公开(公告)号：US20070151861A1

公开(公告)日：2007-07-05

申请号：US11682005

申请日：2007-03-05

申请人： MING XI ,  Paul Smith ,  Ling Chen ,  Michael Yang ,  Mei Chang ,  Fusen Chen ,  Christophe Marcadal ,  Jenny Lin

发明人： MING XI ,  Paul Smith ,  Ling Chen ,  Michael Yang ,  Mei Chang ,  Fusen Chen ,  Christophe Marcadal ,  Jenny Lin

IPC分类号： C23C28/00 ,  C23C28/02

CPC分类号： H01L21/76804 ,  C25D5/02 ,  H01L21/2855 ,  H01L21/28556 ,  H01L21/28562 ,  H01L21/76831 ,  H01L21/76843 ,  H01L21/76844 ,  H01L21/76846 ,  H01L21/76877 ,  H01L23/5226 ,  H01L23/53238 ,  H01L2924/0002 ,  H01L2924/00

摘要： Embodiments of the present invention provide a process sequence and related hardware for filling a patterned feature on a substrate with a metal, such as copper. The sequence comprises first forming a reliable barrier layer in the patterned feature to prevent diffusion of the metal into the dielectric layer through which the patterned feature is formed. One sequence comprises forming a generally conformal barrier layer over a patterned dielectric, etching the barrier layer at the bottom of the patterned feature, depositing a second barrier layer, and then filling the patterned feature with a metal, such as copper.

摘要翻译： 本发明的实施例提供了用金属（例如铜）在衬底上填充图案化特征的工艺顺序和相关硬件。 序列包括首先在图案化特征中形成可靠的阻挡层，以防止金属扩散到通过其形成图案化特征的电介质层。 一个序列包括在图案化电介质上形成大致共形的阻挡层，在图案化特征的底部蚀刻阻挡层，沉积第二阻挡层，然后用诸如铜的金属填充图案化的特征。

公开(公告)号：US07175713B2

公开(公告)日：2007-02-13

申请号：US10352257

申请日：2003-01-27

申请人： Randhir P. S. Thakur ,  Alfred W. Mak ,  Ming Xi ,  Walter Benjamin Glenn ,  Ahmad A. Khan ,  Ayad A. Al-Shaikh ,  Avgerinos V. Gelatos ,  Salvador P. Umotoy

发明人： Randhir P. S. Thakur ,  Alfred W. Mak ,  Ming Xi ,  Walter Benjamin Glenn ,  Ahmad A. Khan ,  Ayad A. Al-Shaikh ,  Avgerinos V. Gelatos ,  Salvador P. Umotoy

IPC分类号： C23C16/00 ,  C23C16/503 ,  C23C16/505 ,  C23C16/50 ,  C23F1/00 ,  H01L21/306

CPC分类号： C23C16/45544 ,  C23C16/4412 ,  C23C16/452 ,  C23C16/45536 ,  C23C16/45565 ,  C23C16/45582 ,  H01J37/32009 ,  H01J37/32091 ,  H01J37/3244 ,  H01J37/32834 ,  H01L21/6719

摘要： An apparatus for cyclical depositing of thin films on semiconductor substrates, comprising a process chamber having a gas distribution system with separate paths for process gases and an exhaust system synchronized with operation of valves dosing the process gases into a reaction region of the chamber.

摘要翻译： 一种用于在半导体衬底上循环沉积薄膜的装置，包括具有气体分配系统的处理室，该气体分配系统具有用于处理气体的独立路径，以及与将所述工艺气体计量到所述室的反应区域的阀的操作同步的排气系统。

公开(公告)号：US20060223286A1

公开(公告)日：2006-10-05

申请号：US11423535

申请日：2006-06-12

申请人： Barry Chin ,  Alfred Mak ,  Lawrence Lei ,  Ming Xi ,  Hua Chung ,  Ken Lai ,  Jeong Byun

发明人： Barry Chin ,  Alfred Mak ,  Lawrence Lei ,  Ming Xi ,  Hua Chung ,  Ken Lai ,  Jeong Byun

IPC分类号： C23C16/00 ,  H01L21/20

CPC分类号： C23C16/45544 ,  C23C16/45525 ,  C23C16/45548 ,  C23C16/45551 ,  C23C16/4583

摘要： A method and apparatus for atomic layer deposition (ALD) is described. The apparatus comprises a deposition chamber and a wafer support. The deposition chamber is divided into two or more deposition regions that are integrally connected one to another. The wafer support is movable between the two or more interconnected deposition regions within the deposition chamber.

