Interconnects for semiconductor light emitting devices
    10.
    发明授权
    Interconnects for semiconductor light emitting devices 有权
    互连用于半导体发光器件

    公开(公告)号:US07348212B2

    公开(公告)日:2008-03-25

    申请号:US11226151

    申请日:2005-09-13

    IPC分类号: H01L21/00

    摘要: A semiconductor light emitting device including a light emitting layer disposed between an n-type region and a p-type region and contacts electrically connected to the n-type region and the p-type region is connected to a mount. A metal layer arbitrarily patterned to cover at least 20% of the area of the semiconductor light emitting device is plated on either a metal layer formed on the mount or a metal layer formed on one of the contacts. The plated metal layer may replace other known interconnecting techniques such as stud bumps. The semiconductor light emitting device is physically connected to the mount by causing interdiffusion between the contact surfaces of the metal layers. In some embodiments, a layer of solder is formed over the plated metal layer, and then the semiconductor light emitting device is physically connected to the mount by heating the solder.

    摘要翻译: 包括设置在n型区域和p型区域之间的发光层和电连接到n型区域和p型区域的触点的半导体发光器件连接到安装件。 任意图案化以覆盖半导体发光器件的面积的至少20%的金属层被镀在形成在安装件上的金属层或形成在其中一个触点上的金属层上。 电镀金属层可以替代其他已知的互连技术,例如柱状凸块。 半导体发光器件通过引起金属层的接触表面之间的相互扩散而物理连接到安装座。 在一些实施例中,在电镀金属层上形成焊料层,然后半导体发光器件通过加热焊料物理连接到安装座。