Flip-chip semiconductor package with lead frame as chip carrier and fabrication method thereof
    41.
    发明授权
    Flip-chip semiconductor package with lead frame as chip carrier and fabrication method thereof 有权
    具有引线框架作为芯片载体的倒装芯片半导体封装及其制造方法

    公开(公告)号:US07274088B2

    公开(公告)日:2007-09-25

    申请号:US10196305

    申请日:2002-07-16

    IPC分类号: H01L23/495 H01L29/40

    摘要: A flip-ship semiconductor package with a lead frame as a chip carrier is provided, wherein a plurality of leads of the lead frame are each formed with at least a dam member thereon. When a chip is mounted on the lead frame by means of solder bumps, each of the solder bumps is attached to the corresponding one of the leads at a position between the dam member and an inner end of the lead. During a reflow-soldering process for wetting the solder bumps to the leads, the dam members would help control collapse height of the solder bumps, so as to enhance resistance of the solder bumps to thermal stress generated by CTE (coefficient of thermal expansion) mismatch between the chip and the leads, thereby preventing incomplete electrical connection between the chip and the leads.

    摘要翻译: 提供一种具有引线框架作为芯片载体的翻转半导体封装,其中引线框架的多个引线至少形成有至少一个阻挡构件。 当通过焊料凸块将芯片安装在引线框架上时,每个焊料凸块在引线的阻挡件和引线的内端之间的位置附接到相应的一个引线。 在用于将焊料凸点润湿到引线的回流焊接过程中,阻挡构件将有助于控制焊料凸块的塌陷高度,从而增强焊料凸块对CTE产生的热应力的阻力(热膨胀系数)不匹配 在芯片和引线之间,从而防止芯片和引线之间的不完全的电连接。

    Semiconductor package with heat sink
    43.
    发明授权
    Semiconductor package with heat sink 有权
    半导体封装带散热片

    公开(公告)号:US07057276B2

    公开(公告)日:2006-06-06

    申请号:US10690921

    申请日:2003-10-21

    IPC分类号: H01L23/10 H01L23/34

    摘要: A semiconductor package with a heat sink is provided. At least one chip and a heat sink attached to the chip are mounted on a substrate. At least one slot is formed through at least one corner of the heat sink at a position attached to the substrate. An adhesive material is applied between the heat sink and substrate and over filled in the slot with an overflow of the adhesive material out of the slot. The adhesive material over filled in the slot provides an anchoring effect and increases its contact area with the heat sink to thereby firmly secure the heat sink on the substrate. Further, the slot formed at the corner of the heat sink can alleviate thermal stresses accumulated at the corner of the heat sink and thereby prevent delamination between the heat sink and the substrate.

    摘要翻译: 提供了具有散热器的半导体封装。 连接到芯片的至少一个芯片和散热片安装在基板上。 在连接到基板的位置处,通过散热器的至少一个角部形成至少一个槽。 将粘合剂材料施加在散热器和衬底之间并且在填充在槽中并且粘合剂材料溢出出槽之外。 填充在槽中的粘合剂材料提供锚定效果并增加其与散热器的接触面积,从而将散热器牢固地固定在基板上。 此外,形成在散热器角落处的槽可以减轻积聚在散热器拐角处的热应力,从而防止散热器和基板之间的分层。

    Method of underfilling a flip-chip semiconductor device
    46.
    发明授权
    Method of underfilling a flip-chip semiconductor device 失效
    倒装芯片半导体器件底部填充方法

    公开(公告)号:US06498054B1

    公开(公告)日:2002-12-24

    申请号:US09585964

    申请日:2000-06-02

    IPC分类号: H01L2144

    摘要: A flip-chip underfill method is proposed for the purpose of underfilling a gap formed beneath a semiconductor chip mounted in a flip-chip manner over an underlying surface. The flip-chip underfill method comprises the following procedural steps of: preparing a dispensing needle having an outlet; then, moving the dispensing needle in such a manner as to position the outlet thereof at a corner point between the upper surface and the sidewall of the semiconductor chip; and finally injecting resin at the targeted corner point, which allows the injected resin from the outlet of the dispensing needle to flow down along the sidewall of the semiconductor chip to the edge of the lower surface of the semiconductor chip and subsequently fill into the gap through capillary action. This flip-chip underfill method is more advantageous to use than the prior art since it allows the dispensing needle to be unobstructed by any gold wires or passive components mounted beside the chip and also allows the injected resin to be substantially confined to the targeted area beneath the chip without being wasted.

    摘要翻译: 提出了一种倒装底层填充方法,其目的在于在底层表面上以倒装芯片的方式填充形成在半导体芯片下面的间隙。 倒装底层填充方法包括以下步骤:准备具有出口的分配针; 然后,以将出口定位在半导体芯片的上表面和侧壁之间的角点处的方式移动分配针; 并且最终在目标角点注入树脂,这允许来自分配针的出口的注入的树脂沿着半导体芯片的侧壁向下流到半导体芯片的下表面的边缘,随后填充到间隙中 毛细作用。 这种倒装底层填充方法比现有技术更有利于使用,因为其允许分配针由安装在芯片旁边的任何金线或无源元件不受阻碍,并且还允许注入的树脂基本上限制在下面的目标区域 芯片不被浪费。

    Method and system of testing a semiconductor device
    50.
    发明授权
    Method and system of testing a semiconductor device 有权
    测试半导体器件的方法和系统

    公开(公告)号:US08400178B2

    公开(公告)日:2013-03-19

    申请号:US12431927

    申请日:2009-04-29

    IPC分类号: G01R31/02

    摘要: The present disclosure provides a semiconductor device, the device includes a substrate, a front-end structure formed in the substrate, a back-end structure formed on the front-end structure, a heater embedded in the back-end structure and operable to generate heat, and a sensor embedded in the back-end structure and operable to sense a temperature of the semiconductor device.

    摘要翻译: 本公开提供一种半导体器件,该器件包括衬底,形成在衬底中的前端结构,形成在前端结构上的后端结构,嵌入在后端结构中的加热器,可操作以产生 热和嵌入在后端结构中的传感器,并且可操作以感测半导体器件的温度。