Semiconductor device
    74.
    发明授权
    Semiconductor device 有权
    半导体器件

    公开(公告)号:US07348673B2

    公开(公告)日:2008-03-25

    申请号:US11180729

    申请日:2005-07-14

    IPC分类号: H01L23/48

    摘要: A minute wiring structure portion including first wiring layers and first insulating layers, in which each of first wiring layers and each of first insulating layers are alternately laminated, is formed on a semiconductor substrate. A first huge wiring structure portion is formed on the minute wiring structure portion, and the first huge wiring structure portion is formed by successively forming on the minute wiring structure portion, in the following order, the first huge wiring portion including second wiring layers has a thickness of twice or more of the thickness of the first wiring layers and second insulating layers, in which each of second wiring layers and each of second wiring layers are alternately laminated, and a second huge wiring structure portion including third wiring layers has a thickness of twice or more of the thickness of the first wiring layer and a third insulating layer in which the elastic modulus at 25° C. is not more than that of the second insulating layers, each of the third wiring layers and each of the third insulating layers being alternately laminated.

    摘要翻译: 在半导体基板上形成包括第一布线层和第一绝缘层的微小布线结构部分,其中第一布线层和每个第一绝缘层交替层叠。 第一巨型布线结构部分形成在微小布线结构部分上,并且第一巨大的布线结构部分通过在微小的布线结构部分上依次形成,按照以下顺序形成包括第二布线层的第一巨大布线部分具有 其中第二布线层和每个第二布线层交替层叠的第一布线层和第二绝缘层的厚度的两倍或更多的厚度,以及包括第三布线层的第二巨大布线结构部分的厚度为 第一布线层的厚度的2倍以上,25℃下的弹性模量不大于第2绝缘层的弹性模量的第3绝缘层,第3布线层和第3绝缘层 交替层压。

    Semiconductor device
    78.
    发明申请
    Semiconductor device 有权
    半导体器件

    公开(公告)号:US20060012029A1

    公开(公告)日:2006-01-19

    申请号:US11180729

    申请日:2005-07-14

    IPC分类号: H01L23/12

    摘要: A minute wiring structure portion including first wiring layers and first insulating layers, in which each of first wiring layers and each of first insulating layers are alternately laminated, is formed on a semiconductor substrate. A first huge wiring structure portion is formed on the minute wiring structure portion, and the first huge wiring structure portion is formed by successively forming on the minute wiring structure portion, in the following order, the first huge wiring portion including second wiring layers has a thickness of twice or more of the thickness of the first wiring layers and second insulating layers, in which each of second wiring layers and each of second wiring layers are alternately laminated, and a second huge wiring structure portion including third wiring layers has a thickness of twice or more of the thickness of the first wiring layer and a third insulating layer in which the elastic modulus at 25° C. is not more than that of the second insulating layers, each of the third wiring layers and each of the third insulating layers being alternately laminated.

    摘要翻译: 在半导体基板上形成包括第一布线层和第一绝缘层的微小布线结构部分,其中第一布线层和每个第一绝缘层交替层叠。 第一巨型布线结构部分形成在微小布线结构部分上,并且第一巨大的布线结构部分通过在微小的布线结构部分上依次形成,按照以下顺序形成包括第二布线层的第一巨大布线部分具有 其中第二布线层和每个第二布线层交替层叠的第一布线层和第二绝缘层的厚度的两倍或更多的厚度,以及包括第三布线层的第二巨大布线结构部分的厚度为 第一布线层的厚度的2倍以上,25℃下的弹性模量不大于第2绝缘层的弹性模量的第3绝缘层,第3布线层和第3绝缘层 交替层压。

    Thin film capacitor
    79.
    发明授权
    Thin film capacitor 有权
    薄膜电容器

    公开(公告)号:US06292352B1

    公开(公告)日:2001-09-18

    申请号:US09583871

    申请日:2000-05-31

    IPC分类号: H01G406

    CPC分类号: H01L28/60 H01L21/76895

    摘要: There is provided a thin film capacitor including (a) a semiconductor substrate, (b) an interlayer insulating film formed on the semiconductor substrate, (c) a contact formed throughout the interlayer insulating film such that the contact has an upper surface upwardly projecting, (d) a lower electrode formed on the interlayer insulating film such that the lower electrode covers the upper surface of the contact therewith, (e) a capacitor insulating film covering the lower electrode and the interlayer insulating film therewith, and (f) an upper electrode formed on the capacitor insulating film. The thin film capacitor prevents peeling between the contact and the lower electrode even in an annealing step.

    摘要翻译: 提供一种薄膜电容器,其包括:(a)半导体衬底,(b)形成在半导体衬底上的层间绝缘膜,(c)形成在整个层间绝缘膜上的触点,使得触点具有向上突出的上表面, (d)形成在层间绝缘膜上的下电极,使得下电极覆盖其接触的上表面,(e)覆盖下电极和层间绝缘膜的电容器绝缘膜,以及(f) 电极形成在电容绝缘膜上。 即使在退火步骤中,薄膜电容器也防止接触部和下电极之间的剥离。

    Semiconductor device having a thin film capacitor and a resistance
measuring element
    80.
    发明授权
    Semiconductor device having a thin film capacitor and a resistance measuring element 失效
    具有薄膜电容器和电阻测量元件的半导体器件

    公开(公告)号:US5847423A

    公开(公告)日:1998-12-08

    申请号:US883334

    申请日:1997-06-26

    摘要: A semiconductor device having thin film capacitors and containing resistance measuring elementsis disclosed. The thin film capacitor comprises a bottom electrode, a high permittivity dielectric, and a top electrode stacked on an interlayer insulation film and at least one of a plurality of contact formed in electrical contact with the substrate at the desired position of an interlayer insulation film formed on a semiconductor substrate. The bottom electrode comprises at least two layers. A resistance measuring element consists of the same materials as those of the thin film capacitor and has the same size as that of the thin film capacitor except that the resistance measuring element comprises a first electrode, the dielectric film of high permittivity, and a second electrode stacked on the interlayer insulation film and at least one of a plurality of contacts other than the above-mentioned contact for the thin film capacitor, and the topmost layer of the first electrode and the second electrode are in contact with each other through the contact provided at a portion of the dielectric film. The resistance value of the bottom electrode of the thin film capacitor is measured using electrical path through the substrate.

    摘要翻译: 公开了具有薄膜电容器并且包含电阻测量元件的半导体器件。 薄膜电容器包括底电极,高介电常数电介质和堆叠在层间绝缘膜上的顶电极以及在形成的层间绝缘膜的期望位置处形成与基板电接触的多个接触中的至少一个 在半导体衬底上。 底部电极包括至少两层。 电阻测量元件由与薄膜电容器相同的材料组成,并且具有与薄膜电容器相同的尺寸,除了电阻测量元件包括第一电极,高介电常数的电介质膜和第二电极 堆叠在层间绝缘膜上,并且除了上述用于薄膜电容器的触点之外的多个触点中的至少一个触点以及第一电极和第二电极的最上层通过所提供的触点彼此接触 在电介质膜的一部分。 薄膜电容器的底部电极的电阻值通过基板的电气路径进行测量。