摘要:
A stacked semiconductor device primarily comprises semiconductor packages with a plurality of micro contacts and solder paste to soldering the micro contacts. Each semiconductor package comprises a substrate and a chip disposed on the substrate. The micro contacts of the bottom semiconductor package are a plurality of top bumps located on the upper surface of the substrate. The micro contacts of the top semiconductor package are a plurality of bottom bumps located on the lower surface of the substrate. The bottom bumps are aligned with the top bumps and are electrically connected each other by the solder paste. Therefore, the top bumps and the bottom bumps have the same soldering shapes and dimensions for evenly soldering to avoid breakages of the micro bumps during stacking.
摘要:
A semiconductor package with enhanced mobility of ball terminals is revealed. A chip is attached to the substrate by a die-attaching material where the substrate has at least a stepwise depression on the covered surface to make the substrate thickness be stepwise decreased from a central line of the die-attaching area toward two opposing sides of the substrate. The die-attaching material is filled in the stepwise depression. Therefore, the thickness of the die-attaching material under cross-sectional corner(s) of the chip becomes thicker so that a row of the ball terminals away from the central line of the die-attaching area can have greater mobility without changing the appearance, dimensions, thicknesses of the semiconductor package, nor the placing plane of the ball terminals. Accordingly, the row of ball terminals located adjacent the edges or corners of the semiconductor package can withstand larger stresses without ball cracks nor ball drop. The stepwise depression can accommodate the die-attaching material to control bleeding contaminations.
摘要:
A substrate package structure is disclosed herein. The substrate package structure includes a packaging substrate provided with a plurality of chip carriers set at one surface of the packaging substrate, wherein those chip carriers are formed by intersecting a plurality of cutting streets; a plurality of through holes set at those cutting streets and set around those chip carriers; and a plurality of molding areas set on another surface of the packaging substrate and opposite to those chip carriers, wherein those molding areas are adjacent to those through holes. Hence, those through holes may be flowed by the molding compound to form a plurality of molding bumps around those chip carriers so as to improve the crack problem of the chip and/or the substrate.
摘要:
A stacked assembly of semiconductor packages primarily comprises a plurality of stacked semiconductor packages. Each semiconductor package includes an encapsulant, at least a chip, and a plurality of external leads of a leadframe, where the external leads are exposed and extended from a plurality of sides of the encapsulant. Each external lead of an upper semiconductor package has a U-shaped cut end when package singulation. The U-shaped cut ends are configured for locking to the soldered portion of a corresponding external lead of a lower semiconductor package where the U-shaped cut ends and the soldered portions by soldering materials. Therefore, the stacked assembly has a larger soldering area and stronger lead reliability to enhance the soldering points to against the effects of impacts, thermal shocks, and thermal cycles.
摘要:
A semiconductor package is revealed with a special designed substrate. The substrate has a plurality of fingers, a dummy metal pattern, and at least a peripheral slot penetrating through the substrate. The dummy metal pattern is aligned to two opposing sides of the peripheral slot and is electrically isolated from the fingers. A chip is disposed on the substrate and is electrically connected to the fingers. An encapsulant is completely filled the peripheral slot. The peripheral slot can enhance the mold flow and eliminate the mold flash. The shape of the dummy metal pattern aligned to the peripheral slot is used to offer stiffening edges to prevent the substrate from warpage and from breakage at peripheries, to enhance the thermal stress resistance due to thermal cycles, and to avoid damages to the chip.
摘要:
A memory module capable of lessening shock stresses, primarily comprises a multi-layer printed circuit board (PCB), a plurality of memory packages, and a stress-buffering layer. The memory packages are disposed at least on one of the rectangular surfaces of the PCB. The stress-buffering layer is disposed at least on both short sides of the PCB and extended to the two rectangular surfaces to reduce the impact stresses. Preferably, the stress-buffering layer is further disposed on the other long side of the PCB opposite to the one with disposed gold fingers.
摘要:
An anti-impact memory module mainly comprises a multi-layer PWB (Printed Wiring Board), a plurality of memory packages and a plurality of first anti-impact bars. The PWB has two longer sides and two shorter sides. A plurality of gold fingers are disposed along one of the longer sides. The first anti-impact bars are disposed on one surface of the PWB and adjacent to the two shorter sides, which are higher than the memory packages in height. Preferably, at least a second anti-impact bar is formed at another longer side far away from the gold fingers. The first anti-impact bars and/or the second anti-impact bar can be utilized to cushion impact force for preventing the memory module product from damaging while fallen accidentally.
摘要:
An IC package mainly includes a substrate having slot(s), a chip, a protective encapsulant, a stiffening encapsulant, and a plurality of external terminals. The Young's modulus of the stiffening encapsulant is greater than the one of the protective encapsulant and the curing shrinkage of the stiffening encapsulant is smaller than the one of the protective encapsulant. The protective encapsulant is formed on one of the surfaces of the substrate for encapsulating the chip. The stiffening encapsulant protrudes from the other surface of the substrate where the external terminals are disposed. Moreover, the stiffening encapsulant is formed inside the slot and is contacted with the chip. Since the stiffening encapsulant is embedded and formed inside the slot, therefore, the contact area of the stiffening encapsulant with the substrate is increased to enhance the warpage resistance of the IC package.
摘要:
A multi-chip stacked package and its mother chip to save an interposer are revealed. The mother chip is a two-layer structure consisting of a semiconductor layer and an organic layer where a redistribution layer is embedded into the organic layer with a plurality of first terminals and a plurality of second terminals disposed on the redistribution layer and exposed from the organic layer. The mother chip is flip-chip mounted on the substrate. The active surface of the daughter chip is in contact with the organic layer with the bonding pads of the daughter chip bonded to the first terminals. Furthermore, a plurality of electrically connecting components electrically connect the second terminals to the substrate. In the multi-chip stacked package, the interposer can be eliminated with a thinner overall package thickness as well as controlled package warpage.
摘要:
A substrate panel primarily comprises a plurality of substrate strips arranged in an array, one or more current input lines, a plurality of cascaded lines connecting between the substrate strips, and a current input buffer gate. Current input lines connect a current input side of the substrate panel to the adjacent substrate strips. The current input buffer gate has a frame around the substrate strips and a plurality of meshes where the frame intersects with the current input lines and the meshes intersect with the cascaded lines with both ends of the meshes connecting to the frame. Therefore, the current can be evenly distributed to each substrate strip during plating processes to improve the issues of different plating thicknesses and different plating roughness caused by different current densities and to protect the internal circuits inside the substrate strips from the damages due to current surges and unstable voltages.