公开(公告)号：US06333563B1

公开(公告)日：2001-12-25

申请号：US09587944

申请日：2000-06-06

申请人： Raymond A. Jackson ,  Anson J. Call ,  Mark G. Courtney ,  Stephen A. DeLaurentis ,  Mukta S. Farooq ,  Shaji Farooq ,  Lewis S. Goldmann ,  Gregory B. Martin ,  Sudipta K. Ray

发明人： Raymond A. Jackson ,  Anson J. Call ,  Mark G. Courtney ,  Stephen A. DeLaurentis ,  Mukta S. Farooq ,  Shaji Farooq ,  Lewis S. Goldmann ,  Gregory B. Martin ,  Sudipta K. Ray

IPC分类号： H01L2940

CPC分类号： H05K1/141 ,  H01L23/49833 ,  H01L2224/16 ,  H01L2924/01322 ,  H01L2924/09701 ,  H01L2924/12044 ,  H01L2924/15311 ,  H05K3/284 ,  H05K3/3436 ,  H05K3/368 ,  H05K2201/049 ,  H05K2201/10734 ,  H05K2201/10977

摘要： The present invention relates generally to an electrical interconnection package and a method thereof. More particularly, the invention encompasses an invention that increases the fatigue life of a Ball Grid Array (BGA) electrical interconnection. This invention structurally couples at least one module to an organic interposer using a high modulus underfill material. The organic interposer is then joined to a organic board using standard joining processes. The inventive module can then be removed from the organic board at any time by moving the organic interposer using standard rework techniques.

摘要翻译： 本发明一般涉及电互连封装及其方法。 更具体地，本发明包括增加球栅阵列（BGA）电互连的疲劳寿命的发明。 本发明使用高模量底部填充材料将至少一个模块结构地耦合到有机插入件。 然后使用标准连接工艺将有机插入物连接到有机基板。 随后可以通过使用标准返工技术移动有机插入件，随时从有机板上移除本发明的模块。

公开(公告)号：US06283359B1

公开(公告)日：2001-09-04

申请号：US09644486

申请日：2000-08-23

申请人： Peter J. Brofman ,  Mark G. Courtney ,  Shaji Farooq ,  Mario J. Interrante ,  Raymond A. Jackson ,  Gregory B. Martin ,  Sudipta K. Ray ,  William E. Sablinski ,  Kathleen A. Stalter

发明人： Peter J. Brofman ,  Mark G. Courtney ,  Shaji Farooq ,  Mario J. Interrante ,  Raymond A. Jackson ,  Gregory B. Martin ,  Sudipta K. Ray ,  William E. Sablinski ,  Kathleen A. Stalter

IPC分类号： B23K3102

CPC分类号： H01L24/12 ,  B23K35/0222 ,  B23K35/0244 ,  H01L23/49811 ,  H01L24/11 ,  H01L24/16 ,  H01L2224/1184 ,  H01L2224/13099 ,  H01L2924/00013 ,  H01L2924/01004 ,  H01L2924/01006 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01046 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/01322 ,  H01L2924/014 ,  H01L2924/09701 ,  H01L2924/14 ,  H01L2924/15787 ,  H05K3/3436 ,  H05K2201/10992 ,  H05K2203/041 ,  H05K2203/0415 ,  H05K2203/0435 ,  Y02P70/613 ,  Y10T428/12687 ,  Y10T428/2991 ,  H01L2224/29099 ,  H01L2924/00

摘要： This invention relates to a solder structure which provides enhanced fatigue life properties when used to bond substrates particularly at the second level such as BGA and CGA interconnections. The solder structure is preferably a sphere or column and has a metal layer wettable by solder and the structure is used to make solder connections in electronic components such as joining an electronic module such as a chip connected to a MLC which module is connected to a circuit board. The solder structure preferably has an overcoat of solder on the metal layer to provide a passivation coating to the metal layer to keep it clean from oxidation and corrosion and also provide a wettable surface for attachment of the solder structure to solder on the pads of the substrate being bonded.

