的接触实现电连接,可以提高分离的可能性。 版权所有(C)2006,JPO&NCIPI
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公开(公告)号:JP2014175409A
公开(公告)日:2014-09-22
申请号:JP2013045637
申请日:2013-03-07
申请人: Toshiba Corp , 株式会社東芝
发明人: IKUMA YOSHIYUKI , SUZUKI MASATOSHI
CPC分类号: H01L23/10 , H01L23/045 , H01L23/20 , H01L23/552 , H01L23/66 , H01L24/73 , H01L2224/04042 , H01L2224/05553 , H01L2224/06135 , H01L2224/32245 , H01L2224/45144 , H01L2224/48091 , H01L2224/48227 , H01L2224/49175 , H01L2224/73265 , H01L2924/1515 , H01L2924/15153 , H01L2924/16152 , H01L2924/16172 , H01L2924/16176 , H01L2924/16195 , H01L2924/16251 , H01L2924/00012 , H01L2924/00
摘要: PROBLEM TO BE SOLVED: To provide an inexpensive package for high frequency semiconductor which can insulate a high frequency semiconductor element at high frequencies, while protecting against moisture reliably.SOLUTION: A package for high frequency semiconductor includes a base consisting of a thick copper foil, a multilayer resin substrate provided along the outer peripheral edge of the upper surface of the base and having a cavity for housing a high frequency semiconductor element by exposing the surface of the thick copper foil to the inside, a conductor film provided to cover the upper surface of the multilayer resin substrate and a surface forming the inner wall surface of the cavity, and a lid attached to the upper end peripheral edge of the multilayer resin substrate and covering the cavity while sealing.
摘要翻译: 要解决的问题:提供一种用于高频半导体的便宜的封装,其可以高频率地隔离高频半导体元件,同时可以可靠地防止水分。解决方案:用于高频半导体的封装包括由厚铜箔, 沿着基座的上表面的外周缘设置的多层树脂基板,具有通过将厚铜箔的表面暴露于内部而容纳高频半导体元件的空腔,设置成覆盖上表面的导体膜 的多层树脂基板和形成空腔的内壁面的表面,以及安装在多层树脂基板的上端周缘的盖子,并且在密封时覆盖空腔。
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公开(公告)号:JP2012059730A
公开(公告)日:2012-03-22
申请号:JP2010198199
申请日:2010-09-03
申请人: Elpida Memory Inc , エルピーダメモリ株式会社
IPC分类号: H01L25/065 , H01L23/02 , H01L25/07 , H01L25/18
CPC分类号: H01L24/97 , H01L21/50 , H01L21/6836 , H01L23/10 , H01L23/20 , H01L24/75 , H01L24/81 , H01L25/0657 , H01L25/50 , H01L2221/68327 , H01L2224/0401 , H01L2224/0557 , H01L2224/13 , H01L2224/13025 , H01L2224/16 , H01L2224/16146 , H01L2224/16225 , H01L2224/16227 , H01L2224/75252 , H01L2224/75301 , H01L2224/81005 , H01L2224/81193 , H01L2224/81203 , H01L2224/81207 , H01L2224/97 , H01L2225/06513 , H01L2225/06517 , H01L2225/06541 , H01L2225/06565 , H01L2924/00014 , H01L2924/01033 , H01L2924/01082 , H01L2924/014 , H01L2924/15311 , H01L2924/16152 , H01L2924/16251 , H01L2924/1659 , H01L2924/181 , H01L2924/351 , H01L2224/81 , H01L2224/05552 , H01L2924/00
摘要: PROBLEM TO BE SOLVED: To provide a semiconductor device that reduces a stress on each bonding part of a plurality of semiconductor chips constituting a chip lamination body, and to provide a method of manufacturing the same.SOLUTION: A semiconductor device has: a chip lamination body 3 in which a plurality of semiconductor chips 9a-9d are laminated; a wiring board 2 on whose one side the chip lamination body 3 is mounted; and a sealing body 4 covering the chip lamination body 3. The sealing body 4 forms a space S for housing the chip lamination body 3 therein together with the wiring board 2, and seals the one side of the wiring board 2 in a separated state from the chip lamination body 3.
