Light emitting apparatus and method for manufacturing the same
    84.
    发明授权
    Light emitting apparatus and method for manufacturing the same 有权
    发光装置及其制造方法

    公开(公告)号:US08174029B2

    公开(公告)日:2012-05-08

    申请号:US13082104

    申请日:2011-04-07

    摘要: The purpose of the invention is to improve reliability of a light emitting apparatus comprising TFTs and organic light emitting elements. The light emitting apparatus according to the invention having thin film transistors and light emitting elements, comprises; a second inorganic insulation layer on a gate electrode, a first organic insulation layer on the second inorganic insulation layer, a third inorganic insulation layer on the first organic insulation layer, an anode layer formed on the third inorganic insulation layer, a second organic insulation layer overlapping with the end of the anode layer and having an inclination angle of 35 to 45 degrees, a fourth inorganic insulation layer formed on the upper surface and side surface of the second organic insulation layer and having an opening over the anode layer, an organic compound layer formed in contact with the anode layer and the fourth inorganic insulation layer and containing light emitting material, and a cathode layer formed in contact with the organic compound layer containing the light emitting material, wherein the third inorganic insulation layer and the fourth inorganic insulation layer are formed with silicon nitride or aluminum nitride.

    摘要翻译: 本发明的目的是提高包括TFT和有机发光元件的发光装置的可靠性。 根据本发明的具有薄膜晶体管和发光元件的发光装置包括: 栅电极上的第二无机绝缘层,第二无机绝缘层上的第一有机绝缘层,第一有机绝缘层上的第三无机绝缘层,形成在第三无机绝缘层上的阳极层,第二有机绝缘层 与阳极层的端部重叠并且具有35度至45度的倾斜角度;形成在第二有机绝缘层的上表面和侧表面上并且在阳极层上具有开口的第四无机绝缘层,有机化合物 形成为与阳极层和第四无机绝缘层接触且含有发光材料的层,以及与含有发光材料的有机化合物层接触形成的阴极层,其中第三无机绝缘层和第四无机绝缘层 由氮化硅或氮化铝形成。

    Semiconductor device and manufacturing method thereof
    86.
    发明授权
    Semiconductor device and manufacturing method thereof 有权
    半导体装置及其制造方法

    公开(公告)号:US08012854B2

    公开(公告)日:2011-09-06

    申请号:US13045560

    申请日:2011-03-11

    IPC分类号: H01L21/30

    摘要: It is an object of the present invention to provide a peeling method that causes no damage to a layer to be peeled and to allow not only a layer to be peeled with a small surface area but also a layer to be peeled with a large surface area to be peeled entirely. Further, it is also an object of the present invention to bond a layer to be peeled to various base materials to provide a lighter semiconductor device and a manufacturing method thereof. Particularly, it is an object to bond various elements typified by a TFT, (a thin film diode, a photoelectric conversion element comprising a PIN junction of silicon, or a silicon resistance element) to a flexible film to provide a lighter semiconductor device and a manufacturing method thereof.

    摘要翻译: 本发明的目的是提供一种不会对被剥离层造成损伤的剥离方法,并且不仅使表面积小的层被剥离,而且还允许具有大表面积的被剥离层 要完全去皮。 此外,本发明的另一个目的是将要剥离的层粘合到各种基材上以提供更轻的半导体器件及其制造方法。 特别地,目的是将由TFT表示的各种元素(薄膜二极管,包含硅的PIN结的光电转换元件或硅电阻元件)粘合到柔性膜上以提供更轻的半导体器件和 其制造方法。

    Wiring material, semiconductor device provided with a wiring using the wiring material and method of manufacturing thereof
    87.
    发明授权
    Wiring material, semiconductor device provided with a wiring using the wiring material and method of manufacturing thereof 有权
    配线材料,使用布线材料配线的半导体装置及其制造方法

    公开(公告)号:US07816191B2

    公开(公告)日:2010-10-19

    申请号:US11786880

    申请日:2007-04-13

    IPC分类号: H01L21/00

    摘要: By using a high purity target as a target, using a single gas, argon (Ar), as a sputtering gas, setting the substrate temperature at 300° C. or less, setting the sputtering power from 1 kW to 9 kW, and setting the sputtering gas pressure from 1.0 Pa to 3.0 Pa, the film stress of a film is made from −1 ×1010cm2 to 1×1010 dyn/cm2. By thus using a conducting film in which the amount of sodium contained within the film is equal to or less than 0.3 ppm, preferably equal to or less than 0.1 ppm, and having a low electrical resistivity (equal to or less than 40 μΩ•cm), as a gate wiring material and a material for other wirings of a TFT, the operating performance and the reliability of a semiconductor device provided with the TFT can be increased.

    摘要翻译: 通过使用高纯度靶作为目标,使用单一气体氩(Ar)作为溅射气体,将衬底温度设定在300℃以下,将溅射功率设定为1kW至9kW,并设定 溅射气体压力为1.0Pa〜3.0Pa,膜的膜应力为-1×10 10 cm 2〜1×10 10 dyn / cm 2。 通过这样使用导电膜,其中膜中所含的钠的量等于或小于0.3ppm,优选等于或小于0.1ppm,并具有低电阻率(等于或小于40μ&OHgr; cm),作为栅极布线材料和TFT的其它布线的材料,可以提高设置有TFT的半导体器件的操作性能和可靠性。

    Semiconductor device including a flexible support
    88.
    发明授权
    Semiconductor device including a flexible support 有权
    半导体器件包括柔性支撑件

    公开(公告)号:US07777409B2

    公开(公告)日:2010-08-17

    申请号:US12251533

    申请日:2008-10-15

    IPC分类号: G09G3/10

    摘要: The invention relates to a semiconductor device including a plurality of thin film transistors provided on a base member having a curved surface. The surface may be bent in either a convex shape or a concave shape. All channel length directions of the plurality of thin film transistors may also be aligned in the same direction. Further, the channel length direction may be different from the direction in which the base member is bent. A pixel portion and a driver circuit portion may also be provided on the base member. The invention also includes a method of manufacturing a semiconductor device including forming a layer to be peeled including an element of a substrate, bonding a support member to the layer to be peeled, and bonding a transfer body to the layer to be peeled.

    摘要翻译: 本发明涉及一种半导体器件,包括设置在具有弯曲表面的基底部件上的多个薄膜晶体管。 表面可以弯曲成凸形或凹形。 多个薄膜晶体管的所有沟道长度方向也可以在相同的方向上对准。 此外,通道长度方向可以不同于基件弯曲的方向。 像素部分和驱动器电路部分也可以设置在基底部件上。 本发明还包括一种制造半导体器件的方法,该半导体器件包括形成包含基片的元件的被剥离层,将支撑构件粘合到待剥离的层上,并将转移体接合到待剥离的层上。