公开(公告)号：US20250118647A1

公开(公告)日：2025-04-10

申请号：US18988225

申请日：2024-12-19

Applicant: Intel Corporation

Inventor： Srinivas V. PIETAMBARAM ,  Debendra MALLIK ,  Kristof DARMAWIKARTA ,  Ravindranath V. MAHAJAN ,  Rahul N. MANEPALLI

IPC: H01L23/498 ,  H01L23/00 ,  H01L23/538 ,  H01L25/065

Abstract: An electronic package includes an interposer having an interposer substrate, a cavity that passes into but not through the interposer substrate, a through interposer via (TIV) within the interposer substrate, and an interposer pad electrically coupled to the TIV. The electronic package includes a nested component in the cavity, wherein the nested component includes a component pad coupled to a through-component via. A core via is beneath the nested component, the core via extending from the nested component through the interposer substrate. A die is coupled to the interposer pad by a first interconnect and coupled to the component pad by a second interconnect.

公开(公告)号：US20240339381A1

公开(公告)日：2024-10-10

申请号：US18130582

申请日：2023-04-04

Applicant: Intel Corporation

Inventor： Hiroki TANAKA ,  Veronica STRONG ,  Henning BRAUNISCH ,  Haobo CHEN ,  Jeremy D. ECTON ,  Kristof DARMAWIKARTA ,  Brandon C. MARIN

IPC: H01L23/482 ,  H01L21/768 ,  H01L23/498

CPC classification number: H01L23/4821 ,  H01L21/76831 ,  H01L23/49827 ,  H01L23/49866 ,  H01L21/30604 ,  H05K2201/09218

Abstract: Embodiments disclosed herein include an interposer. In an embodiment, the interposer comprises a substrate, where the substrate comprises a glass layer. In an embodiment, a trace is on the substrate, where the trace has a bottom surface, sidewall surfaces, and a top surface. In an embodiment, the sidewall surfaces and the top surface are exposed to air. In an embodiment, a trench into the substrate is adjacent to at least one sidewall surface of the trace.

公开(公告)号：US20240332203A1

公开(公告)日：2024-10-03

申请号：US18740068

申请日：2024-06-11

Applicant: Intel Corporation

Inventor： Robert Alan MAY ,  Islam A. SALAMA ,  Sri Ranga Sai BOYAPATI ,  Sheng LI ,  Kristof DARMAWIKARTA ,  Robert L. SANKMAN ,  Amruthavalli Pallavi ALUR

IPC: H01L23/538 ,  H01L21/56 ,  H01L21/683 ,  H01L23/00 ,  H01L23/31 ,  H01L25/065 ,  H01L25/07 ,  H01L25/11

CPC classification number: H01L23/5389 ,  H01L21/56 ,  H01L21/6835 ,  H01L23/3128 ,  H01L24/19 ,  H01L24/25 ,  H01L24/82 ,  H01L25/0652 ,  H01L25/0655 ,  H01L25/071 ,  H01L25/112 ,  H01L2221/68359 ,  H01L2221/68372 ,  H01L2224/0401 ,  H01L2224/16235 ,  H01L2224/16238 ,  H01L2224/22 ,  H01L2224/224 ,  H01L2224/24226 ,  H01L2224/73103 ,  H01L2224/73104 ,  H01L2224/73203 ,  H01L2224/73204 ,  H01L2224/73209 ,  H01L2224/73217 ,  H01L2224/73267 ,  H01L2924/15311

Abstract: A microelectronic device is formed to include an embedded die substrate on an interposer; where the embedded die substrate is formed with no more than a single layer of transverse routing traces. In the device, all additional routing may be allocated to the interposer to which the embedded die substrate is attached. The embedded die substrate may be formed with a planarized dielectric formed over an initial metallization layer supporting the embedded die.

公开(公告)号：US20240213164A1

公开(公告)日：2024-06-27

申请号：US18089483

申请日：2022-12-27

Applicant: Intel Corporation

Inventor： Minglu LIU ,  Gang DUAN ,  Liang HE ,  Ziyin LIN ,  Elizabeth NOFEN ,  Yiqun BAI ,  Jonathan ATKINS ,  Jesus S. NIETO PESCADOR ,  Srinivas V. PIETAMBARAM ,  Kristof DARMAWIKARTA

IPC: H01L23/538 ,  H01L23/00 ,  H01L23/522 ,  H01L23/528

CPC classification number: H01L23/5381 ,  H01L23/5226 ,  H01L23/5283 ,  H01L24/14 ,  H01L2224/16104

Abstract: Embodiments disclosed herein include an electronic package. In an embodiment, the electronic package comprises a package substrate, and an opening in the package substrate. In an embodiment, a plurality of first pads are provided at a bottom of the opening, and a bridge die is in the opening. In an embodiment, the bridge die comprises a plurality of second pads that are coupled to the first pads by solder. In an embodiment, a non-conductive film (NCF) is around the solder between the first pads and the second pads.

公开(公告)号：US20240071848A1

公开(公告)日：2024-02-29

申请号：US17895916

申请日：2022-08-25

Applicant: Intel Corporation

Inventor： Bohan SHAN ,  Haobo CHEN ,  Brandon C. MARIN ,  Srinivas V. PIETAMBARAM ,  Bai NIE ,  Gang DUAN ,  Kyle ARRINGTON ,  Ziyin LIN ,  Hongxia FENG ,  Yiqun BAI ,  Xiaoying GUO ,  Dingying David XU ,  Jeremy D. ECTON ,  Kristof DARMAWIKARTA ,  Suddhasattwa NAD

IPC: H01L23/15 ,  H01L21/48 ,  H01L23/498

CPC classification number: H01L23/15 ,  H01L21/486 ,  H01L23/49816 ,  H01L23/49827

Abstract: Embodiments disclosed herein include package substrates. In an embodiment, the package substrate comprises a core, where the core comprises glass. In an embodiment, a first layer is under the core, a second layer is over the core, and a via is through the core, the first layer, and the second layer. In an embodiment a width of the via through the core is equal to a width of the via through the first layer and the second layer. In an embodiment, the package substrate further comprises a first pad under the via, and a second pad over the via.