摘要翻译: 解决的问题:提供减少构成片状层叠体的多个半导体芯片的各接合部的应力的半导体装置,并提供其制造方法。 解决方案:半导体器件具有:层叠有多个半导体芯片9a-9d的芯片层叠体3; 安装有芯片层叠体3一侧的配线基板2; 以及覆盖芯片层叠体3的密封体4.密封体4与布线板2一起形成用于将芯片层叠体3容纳在其中的空间S,并且将布线基板2的一侧以分离状态密封 芯片层压体3.版权所有(C)2012,JPO&INPIT
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公开(公告)号:JP4680763B2
公开(公告)日:2011-05-11
申请号:JP2005362649
申请日:2005-12-16
申请人: 住友電工デバイス・イノベーション株式会社
发明人: 満次 布川
CPC分类号: H01L23/552 , H01L23/04 , H01L23/10 , H01L23/20 , H01L23/66 , H01L2224/0401 , H01L2224/04026 , H01L2224/1146 , H01L2224/13144 , H01L2224/16225 , H01L2224/274 , H01L2224/94 , H01L2924/01078 , H01L2924/01079 , H01L2924/10253 , H01L2924/10272 , H01L2924/10329 , H01L2924/1033 , H01L2924/1423 , H01L2924/16152 , H01L2924/3011 , H01L2924/3025 , H01L2224/11 , H01L2224/03
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公开(公告)号:JP2016518030A
公开(公告)日:2016-06-20
申请号:JP2016510966
申请日:2014-01-30
申请人: アーベーベー・テクノロジー・アーゲー
IPC分类号: H01L25/07 , H01L23/00 , H01L23/06 , H01L23/12 , H01L23/13 , H01L23/20 , H01L23/24 , H01L25/18
CPC分类号: H01L23/053 , H01L23/049 , H01L23/10 , H01L23/20 , H01L23/24 , H01L23/26 , H01L23/3107 , H01L23/3135 , H01L23/315 , H01L24/29 , H01L24/32 , H01L24/45 , H01L24/46 , H01L24/48 , H01L24/73 , H01L25/072 , H01L25/115 , H01L2224/291 , H01L2224/32225 , H01L2224/45124 , H01L2224/48139 , H01L2224/48227 , H01L2224/73265 , H01L2924/1305 , H01L2924/13055 , H01L2924/13091 , H01L2924/16251 , H01L2924/167 , H01L2924/014 , H01L2924/00012 , H01L2924/00
摘要: 本発明はパワー半導体装置のモジュール配列に関する。モジュール配列は1つ以上のパワー半導体モジュール(38)を含み、1つ以上のパワー半導体モジュール(38)は、第1面(42)と第1面(42)の反対側に位置する第2面(44)とを有する基板(40)を含み、基板(40)は少なくとも部分的に絶縁性であり、基板(40)の第1面(42)に導電構造が配置され、少なくとも1つのパワー半導体装置が導電構造上に配置されかつ導電構造に電気的に接続され、1つ以上のモジュール(38)は少なくとも1つのパワー半導体装置を収容するための内側の容積(56)を含み、内側の容積はモジュール囲い(58)によって周囲から気密封止され、モジュール配列(36)は1つ以上のモジュール(38)を収容するための容積(62)を少なくとも部分的に定める配列囲い(60)を含み、配列囲い(60)は容積(62)を覆う。このような配列によって安全性を改善するとともに信頼性を改善することができる。
摘要翻译: 本发明涉及到模块的功率半导体装置的布置。 该模块装置包括一个或多个功率半导体模块(38),一个或多个功率半导体模块(38),第一表面(42)和所述第一表面相对的第二表面(42) 包括具有衬底(40)(44)和所述衬底(40)至少部分地绝缘,所述衬底的所述第一表面(42)上传导结构(40)被布置,至少一个功率半导体 装置被设置在所述导电结构和电连接到导电结构包含一个或多个模块(38)具有用于容纳所述功率半导体器件(56),所述内体积的至少一个内部容积 气密地从环境中通过一个模件外壳(58),模块装置(36)包括一个或多个模块(38)至少部分地限定的序列外壳体积(62),用于容纳密封的(60) SEQ外壳(60)覆盖所述体积(62)。 这样的序列可提高可靠性以及提高的安全性。
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公开(公告)号:JP4095049B2
公开(公告)日:2008-06-04
申请号:JP2004250443
申请日:2004-08-30
申请人: シャープ株式会社 , ソニー株式会社 , ローム株式会社 , 三洋電機株式会社 , 富士通株式会社 , 日本電気株式会社 , 松下電器産業株式会社 , 株式会社ルネサステクノロジ , 株式会社東芝 , 沖電気工業株式会社 , 唯知 須賀