摘要翻译： 本发明涉及一种焊料结构，当用于特别是在第二层（例如BGA和CGA互连）的基材上时，其提供增强的疲劳寿命特性。 焊料结构优选是球形或柱状，并且具有可被焊料润湿的金属层，并且该结构用于在电子部件中形成焊接连接​​，例如连接诸如连接到MLC的芯片的电子模块，该模块连接到电路 板。 焊料结构优选地在金属层上具有焊料的外涂层，以向金属层提供钝化涂层以保持其免于氧化和腐蚀，并且还提供用于将焊料结构附着到衬底的焊盘上的焊料的可润湿表面 被绑定。

公开(公告)号：US6158644A

公开(公告)日：2000-12-12

申请号：US70163

申请日：1998-04-30

申请人： Peter J. Brofman ,  Mark G. Courtney ,  Shaji Farooq ,  Mario J. Interrante ,  Raymond A. Jackson ,  Gregory B. Martin ,  Sudipta K. Ray ,  William E. Sablinski ,  Kathleen A. Stalter

发明人： Peter J. Brofman ,  Mark G. Courtney ,  Shaji Farooq ,  Mario J. Interrante ,  Raymond A. Jackson ,  Gregory B. Martin ,  Sudipta K. Ray ,  William E. Sablinski ,  Kathleen A. Stalter

IPC分类号： H01L23/12 ,  B23K35/02 ,  B23K35/14 ,  H01L21/60 ,  H01L23/498 ,  H05K3/34 ,  B23K35/24 ,  B23K35/26

CPC分类号： H01L24/12 ,  B23K35/0222 ,  H01L23/49811 ,  H01L24/11 ,  H01L24/16 ,  H05K3/3436 ,  B23K35/0244 ,  H01L2224/1184 ,  H01L2224/13099 ,  H01L2924/00013 ,  H01L2924/01004 ,  H01L2924/01006 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01046 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/01322 ,  H01L2924/014 ,  H01L2924/09701 ,  H01L2924/14 ,  H01L2924/15787 ,  H05K2201/10992 ,  H05K2203/041 ,  H05K2203/0415 ,  H05K2203/0435 ,  Y02P70/613 ,  Y10T428/12687 ,  Y10T428/2991

摘要： This invention relates to a solder structure which provides enhanced fatigue life properties when used to bond substrates particularly at the second level such as BGA and CGA interconnections. The solder structure is preferably a sphere or column and has a metal layer wettable by solder and the structure is used to make solder connections in electronic components such as joining an electronic module such as a chip connected to a MLC which module is connected to a circuit board. The solder structure preferably has an overcoat of solder on the metal layer to provide a passivation coating to the metal layer to keep it clean from oxidation and corrosion and also provide a wettable surface for attachment of the solder structure to solder on the pads of the substrate being bonded.

摘要翻译： 本发明涉及一种焊料结构，当用于特别是在第二层（例如BGA和CGA互连）的基材上时，其提供增强的疲劳寿命特性。 焊料结构优选是球形或柱状，并且具有可被焊料润湿的金属层，并且该结构用于在电子部件中形成焊接连接​​，例如连接诸如连接到MLC的芯片的电子模块，该模块连接到电路 板。 焊料结构优选地在金属层上具有焊料的外涂层，以向金属层提供钝化涂层以保持其免于氧化和腐蚀，并且还提供用于将焊料结构附着到衬底的焊盘上的焊料的可润湿表面 被绑定。

公开(公告)号：US06335210B1

公开(公告)日：2002-01-01

申请号：US09466607

申请日：1999-12-17

申请人： Mukta S. Farooq ,  Raymond A. Jackson ,  Sarah H. Knickerbocker ,  Sudipta K. Ray

发明人： Mukta S. Farooq ,  Raymond A. Jackson ,  Sarah H. Knickerbocker ,  Sudipta K. Ray

IPC分类号： H01L2166

CPC分类号： G01R31/2863 ,  H01L2224/16225 ,  H01L2924/15311

摘要： The present invention relates generally to a new structure and method for chip burn-in and/or testing. More particularly, the invention encompasses a baseplate that is secured to a delicate chip and a method for such an invention is also disclosed. The inventive baseplate provides an added strength to a complex chip while it is being tested and/or burned-in, and then during normal use the baseplate of this invention is an integrated component of the chip.

