Baseplate for chip burn-in and/of testing, and method thereof
    1.
    发明授权
    Baseplate for chip burn-in and/of testing, and method thereof 失效
    用于芯片烧录和/或测试的基板及其方法

    公开(公告)号:US06335210B1

    公开(公告)日:2002-01-01

    申请号:US09466607

    申请日:1999-12-17

    IPC分类号: H01L2166

    摘要: The present invention relates generally to a new structure and method for chip burn-in and/or testing. More particularly, the invention encompasses a baseplate that is secured to a delicate chip and a method for such an invention is also disclosed. The inventive baseplate provides an added strength to a complex chip while it is being tested and/or burned-in, and then during normal use the baseplate of this invention is an integrated component of the chip.

    摘要翻译: 本发明一般涉及用于芯片老化和/或测试的新结构和方法。 更具体地,本发明包括固定到精细芯片上的底板,并且还公开了用于这种发明的方法。 本发明的基板在被测试和/或燃烧时提供了对复合芯片的附加强度,然后在正常使用期间,本发明的底板是芯片的集成部件。