CPC分类号: H01L23/10 , H01L21/50 , H01L23/20 , H01L24/11 , H01L24/13 , H01L24/83 , H01L24/90 , H01L2224/05001 , H01L2224/05022 , H01L2224/05572 , H01L2224/11 , H01L2224/1134 , H01L2224/13 , H01L2224/13111 , H01L2224/1319 , H01L2224/16225 , H01L2224/29111 , H01L2224/838 , H01L2924/00013 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01018 , H01L2924/01019 , H01L2924/01023 , H01L2924/01029 , H01L2924/01033 , H01L2924/0105 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/0132 , H01L2924/014 , H01L2924/10253 , H01L2924/10329 , H01L2924/14 , H01L2924/157 , H01L2924/3025 , H01L2924/351 , H01L2224/13099 , H01L2924/00 , H01L2224/05599 , H01L2224/05099
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公开(公告)号:JPS59172253A
公开(公告)日:1984-09-28
申请号:JP4615383
申请日:1983-03-18
IPC分类号: H01L23/06 , H01L21/56 , H01L23/02 , H01L23/057 , H01L23/08 , H01L23/14 , H01L23/20 , H01L23/26 , H01L23/29 , H01L23/31
CPC分类号: H01L21/565 , H01L23/057 , H01L23/08 , H01L23/145 , H01L23/20 , H01L23/26 , H01L23/293 , H01L23/315 , H01L24/45 , H01L24/48 , H01L24/97 , H01L2224/45015 , H01L2224/45124 , H01L2224/45144 , H01L2224/48091 , H01L2224/48247 , H01L2224/73265 , H01L2924/01005 , H01L2924/01006 , H01L2924/01009 , H01L2924/0101 , H01L2924/01012 , H01L2924/01013 , H01L2924/01015 , H01L2924/01018 , H01L2924/01027 , H01L2924/01028 , H01L2924/01029 , H01L2924/0103 , H01L2924/01033 , H01L2924/0105 , H01L2924/01051 , H01L2924/01054 , H01L2924/01057 , H01L2924/01074 , H01L2924/01075 , H01L2924/01079 , H01L2924/01082 , H01L2924/01092 , H01L2924/09701 , H01L2924/12041 , H01L2924/14 , H01L2924/16152 , H01L2924/181 , H01L2924/19043 , H01L2924/3025 , H01L2924/00014 , H01L2924/00 , H01L2924/00012
摘要: PURPOSE: To improve wetproofing, and to prevent the effects of curing stress and α-rays exposure by providing a first base body with a metallic layer and an insulating layer and a second base body, which has a metallic layer and an insulating layer and is fixed to the first base body so that the periphery of an electronic part is hollowed.
CONSTITUTION: A first base body 10 consists of a reinforcing layer 1a, in which glass fiber, etc. are impregnated with a synthetic resin such as epoxy resin, and an insulating layer 3a, which is formed on the surface of a metallic foil in aluminum, etc. or a metallic layer 2a such as a metal evaporated film and composed of epoxy resin or a composite material, etc. of epoxy resin and polyester fiber, etc. An electronic part 4 mounted through a die pad 5 has a projecting section 20a at an opposite position so that the periphery is formed in a hollow section 20b. A second base body 20 fixed to the first base body 10 by its own periphery is constituted by a reinforcing layer 1b, a metallic layer 2b formed on the surface of the reinforcing layer 1b and an insulating layer 3b consisting of a composite material, etc. shaped onto the surface of the metallic layer 2b.