公开(公告)号：US20240014149A1

公开(公告)日：2024-01-11

申请号：US18372533

申请日：2023-09-25

Applicant: Intel Corporation

Inventor： Aleksandar ALEKSOV ,  Thomas SOUNART ,  Kristof DARMAWIKARTA ,  Henning BRAUNISCH ,  Prithwish CHATTERJEE ,  Andrew J. BROWN

IPC: H01L23/64 ,  H01L23/498 ,  H01L23/00 ,  H01L21/48

CPC classification number: H01L23/642 ,  H01L23/49894 ,  H01L23/49838 ,  H01L24/16 ,  H01L23/49827 ,  H01L21/4846 ,  H01L2224/16265 ,  H01L2224/16225 ,  H01L2924/19103 ,  H01L2924/19041

Abstract: Embodiments include an electronic package that includes a dielectric layer and a capacitor on the dielectric layer. In an embodiment, the capacitor comprises a first electrode disposed over the dielectric layer and a capacitor dielectric layer over the first electrode. In an embodiment, the capacitor dielectric layer is an amorphous dielectric layer. In an embodiment, the electronic package may also comprise a second electrode over the capacitor dielectric layer.

公开(公告)号：US20230137877A1

公开(公告)日：2023-05-04

申请号：US17517152

申请日：2021-11-02

Applicant: Intel Corporation

Inventor： Bohan SHAN ,  Haobo CHEN ,  Omkar KARHADE ,  Malavarayan SANKARASUBRAMANIAN ,  Dingying XU ,  Gang DUAN ,  Bai NIE ,  Xiaoying GUO ,  Kristof DARMAWIKARTA ,  Hongxia FENG ,  Srinivas PIETAMBARAM ,  Jeremy D. ECTON

IPC: H01L23/00 ,  H01L25/065

Abstract: No-remelt solder joints can eliminate die or substrate movement in downstream reflow processes. In one example, one or more solder joints between two substrates can be formed as full IMC (intermetallic compound) solder joints. In one example, a full IMC solder joint includes a continuous layer (e.g., from the top pad to bottom pad) of intermetallic compounds. In one example, a full IMC joint can be formed by dispensing a no-remelt solder paste on some of the pads of one or both substrates to be bonded together.

公开(公告)号：US20230087810A1

公开(公告)日：2023-03-23

申请号：US17482852

申请日：2021-09-23

Applicant: Intel Corporation

Inventor： Jeremy D. ECTON ,  Kristof DARMAWIKARTA ,  Suddhasattwa NAD ,  Oscar OJEDA ,  Bai NIE ,  Brandon C. MARIN ,  Gang DUAN ,  Jacob VEHONSKY ,  Onur OZKAN ,  Nicholas S. HAEHN

IPC: H01L23/498 ,  H01L21/48 ,  H01L23/00

Abstract: Embodiments disclosed herein include electronic packages and methods of forming such electronic packages. In an embodiment, an electronic package comprises a plurality of stacked layers. In an embodiment, a first trace is on a first layer, wherein the first trace has a first thickness. In an embodiment, a second trace is on the first layer, wherein the second trace has a second thickness that is greater than the first thickness. In an embodiment, a second layer is over the first trace and the second trace.

公开(公告)号：US20220392842A1

公开(公告)日：2022-12-08

申请号：US17888177

申请日：2022-08-15

Applicant: Intel Corporation

Inventor： Robert Alan MAY ,  Wei-Lun Kane JEN ,  Jonathan L. ROSCH ,  Islam A. SALAMA ,  Kristof DARMAWIKARTA

IPC: H01L23/538 ,  H01L21/48 ,  H01L21/683 ,  H01L23/00 ,  H01L25/065 ,  H01L25/00

Abstract: A device and method for providing enhanced bridge structures is disclosed. A set of conducting and insulating layers are deposited and lithographically processed. The conducting layers have uFLS routing. A bridge with uFLS contacts and die disposed on the underlying structure such that the die are connected with the uFLS contacts and uFLS routing. For core-based structures, the layers are formed after the bridge is placed on the underlying structure and the die connected to the bridge through intervening conductive layers. For coreless structures, the layers are formed over the bridge and carrier, which is removed prior to bonding the die to the bridge, and the die bonded directly to the bridge.

公开(公告)号：US20220108957A1

公开(公告)日：2022-04-07

申请号：US17555222

申请日：2021-12-17

Applicant: Intel Corporation

Inventor： Robert Alan MAY ,  Islam A. SALAMA ,  Sri Ranga Sai BOYAPATI ,  Sheng LI ,  Kristof DARMAWIKARTA ,  Robert L. SANKMAN ,  Amruthavalli Pallavi ALUR

IPC: H01L23/538 ,  H01L21/56 ,  H01L21/683 ,  H01L23/31 ,  H01L23/00 ,  H01L25/065

Abstract: A microelectronic device is formed to include an embedded die substrate on an interposer; where the embedded die substrate is formed with no more than a single layer of transverse routing traces. In the device, all additional routing may be allocated to the interposer to which the embedded die substrate is attached. The embedded die substrate may be formed with a planarized dielectric formed over an initial metallization layer supporting the embedded die.