Method of making microelectronic spring contact array
    22.
    发明申请
    Method of making microelectronic spring contact array 失效
    制造微电子弹簧接触阵列的方法

    公开(公告)号:US20040016119A1

    公开(公告)日:2004-01-29

    申请号:US10202712

    申请日:2002-07-24

    Abstract: A method of making a microelectronic spring contact array comprises forming a plurality of spring contacts on a sacrificial substrate and then releasing the spring contacts from the sacrificial substrate. Each of the spring contacts has an elongated beam having a base end. The method of making the array includes attaching the spring contacts at their base ends to a base substrate after they have been released entirely from the sacrificial substrate, so that each contact extends from the base substrate to a distal end of its beams. The distal ends are aligned with a predetermined array of tip positions. In an embodiment of the invention, the spring contacts are formed by patterning contours of the spring contacts in a sacrificial layer on the sacrificial substrate. The walls of patterned recesses in the sacrificial layer define side profiles of the spring contacts, and a conductive material is deposited in the recesses to form the elongated beams of the spring contacts.

    Abstract translation: 制造微电子弹簧接触阵列的方法包括在牺牲衬底上形成多个弹簧触点,然后从牺牲衬底释放弹簧触头。 每个弹簧触点具有带有基端的细长梁。 制造阵列的方法包括在它们已经从牺牲基板完全释放之后将其基端处的弹簧触点附接到基底基板,使得每个触点从基底延伸到其波束的远端。 远端与预定阵列的尖端位置对准。 在本发明的一个实施例中,通过在牺牲衬底上的牺牲层中图形地形成弹簧触点的轮廓来形成弹簧触点。 牺牲层中的图案化凹槽的壁限定弹簧触点的侧面轮廓,并且导电材料沉积在凹部中以形成弹簧触点的细长梁。

    Contact tip structure for microelectronic interconnection elements and method of making same
    23.
    发明申请
    Contact tip structure for microelectronic interconnection elements and method of making same 审中-公开
    微电子互连元件的接触尖端结构及其制造方法

    公开(公告)号:US20030199179A1

    公开(公告)日:2003-10-23

    申请号:US09953666

    申请日:2001-09-14

    Abstract: Contact tip structures are fabricated on sacrificial substrates for subsequent joining to interconnection elements including composite interconnection elements, monolithic interconnection elements, tungsten needles of probe cards, contact bumps of membrane probes, and the like. The spatial relationship between the tip structures can lithographically be defined to very close tolerances. The metallurgy of the tip structures is independent of that of the interconnection element to which they are attached, by brazing, plating or the like. The contact tip structures are readily provided with topological (small, precise, projecting, non-planar) contact features, such as in the form of truncated pyramids, to optimize electrical pressure connections subsequently being made to terminals of electronic components. Elongate contact tip structures, adapted in use to function as spring contact elements without the necessity of being joined to resilient contact elements are described. Generally, the invention is directed to making (pre-fabricating) relatively nullperfectnull contact tip structures (nulltipsnull) and joining them to relatively nullimperfectnull interconnection elements to improve the overall capabilities of resulting nulltippednull interconnection elements.

    Abstract translation: 接触尖端结构被制造在牺牲衬底上,用于随后连接到包括复合互连元件,单片互连元件,探针卡的钨针,膜探针的接触凸块等的互连元件。 尖端结构之间的空间关系可以光刻地定义为非常接近的公差。 尖端结构的冶金独立于它们所连接的互连元件的冶金,通过钎焊,电镀等。 接触尖端结构容易地具有拓扑(小的,精确的,突出的,非平面的)接触特征,例如呈截锥形的形式,以优化随后对电子部件的端子进行的电压连接。 描述了适于用作弹簧接触元件而不需要接合到弹性接触元件的细长接触尖端结构。 通常,本发明旨在制造(预制)相对“完美”的接触尖端结构(“尖端”)并将它们连接到相对“不完美”的互连元件,以改善所产生的“尖端”互连元件的总体能力。

    Composite motion probing
    26.
    发明申请
    Composite motion probing 失效
    复合运动探测

    公开(公告)号:US20040130312A1

    公开(公告)日:2004-07-08

    申请号:US10328113

    申请日:2002-12-20

    CPC classification number: G01R31/2887 G01R1/06705 G01R31/2886

    Abstract: An electronic device is moved into a first position with respect to probes for making electrical contact with the device. The electronic device is then moved into a second position in which the electronic device is pressed against the probes, compressing the probes. The movement into the second position includes two components. One component of the movement tends to press the electronic device against the probes, compressing the probes and inducing a stress in the probes. The second movement tends to reduce that stress. Test data are then communicated to and from the electronic device through the probes.

