摘要:
An electrical transmission line repair device including a first conductor clamp, a second conductor clamp and at least one tie rail extending between the first and second conductor clamps in a spaced apart orientation. The first conductor clamp including a lower assembly and an upper assembly. The lower assembly and the upper assembly are slidably engageable with each other so as to define a conductor cavity extending therealong. Clamping fasteners are configured to extend through openings in the upper assembly so as to be threadable toward and away from the conductor contact region of the lower assembly within the conductor cavity.
摘要:
Manufacturing a semiconductor structure including modifying a frequency of a Film Bulk Acoustic Resonator (FBAR) device though a vent hole of a sealing layer surrounding the FBAR device.
摘要:
Disclosed are a circuit and method for amplifying the power of a multi-tone input signal. The multi-tone input signal is filtered separating out one signal having a tone at a fundamental frequency from another signal having additional tones at additional frequencies. The signal having the tone at the fundamental frequency is amplified and then filtered removing any harmonics added during amplification. The signals are then recombined generating a multi-tone output signal, wherein the tone at the fundamental frequency is boosted (i.e., has a higher power in the multi-tone output signal than in the multi-tone input signal), but the additional tones at the additional frequencies are not (i.e., the additional tones at the additional frequencies have essentially the same power in the multi-tone output and input signals). Also disclosed herein are embodiments of a testing system and method incorporating the above-described circuit to allow for testing of high power devices.
摘要:
A design structure for an integrated radio frequency (RF) filter on a backside of a semiconductor substrate includes: a device on a first side of a substrate; a radio frequency (RF) filter on a backside of the substrate; and at least one substrate conductor extending from the front side of the substrate to the backside of the substrate and electrically coupling the RF filter to the device.
摘要:
Disclosed herein is a surface acoustic wave (SAW) filter and method of making the same. The SAW filter includes a piezoelectric substrate; a planar barrier layer disposed above the piezoelectric substrate, and at least one conductor buried in the piezoelectric substrate and the planar barrier layer.
摘要:
A semiconductor-on-insulator substrate and a related semiconductor structure, as well as a method for fabricating the semiconductor-on-insulator substrate and the related semiconductor structure, provide for a multiple order radio frequency harmonic suppressing region located and formed within a base semiconductor substrate at a location beneath an interface of a buried dielectric layer with the base semiconductor substrate within the semiconductor-on-insulator substrate. The multiple order radio frequency harmonic suppressing region may comprise an ion implanted atom, such as but not limited to a noble gas atom, to provide a suppressed multiple order radio frequency harmonic when powering a radio frequency device, such as but not limited to a radio frequency complementary metal oxide semiconductor device (or alternatively a passive device), located and formed within and upon a surface semiconductor layer within the semiconductor structure.
摘要:
Disclosed is semiconductor structure with an insulator layer on a semiconductor substrate and a device layer is on the insulator layer. The substrate is doped with a relatively low dose of a dopant having a given conductivity type such that it has a relatively high resistivity. Additionally, a portion of the semiconductor substrate immediately adjacent to the insulator layer can be doped with a slightly higher dose of the same dopant, a different dopant having the same conductivity type or a combination thereof. Optionally, micro-cavities are created within this same portion so as to balance out any increase in conductivity due to increased doping with a corresponding increase in resistivity. Increasing the dopant concentration at the semiconductor substrate-insulator layer interface raises the threshold voltage (Vt) of any resulting parasitic capacitors and, thereby reduces harmonic behavior. Also disclosed herein are embodiments of a method for forming such a semiconductor structure.
摘要:
An electrical transmission line repair device including a first conductor clamp, a second conductor clamp and at least one tie rail extending between the first and second conductor clamps in a spaced apart orientation. The first conductor clamp including a lower assembly and an upper assembly. The lower assembly and the upper assembly are slidably engageable with each other so as to define a conductor cavity extending therealong. Clamping fasteners are configured to extend through openings in the upper assembly so as to be threadable toward and away from the conductor contact region of the lower assembly within the conductor cavity.
摘要:
Switchable and/or tunable filters, methods of manufacture and design structures are provided herein. The method of forming the filters includes forming at least one piezoelectric filter structure comprising a plurality of electrodes formed on a piezoelectric substrate. The method further includes forming a fixed electrode with a plurality of fingers on the piezoelectric substrate. The method further includes forming a moveable electrode with a plurality of fingers over the piezoelectric substrate. The method further includes forming actuators aligned with one or more of the plurality of fingers of the moveable electrode.
摘要:
A method, integrated circuit and design structure includes a silicon substrate layer having trench structures and an ion impurity implant. An insulator layer is positioned on and contacts the silicon substrate layer. The insulator layer fills the trench structures. A circuitry layer is positioned on and contacts the buried insulator layer. The circuitry layer comprises groups of active circuits separated by passive structures. The trench structures are positioned between the groups of active circuits when the integrated circuit structure is viewed from the top view. Thus, the trench structures are below the passive structures and are not below the groups of circuits when the integrated circuit structure is viewed from the top view.