摘要翻译： 本发明一般涉及用于芯片老化和/或测试的新结构和方法。 更具体地，本发明包括固定到精细芯片上的底板，并且还公开了用于这种发明的方法。 本发明的基板在被测试和/或燃烧时提供了对复合芯片的附加强度，然后在正常使用期间，本发明的底板是芯片的集成部件。

公开(公告)号：US06360938B1

公开(公告)日：2002-03-26

申请号：US09794597

申请日：2001-02-27

申请人： Stephen A. DeLaurentis ,  Mario J. Interrante ,  Raymond A. Jackson ,  John U. Knickerbocker ,  Sudipta K. Ray ,  Kathleen A. Stalter

发明人： Stephen A. DeLaurentis ,  Mario J. Interrante ,  Raymond A. Jackson ,  John U. Knickerbocker ,  Sudipta K. Ray ,  Kathleen A. Stalter

IPC分类号： B23K1018

摘要： A process and apparatus for removing flip chips with C4 joints mounted on a multi-chip module by applying a tensile force to one or more removal member bonded to the back of one or more flip chips during heating of the module to a temperature sufficient to cause the C4 joints to become molten. The tensile force can either be a compressed spring, or a bi-metallic member which is flat at room temperature and becomes curved when heated to such temperature, or a memory alloy whose original shape is curved and which is bent flat at room temperature but returns to its original curved shape when heated to such temperature. An adhesive is used to bond the removal member to the chip to be removed and is a low temperature, fast curing adhesive with high temperature tolerance after curing.

公开(公告)号：US06216937B1

公开(公告)日：2001-04-17

申请号：US09470455

申请日：1999-12-22

申请人： Stephen A. DeLaurentis ,  Mario J. Interrante ,  Raymond A. Jackson ,  John U. Knickerbocker ,  Sudipta K. Ray ,  Kathleen A. Stalter

发明人： Stephen A. DeLaurentis ,  Mario J. Interrante ,  Raymond A. Jackson ,  John U. Knickerbocker ,  Sudipta K. Ray ,  Kathleen A. Stalter

IPC分类号： B23K100

CPC分类号： H01L21/687 ,  B23K1/018 ,  H01L24/98

摘要： A process and apparatus for removing flip chips with C4 joints mounted on a multi-chip module by applying a tensile force to one or more removal member bonded to the back of one or more flip chips during heating of the module to a temperature sufficient to cause the C4 joints to become molten. The tensile force can either be a compressed spring, or a bimetallic member which is flat at room temperature and becomes curved when heated to such temperature, or a memory alloy whose original shape is curved and which is bent flat at room temperature but returns to its original curved shape when heated to such temperature. An adhesive is used to bond the removal member to the chip to be removed and is a low temperature, fast curing adhesive with high temperature tolerance after curing.

摘要翻译： 一种用于通过在将模块加热到足以导致的温度的温度下向一个或多个倒装芯片的背面施加张力而将一个或多个去除构件施加拉力而移除通过安装在多芯片模块上的C4接头的倒装芯片的方法和装置 C4接头变得熔化。 张力可以是压缩弹簧，也可以是在室温下平坦并在加热到这样的温度时变得弯曲的双金属构件，或者原始形状是弯曲的并且在室温下弯曲平坦但回到其中的记忆合金 原来弯曲的形状加热到这样的温度。 使用粘合剂将去除构件粘合到要去除的芯片上，并且是固化后具有耐高温性的低温快速固化粘合剂。

公开(公告)号：US06235996B1

公开(公告)日：2001-05-22

申请号：US09014804

申请日：1998-01-28

申请人： Shaji Farooq ,  Mario J. Interrante ,  Sudipta K. Ray ,  William E. Sablinski

发明人： Shaji Farooq ,  Mario J. Interrante ,  Sudipta K. Ray ,  William E. Sablinski

IPC分类号： H01L2348

CPC分类号： H01L23/49811 ,  H01L21/4853 ,  H01L2224/16225 ,  H01L2224/73253 ,  H01L2924/01046 ,  H01L2924/01078 ,  H01L2924/01322 ,  H01L2924/01327 ,  H01L2924/15311 ,  H01L2924/15312 ,  H01L2924/16152 ,  H01L2924/19105 ,  H05K3/3436 ,  H05K3/3463 ,  H05K3/3484 ,  H05K2201/0215 ,  H05K2201/0272 ,  H05K2201/094 ,  H05K2201/10992 ,  H05K2203/041 ,  H05K2203/0415 ,  Y02P70/613 ,  Y10T29/49126 ,  H01L2924/00

摘要： An interconnection structure and methods for making and detaching the same are presented for column and ball grid array (CGA and BGA) structures by using a transient solder paste on the electronic module side of the interconnection that includes fine metal powder additives to increase the melting point of the solder bond. The metal powder additives change the composition of the solder bond such that the transient melting solder composition does not completely melt at temperatures below +230° C. and detach from the electronic module during subsequent reflows. A Pb—Sn eutectic with a lower melting point is used on the opposite end of the interconnection structure. In the first method a transient melting solder paste is applied to the I/O pad of an electronic module by a screening mask. Interconnect structures are then bonded to the I/O pad. In a second method, solder preforms in a composition of the transient melting solder paste are wetted onto electronic module I/O pads and interconnect columns or balls are then bonded. Detachment of an electronic module from a circuit card can then be performed by heating the circuit card assembly to a temperature above the eutectic solder melting point, but below the transient solder joint melting point.

