Substrate processing apparatus using neutralized beam and method thereof
    6.
    发明授权
    Substrate processing apparatus using neutralized beam and method thereof 有权
    使用中和束的基板处理装置及其方法

    公开(公告)号:US07385183B2

    公开(公告)日:2008-06-10

    申请号:US11335725

    申请日:2006-01-19

    IPC分类号: H05H3/02 H01J37/26 H01S1/00

    摘要: In a substrate processing apparatus using a neutralized beam and a method thereof, the substrate processing apparatus includes: an ion source for emitting an ion beam at an emitting angle; reflectors at which the ion beam emitted by the ion source is incident and subject to 2n collisions (where n is a positive integer) in first and second opposite directions to neutralize the ion beam as a neutralized beam and to restore a direction of propagation of the neutralized beam to the emitting angle of the ion beam; and a substrate at which the neutralized beam generated by the reflectors is incident on to perform a process. Accordingly, an incident angle of the resultant neutralized beam is perpendicular to a substrate, while the direction of propagation of the originating ion source and the surface of the substrate are maintained to be perpendicular to each other.

    摘要翻译: 在使用中和束的基板处理装置及其方法中,基板处理装置包括:用于以发射角发射离子束的离子源; 由离子源发射的离子束入射并且在第一和第二相反方向上经受2n次碰撞(其中n是正整数)的反射器,以将离子束中和作为中和的光束,并恢复所述离子束的传播方向 中和的束到离子束的发射角; 以及由反射器产生的被中和的光束入射的基板,以执行处理。 因此,所得中和束的入射角垂直于基板,而原始离子源和基板的表面的传播方向保持彼此垂直。

    Reflectors, substrate processing apparatuses and methods for the same
    8.
    发明申请
    Reflectors, substrate processing apparatuses and methods for the same 审中-公开
    反射器,基板处理装置及其方法

    公开(公告)号:US20060196425A1

    公开(公告)日:2006-09-07

    申请号:US11350795

    申请日:2006-02-10

    摘要: A substrate processing apparatus may include a processing chamber including a plasma generating unit arranged in an upper region thereof. A grid system, which may extract ions from plasma formed by the plasma generating unit and may accelerate the ions to have substantially uniform directivity. The grid system may be positioned below the plasma generating unit. A reflector may be arranged below the grid system and may include parallel reflecting plates for converting the ions accelerated from the grid system into neutral beams.

    摘要翻译: 基板处理装置可以包括处理室,其包括布置在其上部区域中的等离子体产生单元。 栅格系统,其可以从由等离子体发生单元形成的等离子体提取离子,并且可以加速离子以具有基本均匀的方向性。 栅格系统可以位于等离子体生成单元的下方。 反射器可以布置在栅格系统下方,并且可以包括用于将从栅格系统加速的离子转换成中性光束的平行反射板。

    Substrate processing apparatus using neutralized beam and method thereof
    9.
    发明申请
    Substrate processing apparatus using neutralized beam and method thereof 有权
    使用中和束的基板处理装置及其方法

    公开(公告)号:US20060163466A1

    公开(公告)日:2006-07-27

    申请号:US11335725

    申请日:2006-01-19

    IPC分类号: H05H3/02

    摘要: In a substrate processing apparatus using a neutralized beam and a method thereof, the substrate processing apparatus includes: an ion source for emitting an ion beam at an emitting angle; reflectors at which the ion beam emitted by the ion source is incident and subject to 2n collisions (where n is a positive integer) in first and second opposite directions to neutralize the ion beam as a neutralized beam and to restore a direction of propagation of the neutralized beam to the emitting angle of the ion beam; and a substrate at which the neutralized beam generated by the reflectors is incident on to perform a process. Accordingly, an incident angle of the resultant neutralized beam is perpendicular to a substrate, while the direction of propagation of the originating ion source and the surface of the substrate are maintained to be perpendicular to each other.

    摘要翻译: 在使用中和束的基板处理装置及其方法中,基板处理装置包括:用于以发射角发射离子束的离子源; 由离子源发射的离子束入射并在第一和第二相反方向经受2n次碰撞(其中n是正整数)的反射器,以将离子束中和作为中和束并且恢复其中的传播方向 中和的束到离子束的发射角; 以及由反射器产生的被中和的光束入射的基板,以执行处理。 因此,所得中和束的入射角垂直于基板,而原始离子源和基板的表面的传播方向保持彼此垂直。