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314 条记录 (耗时 0.035 秒)

    A SEMICONDUCTOR PACKAGE OF A FLIPPED MOSFET
    31.
    发明申请
    A SEMICONDUCTOR PACKAGE OF A FLIPPED MOSFET 有权
    襟翼MOSFET的半导体封装

    公开(公告)号：US20140361418A1

    公开(公告)日：2014-12-11

    申请号：US13913183

    申请日：2013-06-07

    申请人： Yan Xun Xue ,  Yueh-Se Ho ,  Hamza Yilmaz ,  Jun Lu

    发明人： Yan Xun Xue ,  Yueh-Se Ho ,  Hamza Yilmaz ,  Jun Lu

    IPC分类号： H01L23/495

    CPC分类号： H01L23/4951 ,  H01L23/492 ,  H01L23/49513 ,  H01L23/49541 ,  H01L23/49548 ,  H01L23/49562 ,  H01L24/73 ,  H01L2224/16245 ,  H01L2224/48091 ,  H01L2224/49111 ,  H01L2224/92247 ,  H01L2924/01322 ,  H01L2924/13091 ,  H01L2924/00014 ,  H01L2924/00

    摘要： The invention relates to a semiconductor package of a flip chip and a method for making the semiconductor package. The semiconductor chip comprises a metal-oxide-semiconductor field effect transistor. On a die paddle including a first base, a second base and a third base, half-etching or punching is performed on the top surfaces of the first base and the second base to obtain plurality of grooves that divide the top surface of the first base into a plurality of areas comprising multiple first connecting areas, and divide the top surface of the second base into a plurality of areas comprising at least a second connecting area. The semiconductor chip is connected to the die paddle at the first connecting areas and the second connecting area.

    摘要翻译： 本发明涉及倒装芯片的半导体封装以及制造半导体封装的方法。 半导体芯片包括金属氧化物半导体场效应晶体管。 在包括第一基底，第二基底和第三基底的裸片上，在第一基底和第二基底的顶表面上进行半蚀刻或冲孔，以获得多个凹槽，该凹槽将第一基底 进入包括多个第一连接区域的多个区域，并且将第二基座的顶表面分成包括至少第二连接区域的多个区域。 半导体芯片在第一连接区域和第二连接区域处连接到管芯焊盘。

    Packaging method of molded wafer level chip scale package (WLCSP)
    35.
    发明授权
    Packaging method of molded wafer level chip scale package (WLCSP) 有权
    模制晶圆级芯片级封装（WLCSP）的封装方法

    公开(公告)号：US08778735B1

    公开(公告)日：2014-07-15

    申请号：US13931854

    申请日：2013-06-29

    申请人： Yan Xun Xue ,  Hamza Yilmaz ,  Yueh-Se Ho ,  Jun Lu ,  Ping Huang ,  Lei Shi ,  Lei Duan ,  Yuping Gong

    发明人： Yan Xun Xue ,  Hamza Yilmaz ,  Yueh-Se Ho ,  Jun Lu ,  Ping Huang ,  Lei Shi ,  Lei Duan ,  Yuping Gong

    IPC分类号： H01L21/00 ,  H01L21/304 ,  H01L21/78

    CPC分类号： H01L21/304 ,  H01L21/561 ,  H01L21/78 ,  H01L23/3114 ,  H01L24/27 ,  H01L2224/73104 ,  H01L2224/83191 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2924/00

    摘要： A WLCSP method comprises: depositing a metal bump on bonding pads of chips; forming a first packaging layer at front surface of wafer to cover metal bumps while forming an un-covered ring at the edge of wafer to expose the ends of each scribe line located between two adjacent chips; thinning first packaging layer to expose metal bumps; forming a groove on front surface of first packaging layer along each scribe line by cutting along a straight line extended by two ends of scribe line exposed on front surface of un-covered ring; grinding back surface of wafer to form a recessed space and a support ring at the edge of the wafer; depositing a metal layer at bottom surface of wafer in recessed space; cutting off the edge portion of wafer; and separating individual chips from wafer by cutting through first packaging layer, the wafer and metal layer along groove.

    摘要翻译： WLCSP方法包括：在芯片的焊盘上沉积金属凸块; 在晶片的前表面形成第一包装层以覆盖金属凸块，同时在晶片边缘形成未覆盖的环，以露出位于两个相邻芯片之间的每个划线的端部; 稀释第一包装层以暴露金属凸块; 通过沿着未被覆盖的环的前表面上暴露的划线的两端延伸的直线切割沿着每个划线在第一包装层的前表面上形成凹槽; 研磨晶片的后表面以在晶片的边缘处形成凹陷空间和支撑环; 在凹陷空间中在晶片的底面沉积金属层; 切断晶片的边缘部分; 以及通过沿着沟槽切割第一包装层，晶片和金属层，从晶片分离单个芯片。

    Packaging method of molded wafer level chip scale package (WLCSP)
    37.
    发明授权
    Packaging method of molded wafer level chip scale package (WLCSP) 有权
    模制晶圆级芯片级封装（WLCSP）的封装方法

    公开(公告)号：US08563361B2

    公开(公告)日：2013-10-22

    申请号：US13547358

    申请日：2012-07-12

    申请人： Yan Xun Xue ,  Hamza Yilmaz ,  Yueh-Se Ho ,  Jun Lu ,  Ping Huang ,  Lei Shi ,  Lei Duan ,  Yuping Gong

    发明人： Yan Xun Xue ,  Hamza Yilmaz ,  Yueh-Se Ho ,  Jun Lu ,  Ping Huang ,  Lei Shi ,  Lei Duan ,  Yuping Gong

    IPC分类号： H01L21/00

    CPC分类号： H01L21/563 ,  H01L23/3157 ,  H01L2224/73104 ,  H01L2224/83191 ,  H01L2924/13091 ,  H01L2924/00

    摘要： A WLCSP method comprises: depositing a metal bump on bonding pads of chips; forming a first packaging layer at front surface of wafer to cover metal bumps while forming an un-covered ring at the edge of wafer to expose the ends of each scribe line located between two adjacent chips; thinning first packaging layer to expose metal bumps; forming a groove on front surface of first packaging layer along each scribe line by cutting along a straight line extended by two ends of scribe line exposed on front surface of un-covered ring; grinding back surface of wafer to form a recessed space and a support ring at the edge of the wafer; depositing a metal layer at bottom surface of wafer in recessed space; cutting off the edge portion of wafer; and separating individual chips from wafer by cutting through first packaging layer, the wafer and metal layer along groove.

    摘要翻译： WLCSP方法包括：在芯片的焊盘上沉积金属凸块; 在晶片的前表面形成第一包装层以覆盖金属凸块，同时在晶片边缘形成未覆盖的环，以露出位于两个相邻芯片之间的每个划线的端部; 稀释第一包装层以暴露金属凸块; 通过沿着未被覆盖的环的前表面上暴露的划线的两端延伸的直线切割沿着每个划线在第一包装层的前表面上形成凹槽; 研磨晶片的后表面以在晶片的边缘处形成凹陷空间和支撑环; 在凹陷空间中在晶片的底面沉积金属层; 切断晶片的边缘部分; 以及通过沿着沟槽切割第一包装层，晶片和金属层，从晶片分离单个芯片。