摘要翻译： 通过使用包括细金属粉末添加剂的电子模块侧的瞬态焊膏来提供柱和球栅阵列（CGA和BGA）结构的互连结构及其分离方法，以增加熔点 的焊点。 金属粉末添加剂改变焊料接合的组成，使得瞬态熔融焊料组合物在低于+ 230℃的温度下不会完全熔化，并且在随后的回流期间与电子模块分离。 在互连结构的另一端使用具有较低熔点的Pb-Sn共晶体。 在第一种方法中，通过屏蔽掩模将瞬态熔融焊膏施加到电子模块的I / O焊盘。 然后将互连结构结合到I / O焊盘。 在第二种方法中，将瞬态熔融焊膏的组合物中的焊料预成型件润湿到电子模块I / O焊盘上，然后将互连柱或球接合。 然后可以通过将电路卡组件加热到高于共熔焊料熔点但低于瞬态焊点熔点的温度来执行从电路卡分离电子模块。

公开(公告)号：US06984792B2

公开(公告)日：2006-01-10

申请号：US10427459

申请日：2003-05-01

申请人： Peter J. Brofman ,  Shaji Farooq ,  John U. Knickerbocker ,  Scott I. Langenthal ,  Sudipta K. Ray ,  Kathleen A. Stalter

发明人： Peter J. Brofman ,  Shaji Farooq ,  John U. Knickerbocker ,  Scott I. Langenthal ,  Sudipta K. Ray ,  Kathleen A. Stalter

IPC分类号： H01R12/06

CPC分类号： H05K3/3436 ,  H01L23/49827 ,  H01L2224/05568 ,  H01L2224/05573 ,  H01L2224/16 ,  H01L2924/00014 ,  H01L2924/09701 ,  H05K2201/10378 ,  H05K2201/10424 ,  H05K2201/10674 ,  H05K2203/0415 ,  Y02P70/613 ,  Y10T29/49144 ,  Y10T29/49149 ,  H01L2224/05599

摘要： A pre-thermal reflown dielectric interposer having a plurality of vias traversing through the interposer which correspond to the I/O pads on a chip and substrate. Cone shaped solder elements reside within the vias, whereby these solder elements are cone shaped prior to thermal reflow to permit a reduced force for allowing some non-planarity for joining the chip to the substrate. The interposer may comprise a polyester film, glass, alumina, polyimide, a heat curable polymer or an inorganic powder filler in an organic material. The interposer may also have an adhesive or adhesive layers disposed on the linear surfaces thereof. The present pre-thermal reflown interposer prohibits contact between the solder joints by isolating each of the joints and corresponding bonding pads, as well as preventing over compression of the solder joints by acting as a stand off.

摘要翻译： 具有穿过插入件的多个通孔对应于芯片和基板上的I / O焊盘的预热退火介电插入器。 锥形焊料元件驻留在通孔内，由此这些焊料元件在热回流之前是锥形的，以允许减小的力以允许用于将芯片连接到衬底的一些非平面性。 中间层可以在有机材料中包含聚酯膜，玻璃，氧化铝，聚酰亚胺，热固化聚合物或无机粉末填料。 插入器也可以具有设置在其线性表面上的粘合剂或粘合剂层。 本发明的预热反射中介层通过隔离每个接头和相应的接合焊盘来防止焊点之间的接触，并且通过作为脱开来防止焊点过度压缩。

公开(公告)号：US06574859B2

公开(公告)日：2003-06-10

申请号：US09785787

申请日：2001-02-16

申请人： Shaji Farooq ,  Mario J. Interrante ,  Sudipta K. Ray ,  William E. Sablinski

发明人： Shaji Farooq ,  Mario J. Interrante ,  Sudipta K. Ray ,  William E. Sablinski

IPC分类号： H05K336

CPC分类号： H01L23/49811 ,  H01L21/4853 ,  H01L2224/16225 ,  H01L2224/73253 ,  H01L2924/01046 ,  H01L2924/01078 ,  H01L2924/01322 ,  H01L2924/01327 ,  H01L2924/15311 ,  H01L2924/15312 ,  H01L2924/16152 ,  H01L2924/19105 ,  H05K3/3436 ,  H05K3/3463 ,  H05K3/3484 ,  H05K2201/0215 ,  H05K2201/0272 ,  H05K2201/094 ,  H05K2201/10992 ,  H05K2203/041 ,  H05K2203/0415 ,  Y02P70/613 ,  Y10T29/49126 ,  H01L2924/00