摘要翻译： 描述了用于原子层沉积（ALD）的方法和装置。 该装置包括沉积室和晶片支架。 沉积室被分成两个或更多个彼此一体地连接的沉积区域。 晶片支撑件可在沉积室内的两个或更多互连的沉积区域之间移动。

公开(公告)号：US07115494B2

公开(公告)日：2006-10-03

申请号：US11338565

申请日：2006-01-24

申请人： Ashok Sinha ,  Ming Xi ,  Moris Kori ,  Alfred W. Mak ,  Jeong Soo Byun ,  Lawrence Chung-Lai Lei ,  Hua Chung

发明人： Ashok Sinha ,  Ming Xi ,  Moris Kori ,  Alfred W. Mak ,  Jeong Soo Byun ,  Lawrence Chung-Lai Lei ,  Hua Chung

IPC分类号： H01L21/44

CPC分类号： H01L21/76838 ,  C23C16/0272 ,  C23C16/14 ,  C23C16/4401 ,  C23C16/45525 ,  C23C16/45527 ,  C23C16/45529 ,  C23C16/45534 ,  C23C16/45561 ,  C30B25/02 ,  C30B25/14 ,  C30B29/38 ,  H01L21/28556 ,  H01L21/28562 ,  H01L21/76843 ,  H01L21/76876 ,  H01L21/76877

摘要： A method and system to reduce the resistance of refractory metal layers by controlling the presence of fluorine contained therein. The present invention is based upon the discovery that when employing ALD techniques to form refractory metal layers on a substrate, the carrier gas employed impacts the presence of fluorine in the resulting layer. As a result, the method features chemisorbing, onto the substrate, alternating monolayers of a first compound and a second compound, with the second compound having fluorine atoms associated therewith, with each of the first and second compounds being introduced into the processing chamber along with a carrier gas to control a quantity of the fluorine atoms associated with the monolayer of the second compound.

摘要翻译： 通过控制其中所含的氟的存在来降低难熔金属层的电阻的方法和系统。 本发明基于以下发现：当采用ALD技术在基底上形成难熔金属层时，所用载体会影响所得层中氟的存在。 结果，该方法具有化学吸附到底物上的第一化合物和第二化合物的交替单层，第二化合物具有与之有关的氟原子，其中第一和第二化合物中的每一个与第一和第二化合物一起被引入处理室 用于控制与第二化合物的单层相关的氟原子的量的载气。

公开(公告)号：US07033922B2

公开(公告)日：2006-04-25

申请号：US10951354

申请日：2004-09-29

申请人： Moris Kori ,  Alfred W. Mak ,  Jeong Soo Byun ,  Lawrence Chung-Lai Lei ,  Hua Chung ,  Ashok Sinha ,  Ming Xi

发明人： Moris Kori ,  Alfred W. Mak ,  Jeong Soo Byun ,  Lawrence Chung-Lai Lei ,  Hua Chung ,  Ashok Sinha ,  Ming Xi

IPC分类号： H01L21/44

CPC分类号： H01L21/76838 ,  C23C16/0272 ,  C23C16/14 ,  C23C16/4401 ,  C23C16/45525 ,  C23C16/45527 ,  C23C16/45529 ,  C23C16/45534 ,  C23C16/45561 ,  C30B25/02 ,  C30B25/14 ,  C30B29/38 ,  H01L21/28556 ,  H01L21/28562 ,  H01L21/76843 ,  H01L21/76876 ,  H01L21/76877

摘要： A method and system to reduce the resistance of refractory metal layers by controlling the presence of fluorine contained therein. The present invention is based upon the discovery that when employing ALD techniques to form refractory metal layers on a substrate, the carrier gas employed impacts the presence of fluorine in the resulting layer. As a result, the method features chemisorbing, onto the substrate, alternating monolayers of a first compound and a second compound, with the second compound having fluorine atoms associated therewith, with each of the first and second compounds being introduced into the processing chamber along with a carrier gas to control a quantity of the fluorine atoms associated with the monolayer of the second compound.

