Integrated circuit package comprising surface capacitor and ground plane

    公开(公告)号:US10181410B2

    公开(公告)日:2019-01-15

    申请号:US14634547

    申请日:2015-02-27

    Abstract: Many aspects of an improved IC package are disclosed herein. The improved IC package exhibits low-impedance and high power and signal integrity. The improved IC package comprises an IC die mounted on a multilayer coreless substrate. The thicknesses of prepreg layers of the coreless substrate are specific chosen to minimize warpage and to provide good mechanical performance. Each of the prepreg layers may have different coefficient of thermal expansion (CTE) and/or thickness to enable better control of the coreless substrate mechanical properties. The improved IC package also includes a vertically mounted die side capacitor and a conductive layer formed on the solder resist layer of the substrate. The conductive layer is formed such that it also encapsulates the vertically mounted capacitor while being electrically coupled to one of the capacitor's electrode.

    Known good die testing for high frequency applications

    公开(公告)号:US09933455B2

    公开(公告)日:2018-04-03

    申请号:US14703677

    申请日:2015-05-04

    Abstract: Embodiments contained in the disclosure provide a method and apparatus for testing an electronic device. An electronic device is installed in a test socket guide. A pusher tip applies a load to the guided coaxial spring probes and forces contact with pads on the device. Test and ground signals are routed through the device and test socket. The apparatus includes a socket having at least one guided coaxial spring probe pin. A socket guide shim is positioned between the receptacle for the electronic device and the socket. A socket guide aids positioning. A pusher tip is placed on the side opposite that of the guided coaxial spring probe pins. The pusher tip mates with a pusher shim and the pusher spring. A top is then placed on the assembly and acts to compress the pusher spring and engage the guided coaxial spring probe pins with the pads on the device.

    Solenoid inductor in a substrate
    45.
    发明授权

    公开(公告)号:US09806144B2

    公开(公告)日:2017-10-31

    申请号:US14079488

    申请日:2013-11-13

    CPC classification number: H01L28/10 H01F17/0013 H01F41/041 H01F2017/0053

    Abstract: Some implementations provide an integrated device (e.g., semiconductor device) that includes a substrate and an inductor in the substrate. In some implementations, the inductor is a solenoid inductor. The inductor includes a set of windings. The set of windings has an inner perimeter. The set of windings includes a set of interconnects and a set of vias. The set of interconnects and the set of vias are located outside the inner perimeter of the set of windings. In some implementations, the set of windings further includes a set of capture pads. The set of interconnects is coupled to the set of vias through the set of capture pads. In some implementations, the set of windings has an outer perimeter. The set of pads is coupled to the set of interconnects such that the set of pads is at least partially outside the outer perimeter of the set of windings.

    Inductor structure in a semiconductor device
    48.
    发明授权
    Inductor structure in a semiconductor device 有权
    半导体器件中的电感结构

    公开(公告)号:US09576718B2

    公开(公告)日:2017-02-21

    申请号:US14746652

    申请日:2015-06-22

    Abstract: An inductor structure includes a first set of traces corresponding to a first layer of an inductor, a second set of traces corresponding to a second layer of the inductor, and a third set of traces corresponding to a third layer of the inductor that is positioned between the first layer and the second layer. The first set of traces includes a first trace and a second trace that is parallel to the first trace. A dimension of the first trace is different from a corresponding dimension of the second trace. The second set of traces is coupled to the first set of traces. The second set of traces includes a third trace that is coupled to the first trace and to the second trace. The third set of traces is coupled to the first set of traces.

    Abstract translation: 电感器结构包括对应于电感器的第一层的第一组迹线,对应于电感器的第二层的第二组迹线,以及对应于电感器的第三层的第三组迹线,其位于 第一层和第二层。 第一组轨迹包括与第一轨迹平行的第一轨迹和第二轨迹。 第一个跟踪的维度与第二个跟踪的相应维度不同。 第二组迹线耦合到第一组迹线。 第二组迹线包括耦合到第一迹线和第二迹线的第三迹线。 第三组迹线耦合到第一组迹线。

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