REAL-TIME DOUBLE-BEAM IN SITU INFRARED SPECTRUM SYSTEM AND METHOD THEREOF

    公开(公告)号:US20180088037A1

    公开(公告)日:2018-03-29

    申请号:US15711718

    申请日:2017-09-21

    IPC分类号: G01N21/35 G01N21/01

    摘要: A real-time double-beam in situ infrared spectrum system and a method thereof. The system comprises two identical infrared spectrometers and a double-beam infrared reactor cell, wherein the double-beam infrared reactor cell is formed by connecting a sample cell and a reference cell which are identical, the sample cell and the reference cell are at the same level and respectively correspond to a sample spectrometer and a reference spectrometer, the two infrared spectrometers are synchronously controlled by computers, to synchronously collect spectrograms of sample beams and background beams in real time, so as to obtain real information about a species on the catalyst surface changing with the reaction time, and eliminate gas molecule vibration spectrum interference in a real-time state and transmission spectrum interference generated under a heating condition. The present invention makes a characterization result become more accurate and reliable, so that real-time information about an active center of the catalyst surface, an active phase and an intermediate species at different temperatures may be obtained under a changeable gas phase component condition.

    APPARATUS FOR ANALYZING BIO-MATERIAL
    184.
    发明申请

    公开(公告)号:US20180088030A1

    公开(公告)日:2018-03-29

    申请号:US15686081

    申请日:2017-08-24

    IPC分类号: G01N21/27 G01N21/01

    摘要: Provided is an apparatus for analyzing a bio-material. According to an embodiment of the inventive concept, the apparatus may include a light distribution part having grooves, a reflective layer provided on the grooves, and a light emitting part configured to emit light to the light distribution part. The grooves may be recessed from a top surface of the light distribution part, and sidewalls of the grooves may be inclined with respect to the top surface of the light distribution part. The grooves may include a first groove and a second groove. A distance between the light emitting part and the second groove may be greater than that between the light emitting part and the first groove, and a bottom surface of the second groove may be disposed at a level lower than that of a bottom surface of the first groove.

    Sensitivity Measuring Device and Inspection Device

    公开(公告)号:US20180079996A1

    公开(公告)日:2018-03-22

    申请号:US15568093

    申请日:2016-03-28

    IPC分类号: C12M1/38 C12M1/34 G01N21/01

    摘要: This sensitivity measuring device is provided with: a stage for placing a sample container; a temperature adjustment device that is provided with an upper heating body and a lower heating body, which are disposed above and below the sample container; and an image pickup device for picking up an image of the sample container, said image pickup device being provided with a lighting apparatus and an image pickup apparatus. Each of the upper heating body and the lower heating body has a structure wherein the temperature of a first region, a peripheral portion, is higher than the temperature of a second region including a center portion.

    IMAGE-OBTAINING DEVICE AND IMAGE-OBTAINING METHOD

    公开(公告)号:US20180073976A1

    公开(公告)日:2018-03-15

    申请号:US15813444

    申请日:2017-11-15

    发明人: Kentaro IMOTO

    IPC分类号: G01N21/01 G01N21/64 G02B21/00

    摘要: Provided is an image-obtaining device including: an illumination-light generating unit that modulates an intensity of light emitted from a light source, and generates illumination light beams having mutually linearly independent patterns and including modulated illumination light and unmodulated illumination light; an illumination optical system that irradiates different positions on a sample with the illumination light beams generated; a light-detecting unit that detects combined signal light resulting from combining signal light beams generated at irradiation positions irradiated with the illumination light beams, and outputs a combined signal; and a demodulation unit that separates, from the combined signal output, a modulated local signal by using a time integral of a product of a demodulation signal corresponding to the modulated illumination light beam and the combined signal, and separates an unmodulated local signal by subtracting a sum of the modulated local signals from a time integral of the combined signal.

    Overlay measurement of pitch walk in multiply patterned targets

    公开(公告)号:US09903813B2

    公开(公告)日:2018-02-27

    申请号:US14734687

    申请日:2015-06-09

    发明人: Nuriel Amir

    摘要: Multiply patterned metrology targets and target design methods are provided to enable pitch walk measurements using overlay measurements. Multiply patterned structures having single features or spacers produced simultaneously and sharing a common pitch with the paired features or spacers are used to express pitch walk as a measurable overlay between the structures. For example, targets are provided which comprise a first multiply patterned structure having a single left-hand feature or spacer produced simultaneously and sharing a common pitch with the respective paired features or spacers, and a second multiply patterned structure having a single right-hand feature or spacer produced simultaneously and sharing a common pitch with the respective paired features or spacers.

    Imaging Method Using Magnetic Elements and Device for this Purpose

    公开(公告)号:US20180052315A1

    公开(公告)日:2018-02-22

    申请号:US15557848

    申请日:2016-04-01

    发明人: Jan Huisken Gopi Shah

    摘要: Method for imaging regions of a sample using a light source and an optical detection means and at least one device for moving the sample in three dimensions, comprising the following method steps: a) introducing at least one magnetic element into the sample, b) applying a magnetic field by means of the at least one device for moving the sample in three dimensions, the magnetic field interacting with the at least one magnetic element introduced into the sample, c) arranging the region of the sample in a radiation region of the light source and in a detection region of the detection means, d) emitting first light beams from the light source onto the sample, e) generating second light beams by means of the sample, f) recording an image of a region of the sample by capturing a proportion, incident on the detection means from the sample, of the second light beams, g) moving the at least one magnetic element and the sample containing this at least one magnetic element by varying the magnetic field, h) repeating steps d) to g) until a predeterminable number of images have been recorded.