Methods for planarizing a semiconductor contactor
    1.
    发明申请
    Methods for planarizing a semiconductor contactor 有权
    平面化半导体接触器的方法

    公开(公告)号:US20040266089A1

    公开(公告)日:2004-12-30

    申请号:US10852370

    申请日:2004-05-24

    申请人: FormFactor, Inc.

    IPC分类号: H01L021/8238

    CPC分类号: G01R1/07307 G01R3/00

    摘要: A planarizer for a probe card assembly. A planarizer includes a first control member extending from a substrate in a probe card assembly. The first control member extends through at least one substrate in the probe card assembly and is accessible from an exposed side of an exterior substrate in the probe card assembly. Actuating the first control member causes a deflection of the substrate connected to the first control member.

    摘要翻译: 用于探针卡组件的平面化器。 平面化器包括从探针卡组件中的衬底延伸的第一控制构件。 第一控制构件延伸穿过探针卡组件中的至少一个衬底,并且可从探针卡组件中的外部衬底的暴露侧进入。 驱动第一控制构件导致连接到第一控制构件的衬底的偏转。

    Probe array and method of its manufacture
    4.
    发明申请
    Probe array and method of its manufacture 失效
    探头阵列及其制造方法

    公开(公告)号:US20040099641A1

    公开(公告)日:2004-05-27

    申请号:US10302969

    申请日:2002-11-25

    申请人: FormFactor, Inc.

    IPC分类号: B23H001/00 B23H009/00

    CPC分类号: B23H9/00 G01R1/07314

    摘要: A method of forming a probe array includes forming a layer of tip material over a block of probe material. A first electron discharge machine (EDM) electrode is positioned over the layer of tip material, the EDM electrode having a plurality of openings corresponding to a plurality of probes to be formed. Excess material from the layer of tip material and the block of probe material is removed to form the plurality of probes. A substrate having a plurality of through holes corresponding to the plurality of probes is positioned so that the probes penetrate the plurality of through holes. The substrate is bonded to the plurality of probes. Excess probe material is removed so as to planarize the substrate.

    摘要翻译: 形成探针阵列的方法包括在探针材料块上形成尖端材料层。 第一电子放电机(EDM)电极位于尖端材料层上方,EDM电极具有与要形成的多个探针对应的多个开口。 去除从尖端材料层和探针材料块的多余材料以形成多个探针。 具有对应于多个探针的多个通孔的基板被定位成使得探针穿透多个通孔。 衬底被结合到多个探针。 去除过量的探针材料以使基底平坦化。

    Microelectronic spring contact repair
    10.
    发明申请
    Microelectronic spring contact repair 有权
    微电子弹簧接触维修

    公开(公告)号:US20030113990A1

    公开(公告)日:2003-06-19

    申请号:US10028500

    申请日:2001-12-19

    申请人: FormFactor, Inc.

    IPC分类号: H01L021/00 H01L021/44

    摘要: A method for replacing a microelectronic spring contact bonded to a terminal of a substrate is disclosed. The method comprises removing the microelectronic spring contact from the terminal, such as by cutting the microelectronic spring contact in two adjacent to the terminal. Then, a bonding material, such as a solder paste, is applied to the terminal and a replacement spring contact is positioned on the bonding material. The bonding material is then cured to fix the replacement spring contact in place. The replacement spring contact includes a base configured to fit on or over any protruding material left on the terminal, and at least one resilient cantilever arm extending from the base. In an embodiment of the invention, the base comprises at least two legs extending from the base in a direction opposite to the cantilever arm. In an alternative embodiment, the base of the replacement spring contact has a flat bottom, or one or more recesses to receive protrusions on the terminal. The replacement spring contact is positioned with its base opposite to the terminal and the resilient cantilever arm extending away from the substrate. A method for forming a suitable replacement spring contact is also disclosed.

    摘要翻译: 公开了一种用于替换接合到衬底的端子的微电子弹簧触点的方法。 该方法包括从端子移除微电子弹簧触点,例如通过在与端子相邻的两个中切割微电子弹簧触点。 然后,将诸如焊膏的接合材料施加到端子上,并且将更换的弹簧接触件定位在接合材料上。 然后固化接合材料以将替换弹簧接触件固定就位。 所述更换弹簧触头包括构造成装配在所述端子上留下的任何突起材料上或上方的底座以及从所述基座延伸的至少一个弹性悬臂。 在本发明的一个实施例中,底座包括至少两个从底座延伸到与悬臂相对的方向的腿。 在替代实施例中,替换弹簧触头的底部具有平坦的底部或一个或多个凹部,以在端子上容纳突起。 替换弹簧触点定位成其基座与端子相对,并且弹性悬臂臂远离基板延伸。 还公开了一种用于形成合适的替换弹簧触点的方法。