    Abstract translation: 电子设备相对于用于与设备电接触的探针移动到第一位置。 然后将电子设备移动到第二位置,其中电子设备被压靠在探针上,压缩探针。 进入第二位置的运动包括两个部件。 移动的一个组件倾向于将电子装置压靠在探针上,压缩探针并在探针中引起应力。 第二动作往往会减轻压力。 然后通过探头将测试数据传送到电子设备和从电子设备传送。

    Microelectronic contact structure
    27.
    发明申请
    Microelectronic contact structure 有权
    微电子接触结构

    公开(公告)号:US20040121627A1

    公开(公告)日:2004-06-24

    申请号:US10328083

    申请日:2002-12-23

    Abstract: An elongate, columnar micro-mechanical structure disposed along a central longitudinal axis; the structure is made up of laminated structural layers, each comprised of a structural material. The layers define a substantially rigid base portion at a proximal end of the structure, a resilient intermediate portion extending from the base portion along the central axis, and a contact tip extending from the resilient portion at a distal end of the structure. The resilient portion of the contact structure is comprised of resilient arms defined in the layers. Opposite ends of the resilient arms may be angularly offset with respect to one another around the central axis. Accordingly, when the contact structure is compressed in an axial direction, the contact tip will rotate around the central axis, while the base remains fixed, providing beneficial wiping action to the contact tip.

    Abstract translation: 沿着中心纵向轴线设置的细长柱状微机械结构; 该结构由层压结构层组成,每层由结构材料构成。 这些层在结构的近端处限定基本上刚性的基部,从基部延伸的弹性中间部分沿着中心轴线,以及在结构的远端处从弹性部分延伸的接触尖端。 接触结构的弹性部分由限定在层中的弹性臂组成。 弹性臂的相对端部可以相对于中心轴线彼此成角度地偏移。 因此,当接触结构沿轴向压缩时,接触尖端将围绕中心轴线旋转,同时基座保持固定,为接触尖端提供有益的擦拭作用。

    Microelectronic contact structures, and methods of making same
    29.
    发明申请
    Microelectronic contact structures, and methods of making same 有权
    微电子接触结构及其制造方法

    公开(公告)号:US20030049951A1

    公开(公告)日:2003-03-13

    申请号:US10202768

    申请日:2002-07-25

    Abstract: Microelectronic contact structures are fabricated by separately forming, then joining together, various components thereof. Each contact structure has three components: a nullpostnull component, a nullbeamnull component, and a nulltipnull component. The resulting contact structure, mounted to an electronic component, is useful for making an electrical connection with another electronic component. The post component can be fabricated on a sacrificial substrate, joined to the electronic component and its sacrificial substrate removed. Alternatively, the post component can be formed on the electronic component. The beam and tip components can each be fabricated on a sacrificial substrate. The beam component is joined to the post component and its sacrificial substrate is removed, and the tip component is joined to the beam component and its sacrificial substrate is removed.

    Abstract translation: 微电子接触结构通过分别形成,然后连接在一起而制成其各种部件。 每个接触结构具有三个部件:“后”部件,“梁”部件和“尖端”部件。 安装到电子部件上的所得接触结构对于与另一个电子部件进行电连接是有用的。 后部组件可以制造在牺牲基板上,连接到电子部件并且去除其牺牲基板。 或者,可以在电子部件上形成柱部件。 梁和尖端部件可以分别制造在牺牲衬底上。 梁组件连接到柱部件,并且其牺牲基板被移除,并且尖端部件接合到梁部件并且其牺牲基板被移除。

    Interconnection element with contact blade
    30.
    发明申请
    Interconnection element with contact blade 有权
    互连元件与接触片

    公开(公告)号:US20030015347A1

    公开(公告)日:2003-01-23

    申请号:US10174455

    申请日:2002-06-17

    Abstract: An apparatus and method providing improved interconnection elements and tip structures for effecting pressure connections between terminals of electronic components is described. The tip structure of the present invention has a sharpened blade oriented on the upper surface of the tip structure such that the length of the blade is substantially parallel to the direction of horizontal movement of the tip structure as the tip structure deflects across the terminal of an electronic component. In this manner, the sharpened substantially parallel oriented blade slices cleanly through any non-conductive layer(s) on the surface of the terminal and provides a reliable electrical connection between the interconnection element and the terminal of the electrical component.

    Abstract translation: 描述了提供改进的互连元件和尖端结构以实现电子部件的端子之间的压力连接的装置和方法。 本发明的尖端结构具有尖端结构的上表面上定向的锋利的叶片,使得叶片的长度基本上平行于尖端结构的水平移动方向,因为尖端结构偏转穿过端部 电子元件 以这种方式,锋利的基本上平行的定向叶片切片通过终端表面上的任何非导电层清洁,并且在互连元件和电气部件的端子之间提供可靠的电连接。

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