公开(公告)号：US20060075966A1

公开(公告)日：2006-04-13

申请号：US11146309

申请日：2005-06-06

申请人： Chen-An Chen ,  Avgerinos Gelatos ,  Michael Yang ,  Ming Xi ,  Mark Hytros

发明人： Chen-An Chen ,  Avgerinos Gelatos ,  Michael Yang ,  Ming Xi ,  Mark Hytros

IPC分类号： C23C16/00

CPC分类号： C23C16/06 ,  C23C16/34 ,  C23C16/42 ,  C23C16/452 ,  C23C16/4554 ,  C23C16/45544 ,  C23C16/45565 ,  C23C16/515 ,  H01J37/32082 ,  H01J37/3244 ,  H01L21/28556 ,  H01L21/28562 ,  H01L21/28568 ,  H01L21/3122 ,  H01L21/3127 ,  H01L21/76843

摘要： Embodiments of the present invention relate to an apparatus and method of plasma assisted deposition by generation of a plasma adjacent a processing region. One embodiment of the apparatus comprises a substrate processing chamber including a top shower plate, a power source coupled to the top shower plate, a bottom shower plate, and an insulator disposed between the top shower plate and the bottom shower plate. In one aspect, the power source is adapted to selectively provide power to the top shower plate to generate a plasma from the gases between the top shower plate and the bottom shower plate. In another embodiment, a power source is coupled to the top shower plate and the bottom shower plate to generate a plasma between the bottom shower plate and the substrate support. One embodiment of the method comprises performing in a single chamber one or more of the processes including, but not limited to, cyclical layer deposition, combined cyclical layer deposition and plasma-enhanced chemical vapor deposition; plasma-enhanced chemical vapor deposition; and/or chemical vapor deposition.

公开(公告)号：US20060040052A1

公开(公告)日：2006-02-23

申请号：US10418728

申请日：2003-04-18

申请人： Hongbin Fang ,  Hyungsuk Yoon ,  Ken Lai ,  Chi Young ,  Chao-Ming Huang ,  Ming Xi ,  Michael Yang ,  Hua Chung

发明人： Hongbin Fang ,  Hyungsuk Yoon ,  Ken Lai ,  Chi Young ,  Chao-Ming Huang ,  Ming Xi ,  Michael Yang ,  Hua Chung

IPC分类号： C23C16/00

CPC分类号： C23C16/06 ,  C23C16/02 ,  C23C16/0218 ,  C23C16/0281 ,  C23C16/045 ,  C23C16/08 ,  C23C16/16 ,  C23C16/45525

摘要： A method for forming a tungsten layer on a substrate surface is provided. In one aspect, the method includes positioning the substrate surface in a processing chamber and exposing the substrate surface to a soak. A nucleation layer is then deposited on the substrate surface in the same processing chamber by alternately pulsing a tungsten-containing compound and a reducing gas selected from a group consisting of silane, disilane, dichlorosilane and derivatives thereof. A tungsten bulk layer may then be deposited on the nucleation layer using cyclical deposition, chemical vapor deposition, or physical vapor deposition techniques.

摘要翻译： 提供了在基板表面上形成钨层的方法。 在一个方面，该方法包括将衬底表面定位在处理室中并将衬底表面暴露于浸泡。 然后通过交替地脉冲选择由硅烷，乙硅烷，二氯硅烷及其衍生物组成的组中的含钨化合物和还原气体，在相同的处理室中的基底表面上沉积成核层。 然后可以使用循环沉积，化学气相沉积或物理气相沉积技术在成核层上沉积钨体层。

公开(公告)号：US06998014B2

公开(公告)日：2006-02-14

申请号：US10197940

申请日：2002-07-16

申请人： Chen-An Chen ,  Avgerinos Gelatos ,  Michael X. Yang ,  Ming Xi ,  Mark M. Hytros

发明人： Chen-An Chen ,  Avgerinos Gelatos ,  Michael X. Yang ,  Ming Xi ,  Mark M. Hytros

IPC分类号： C23F1/00 ,  H01L21/306

CPC分类号： C23C16/06 ,  C23C16/34 ,  C23C16/42 ,  C23C16/452 ,  C23C16/4554 ,  C23C16/45544 ,  C23C16/45565 ,  C23C16/515 ,  H01J37/32082 ,  H01J37/3244 ,  H01L21/28556 ,  H01L21/28562 ,  H01L21/28568 ,  H01L21/3122 ,  H01L21/3127 ,  H01L21/76843

