摘要:
A packaging method and structures are disclosed. A first die is mounted on a package substrate. A chip scale package is mounted on the first die. The chip scale package comprises a chip scale package substrate and a second die mounted on a first surface of the chip scale package substrate. A third die is mounted on a second surface of the chip scale package substrate. Accordingly, the height of the stacked package can be reduced.
摘要:
A package structure and fabrication method thereof. The structure includes a substrate having a terminal, a chip overlying the substrate, the chip having an active surface, having a center region and periphery region, the periphery region having an electrode thereon, a patterned cover plate overlying the chip and exposing the electrode, a conductive material electrically connecting the electrode and terminal, and an encapsulant covering the terminal, conductive material, and electrode, but exposing the cover plate overlying the center region of the chip.
摘要:
An under bump metallurgy (UBM) structure formed over a bond pad and for use in conjunction with a solder ball, provides an upper copper layer over a subjacent composite film that includes a nickel film over a further copper film over a titanium film. One or more reflow operations are used to form a molten solder ball and conditions are selected to ensure that all of the copper from the upper copper layer is dissolved within the molten solder. For SnAg leadfree solder, this leads to the formation of SnAgCu-like leadfree solder. The resulting interface between the solder ball and the nickel layer includes regularly spaced Cu6Sn5 nodules as intermetallics but is free of Ni3Sn4 which can spall into the molten solder causing reliability problems.
摘要:
A ball grid array (BGA) package having a thermally enhanced dummy chip is provided. In one embodiment, the package comprises a substrate. A chip is attached to the substrate. A heat spreader is disposed over the chip, and a dummy chip is disposed between the heat spreader and the chip. In one embodiment, the dummy chip is pre-attached to the heat spreader prior to placement in the BGA package. With the coefficient of thermal expansion (CTE) of the dummy chip being approximately equal to the CTE of the chip, the stress in the BGA package is reduced, thereby reducing interface delamination among the components of the BGA package.
摘要:
Described is a semiconductor device having improved semiconductor bond pad reliability and methods of manufacturing thereof. The semiconductor device includes a layer formed over an integrated circuit on a semiconductor substrate. The first layer includes a conductive portion and an insulating portion. A second layer is then formed over the first layer and includes a conductive portion corresponding to the first layer's conductive portion and an insulating portion corresponding to the first layer's insulating portion. A bond pad is then formed over the first and second layers such that the bond pad is substantially situated above the conductive portions and the insulating portions of the first and second layers. A bonding ball is then formed on the bond pad substantially above the conduction portion of the first and second layers.
摘要:
Non-cavity semiconductor packages. One embodiment of the packages includes a non-cavity substrate, a first die, an encapsulant, and a second die. The non-cavity substrate comprises a first surface and an opposite second surface. The first surface comprises an external terminal thereon. The first die is attached and wire-bonded to the first surface of the substrate. The encapsulant covers the first die. The second die electrically connects to the second surface of the substrate. The second die is larger than the first die.
摘要:
A microelectronic package comprising a device substrate having first and second opposing surfaces and comprising a plurality of microelectronic devices. The microelectronic package also includes a plurality of electrically conductive members coupled to corresponding ones of the plurality of microelectronics device and extending away from the first surface. A thermally conductive layer is located on the second surface of the device substrate, and a package substrate is coupled to the device substrate, the package substrate having a plurality of electrically conductive traces coupled to corresponding ones of the plurality of electrically conductive members.
摘要:
A reusable burn-in/test fixture for discrete TAB die consists of two halves. The first half of the test fixture contains cavity in which die is inserted. When the two halves are assembled, the fixture establishes electrical contact with the die and with a burn-in oven. The test fixture need not be opened until the burn-in and electrical test are completed. The fixture permits the die to be characterized prior to assembly.
摘要:
A method and apparatus for wire bonding bond pads formed on semiconductor dice to the lead fingers of a semiconductor leadframe are provided. Using an automated wire bonding apparatus two (or more) adjacent dice attached to the leadframe are wire bonded using a single indexing step for the leadframe. The wire bonding apparatus includes a heat block for heating the two adjacent dice, and a clamp for clamping the two adjacent dice to the heat block for wire bonding. A bonding tool of the wire bonding apparatus is moved to successively wire bond the two adjacent dice. The method of the invention is suitable for DIP, ZIP, SOJ, TSOP, PLCC, SOIC, PQFP, or IDF semiconductor packages.
摘要:
A new and improved integrated circuit lead frame to be used to reduce bowing during the assembly of conventional microcircuits is described, wherein a conventional die attach paddle is supported on one side by at least one tie bar, extending conventionally between the paddle and the lead finger support structure also known as dam bars, and supported on the opposing side by a plurality of tie bars which are attached on their opposing ends to a novel support beam. This support beam extends between opposing side of the lead frame and provides independent support for the tie bars on the one side and permits dimensional and angular symmetry, similarity and parity to be achieved in the location of all of the tie bars in order to optimize the stability and integrity of the die pad and reduce bowing after the encapsulation process.