摘要： An interconnection structure and methods for making and detaching the same are presented for column and ball grid array (CGA and BGA) structures by using a transient solder paste on the electronic module side of the interconnection that includes fine metal powder additives to increase the melting point of the solder bond. The metal powder additives change the composition of the solder bond such that the transient melting solder composition does not completely melt at temperatures below +230° C. and detach from the electronic module during subsequent ref lows. A Pb—Sn eutectic with a lower melting point is used on the opposite end of the interconnection structure. In the first method a transient melting solder paste is applied to the I/O pad of an electronic module by means of a screening mask. Interconnect structures are then bonded to the I/O pad. In a second method, solder preforms in a composition of the transient melting solder paste are wetted onto electronic module I/O pads and interconnect columns or balls are then bonded. Detachment of an electronic module from a circuit card can then be performed by heating the circuit card assembly to a temperature above the eutectic solder melting point, but below the transient solder joint melting point.

摘要翻译： 通过使用包括细金属粉末添加剂的电子模块侧的瞬态焊膏来提供柱和球栅阵列（CGA和BGA）结构的互连结构及其分离方法，以增加熔点 的焊点。 金属粉末添加剂改变焊料接合的组成，使得瞬态熔融焊料组合物在低于+ 230℃的温度下不会完全熔化，并且在后续参考低温期间与电子模块分离。 在互连结构的另一端使用具有较低熔点的Pb-Sn共晶体。在第一种方法中，通过掩模掩模将瞬态熔融焊膏施加到电子模块的I / O焊盘。 然后将互连结构结合到I / O焊盘。在第二种方法中，将瞬态熔融焊膏的组成中的焊料预成型件润湿到电子模块I / O焊盘上，然后连接互连柱或焊球。连接电子 然后可以通过将电路卡组件加热到高于共熔焊料熔点但低于瞬态焊点熔点的温度来执行电路卡的模块。

公开(公告)号：US5961032A

公开(公告)日：1999-10-05

申请号：US884977

申请日：1997-06-30

申请人： James H. Covell, II ,  Shaji Farooq ,  Peter A. Gruber ,  Sudipta K. Ray

发明人： James H. Covell, II ,  Shaji Farooq ,  Peter A. Gruber ,  Sudipta K. Ray

IPC分类号： B22C9/22 ,  B23K3/06 ,  B23K35/02 ,  H01L21/60 ,  H01L23/12 ,  H01L23/50 ,  H05K3/34 ,  B23K35/012 ,  B23K31/002 ,  B22C9/020

CPC分类号： H05K3/3468 ,  B22C9/22 ,  B23K3/0607 ,  B23K35/0222 ,  B23K2201/40 ,  H01L2224/16225 ,  H01L2224/32225 ,  H01L2224/73204 ,  H01L2924/15311 ,  H01L2924/16152 ,  H01L2924/19105 ,  H05K2201/0379 ,  H05K2201/10992 ,  H05K2203/0113 ,  H05K2203/0338 ,  H05K2203/128 ,  H05K3/3463

摘要： A method is described for forming solder mounds for attachment to electronic devices. The solder mounds are preferably in the form of columns and comprise a first solder portion and a second solder portion with the two solder portions having different melting points. The solder columns are preferably formed using an injection molding device. The method is directed to the use of a single column mold to form the multi-solder column. In one embodiment, deformable material is used to partially block a portion of the through opening of the mold during a first solder injection process. The deformable material is then removed and the remainder of the through openings of the mold filled with a second molten solder. The multi-solder column is then electrically connected to a substrate by reflowing.

摘要翻译： 描述了用于形成用于附接到电子设备的焊接凸块的方法。 焊料块优选为柱状，并且包括第一焊料部分和第二焊料部分，其中两个焊料部分具有不同的熔点。 焊料柱优选使用注射成型装置形成。 该方法涉及使用单柱模具来形成多焊料柱。 在一个实施例中，可变形材料用于在第一次焊接注入过程期间部分地阻挡模具的通孔的一部分。 然后去除可变形材料，并且模具的通孔的其余部分填充有第二熔融焊料。 然后通过回流将多焊料柱电连接到衬底。