COPYRIGHT: (C)1984,JPO&Japio摘要翻译: 目的:通过提供具有金属层和绝缘层的第一基体和具有金属层和绝缘层的第二基体,来改善防水性,并且防止固化应力和α射线暴露的影响,并且是 固定到第一基体,使得电子部件的周边被中空化。 构成:第一基体10由玻璃纤维等用合成树脂如环氧树脂浸渍的增强层1a和在铝的金属箔的表面上形成的绝缘层3a构成 或环氧树脂和聚酯纤维等的环氧树脂或复合材料等金属蒸镀薄膜等的金属层2a。通过管芯焊盘5安装的电子部件4具有突出部20a 在相对位置,使得周边形成在中空部分20b中。 通过其自身周边固定到第一基体10的第二基体20由增强层1b,形成在增强层1b的表面上的金属层2b和由复合材料等构成的绝缘层3b构成。 成形在金属层2b的表面上。
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公开(公告)号:JP2017208391A
公开(公告)日:2017-11-24
申请号:JP2016098351
申请日:2016-05-17
申请人: 日本電気硝子株式会社
摘要: 【課題】押え部材でガラス蓋を押圧せずとも、レーザー照射によりガラス蓋を容器に密着させて接合することができる気密パッケージの製造方法を提供する。 【解決手段】容器3の側壁部3bとガラス蓋5Aの間に封着材料4Aを配置して、側壁部3b上にガラス蓋5Aを載せる工程と、ガラス蓋5Aを凹部3方向に吸引することにより、ガラス蓋5Aを側壁部3b上の封着材料4Aに密着させる工程と、ガラス蓋5Aを封着材料4Aに密着させた状態で、レーザー光Lを照射して封着材料4Aを溶融させ、側壁部3bとガラス蓋5Aとを接合する工程とを備えることを特徴としている。 【選択図】図2
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公开(公告)号:JP2007281292A
公开(公告)日:2007-10-25
申请号:JP2006107593
申请日:2006-04-10
申请人: Olympus Corp , オリンパス株式会社
发明人: OHARA SATOSHI
CPC分类号: H01L23/13 , B81C1/00269 , B81C3/001 , B81C2203/035 , H01L23/10 , H01L23/20 , H01L2224/16 , H01L2924/01079 , H01L2924/15153 , H01L2924/1517 , H01L2924/16195
摘要: PROBLEM TO BE SOLVED: To provide a semiconductor device mounting structure that makes it difficult for heat to be transmitted from a package to a semiconductor device fixed on it when the package temperature goes up, and prevents the semiconductor device from getting heat damaged by heat application to join the package and a lid for sealing and by temperature disturbance from the outside when it is used.
SOLUTION: An MEMS device side fixed pad 104 is manufactured such that it becomes smaller than the total planar dimensions of a lower surface of an MEMS device 101. By doing so, the joint dimensions of the MEMS device 101 and MEMS device fixing solder 107, and the joint dimensions of the MEMS device fixing solder 107 and a package 102 can be respectively made small; thus making it hard for heat from the package 102 to be transmitted to the MEMS device 101 through the MEMS device fixing solder 107.
COPYRIGHT: (C)2008,JPO&INPIT摘要翻译: 要解决的问题:提供一种半导体器件安装结构,当封装温度升高时,难以将热量从封装传输到固定在其上的半导体器件,并且防止半导体器件受热损坏 通过热应用来加入包装和用于密封的盖子以及当使用时来自外部的温度干扰。 解决方案:制造MEMS器件侧固定焊盘104,使得其变得小于MEMS器件101的下表面的总平面尺寸。通过这样做,MEMS器件101和MEMS器件固定的关节尺寸 焊料107,并且可以分别使MEMS器件固定焊料107和封装102的接合尺寸小; 从而使来自封装102的热量难以通过MEMS器件固定焊料107传输到MEMS器件101.版权所有(C)2008,JPO&INPIT
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