摘要： Embodiments of the present invention relate to an apparatus and method of plasma assisted deposition by generation of a plasma adjacent a processing region. One embodiment of the apparatus comprises a substrate processing chamber including a top shower plate, a power source coupled to the top shower plate, a bottom shower plate, and an insulator disposed between the top shower plate and the bottom shower plate. In one aspect, the power source is adapted to selectively provide power to the top shower plate to generate a plasma from the gases between the top shower plate and the bottom shower plate. In another embodiment, a power source is coupled to the top shower plate and the bottom shower plate to generate a plasma between the bottom shower plate and the substrate support. One embodiment of the method comprises performing in a single chamber one or more of the processes including, but not limited to, cyclical layer deposition, combined cyclical layer deposition and plasma-enhanced chemical vapor deposition; plasma-enhanced chemical vapor deposition; and/or chemical vapor deposition.

公开(公告)号：US20050008779A1

公开(公告)日：2005-01-13

申请号：US10913888

申请日：2004-08-06

申请人： Michael Yang ,  Hyungsuk Yoon ,  Hui Zhang ,  Hongbin Fang ,  Ming Xi

发明人： Michael Yang ,  Hyungsuk Yoon ,  Hui Zhang ,  Hongbin Fang ,  Ming Xi

IPC分类号： C23C16/44 ,  C23C16/455 ,  C23C16/00

CPC分类号： C23C16/45544 ,  C23C16/45531 ,  C23C16/45561

摘要： Embodiments of the present invention relate to an apparatus and method of cyclical deposition utilizing three or more precursors in which delivery of at least two of the precursors to a substrate structure at least partially overlap. One embodiment of depositing a ternary material layer over a substrate structure comprises providing at least one cycle of gases to deposit a ternary material layer. One cycle comprises introducing a pulse of a first precursor, introducing a pulse of a second precursor, and introducing a pulse of a third precursor in which the pulse of the second precursor and the pulse of the third precursor at least partially overlap. In one aspect, the ternary material layer includes, but is not limited to, tungsten boron silicon (WBxSiy), titanium silicon nitride (TiSixNy), tantalum silicon nitride (TaSixNy), silicon oxynitride (SiOxNy), and hafnium silicon oxide (HfSixOy). In one aspect, the composition of the ternary material layer may be tuned by changing the flow ratio of the second precursor to the third precursor between cycles.

摘要翻译： 本发明的实施方案涉及利用三种或更多种前体的循环沉积的装置和方法，其中至少两种前体至少部分重叠的衬底结构。 在衬底结构上沉积三元材料层的一个实施例包括提供至少一个循环的气体以沉积三元材料层。 一个周期包括引入第一前体的脉冲，引入第二前体的脉冲，以及引入第三前体的脉冲，其中第二前体的脉冲和第三前体的脉冲至少部分重叠。 在一个方面，三元材料层包括但不限于钨硼硅（WBxSiy），氮化硅钛（TiSixNy），氮化钽（TaSixNy），氧氮化硅（SiOxNy）和氧化铪铪（HfSixOy） 。 在一个方面，三元材料层的组成可以通过在循环之间改变第二前体与第三前体的流动比来调节。

公开(公告)号：US06809026B2

公开(公告)日：2004-10-26

申请号：US10322345

申请日：2002-12-18

申请人： Hyungsuk Alexander Yoon ,  Michael X. Yang ,  Hui Zhang ,  Soonil Hong ,  Ming Xi

发明人： Hyungsuk Alexander Yoon ,  Michael X. Yang ,  Hui Zhang ,  Soonil Hong ,  Ming Xi

IPC分类号： H01L214763

CPC分类号： C23C16/45525 ,  H01L21/28562 ,  H01L21/76843 ,  H01L21/76849

摘要： A method to selectively deposit a barrier layer on a metal film formed on a substrate is disclosed. The barrier layer is selectively deposited on the metal film using a cyclical deposition process including a predetermined number of deposition cycles followed by a purge step. Each deposition cycle comprises alternately adsorbing a refractory metal-containing precursor and a reducing gas on the metal film formed on the substrate in a process chamber.

摘要翻译： 公开了一种在形成在基板上的金属膜上选择性地沉积阻挡层的方法。 使用包括预定数量的沉积循环，然后进行吹扫步骤的循环沉积工艺，将选择性地沉积在金属膜上。 每个沉积循环包括在处理室中在形成在基底上的金属膜上交替地吸附含难熔金属的前体和还原气体。