Resistor array board
    3.
    发明授权

    公开(公告)号:US06392530B1

    公开(公告)日:2002-05-21

    申请号:US09866711

    申请日:2001-05-30

    申请人: Etsuji Suzuki

    发明人: Etsuji Suzuki

    IPC分类号: H01L101

    摘要: A plurality of protective resistors can be easily inserted between circuit forming elements, and opposite ends of each protective resistor can be properly press-contacted to each circuit forming element. The protective resistor can be easily replaced when broken. A resistor array board comprises a porous plate having a plurality of through-holes arranged in array and opening at opposite surfaces thereof; and a plurality of protective resistors removably loosely inserted into the through-holes, respectively. Each of the protective resistors are resiliently retained by an electrically conductive spring element, and opposite ends of each of the protective resistors are press-contacted with the circuit forming elements which are arranged in opposing relation on surfaces of the porous plates.

    Method and apparatus for detecting defects in a pattern
    6.
    发明授权
    Method and apparatus for detecting defects in a pattern 失效
    用于检测图案中的缺陷的方法和装置

    公开(公告)号:US4601577A

    公开(公告)日:1986-07-22

    申请号:US534119

    申请日:1983-09-20

    IPC分类号: G01N21/956 G01N21/47

    CPC分类号: G01N21/956

    摘要: A method and apparatus for detecting defects in a pattern are disclosed. The defect detecting method is comprised of a step of dark-field illuminating a patterned object with a directionality and a step for detecting only the defect component by erasing the pattern component in a pattern image formed by the dark-field illumination. The apparatus comprises an illuminating device for dark-field illuminating a patterned object with parallel rays, an image pick-up device for picking up a pattern image, which is disposed just above the pattern, and a data processing circuit for processing the picked up image signal to detect a defect.

    摘要翻译: 公开了一种用于检测图案中的缺陷的方法和装置。 缺陷检测方法包括:通过消除由暗场照明形成的图案图像中的图案分量来仅仅检测缺陷分量的方向性和步骤的暗场照射图案化物体的步骤。 该装置包括用于以平行光线对图案化物体进行暗场照明的照明装置,用于拾取图案的正上方的图案图像的图像拾取装置,以及用于处理拾取图像的数据处理电路 信号来检测缺陷。

    Method of positioning a semiconductor member by examining it and a die
bonding apparatus using the same
    8.
    发明授权
    Method of positioning a semiconductor member by examining it and a die bonding apparatus using the same 失效
    检查半导体构件的方法以及使用该半导体构件的芯片接合装置

    公开(公告)号:US4200393A

    公开(公告)日:1980-04-29

    申请号:US804441

    申请日:1977-06-07

    IPC分类号: H01L21/68 G01N21/32 G01B11/26

    CPC分类号: H01L21/681

    摘要: According to the present method of positioning a semiconductor member by examining it, an optical image of the semiconductor member is focussed on a photoelectric conversion face formed by having a plurality of photoelectric conversion elements arranged thereon in the form of a matrix. By means of the photoelectric conversion elements spotlighted by said optical image, the distributions of the spotlighted elements and the remaining non-spotlighted elements are examined through scanning operation. By using the examination results, a table having said semiconductor members loaded thereon is so moved as to permit one of them to fall under the photoelectric conversion face, thereby to inspect for positioning examination of the semiconductor member the presence or absence of a defect-indicating mark affixed thereto and examine the qualification or non-qualification of the member in terms of outer dimension, in terms of the position taken after moved, and in terms of whether or not the semiconductor member can be subjected to correction of the position, or is damaged, or is cracked, or is stained or is partially oversized. Thus, according to the present method, only each qualified one of the semiconductor members can be positioned precisely in a prescribed position, and a die bonding apparatus of the invention is based on the using of the above method for purpose of positioning the semiconductor member by examining it.

    摘要翻译: 根据本发明的通过检查半导体构件的方法,将半导体构件的光学图像聚焦在通过以矩阵形式布置在其上的多个光电转换元件形成的光电转换面上。 通过由所述光学图像聚光的光电转换元件,通过扫描操作来检查聚光元件和剩余的非聚光元件的分布。 通过使用检查结果,将具有装载在其上的半导体部件的工作台移动以允许其中的一个落在光电转换面下方,从而检查半导体部件的定位检查是否存在缺陷指示 标记,并根据外观尺寸,移动后的位置,以及半导体构件是否可以对位置进行修正来检查构件的资质或非资格,或者是 损坏或破裂,或被染色或部分超大。 因此,根据本方法,只有每个合格的一个半导体部件能够精确地定位在规定位置,本发明的芯片接合装置基于上述方法的使用,以便通过以下方式定位半导体部件 检查它

    Contact structure of lead
    9.
    发明授权
    Contact structure of lead 失效
    铅的接触结构

    公开(公告)号:US06398561B1

    公开(公告)日:2002-06-04

    申请号:US09902262

    申请日:2001-07-11

    IPC分类号: H01R1200

    摘要: A contact structure of a lead in which a contact structure having a lead and a bump made of suitable metals, respectively, can be formed easily and the bump and the lead can be soundly connected together in terms of electricity and strength. The contact structure of the lead comprises a lead 12 formed by etching a conductive foil 11, and a bump 5 formed by electric casting by means of plating. The bump 5 and the lead 12 are formed of different metals, respectively, and the bump 5 is connected to a surface of the lead 12 through a conductive connecting material 10. The lead 12 is intimately contacted at a surface, on which the bump 5 is disposed, with a first main surface 15 of a holeless insulative sheet 8. A basal portion of the bump 5 is forcibly pierced into and extended all the way through the thickness of a material of the holeless insulative sheet 8 and a side surface of the basal portion of the bump 5 is fusion-adhered to an inner wall surface of the through-hole 17. A distal portion of the bump 5 is projected from a second main surface 16 of the insulative sheet 8.

    摘要翻译: 引线的接触结构可以容易地形成具有引线和由合适金属制成的凸块的接触结构,并且凸起和引线可以在电力和强度方面牢固地连接在一起。 引线的接触结构包括通过蚀刻导电箔11形成的引线12和通过电镀的电铸形成的凸块5。 凸块5和引线12分别由不同的金属形成,并且凸块5通过导电连接材料10连接到引线12的表面。引线12在表面处紧密接触,凸块5 配置有无孔绝缘片8的第一主表面15.凸块5的基部被强制地穿透并延伸穿过无孔绝缘片8的材料的厚度,并且 凸块5的基部熔合粘附到通孔17的内壁表面。凸块5的远端部分从绝缘片8的第二主表面16突出。