Self-dicing chips using through silicon vias
    4.
    发明授权
    Self-dicing chips using through silicon vias 失效
    通过硅通孔的自切割芯片

    公开(公告)号:US08168474B1

    公开(公告)日:2012-05-01

    申请号:US12987402

    申请日:2011-01-10

    CPC classification number: H01L21/78 H01L21/76898

    Abstract: Systems and methods simultaneously form first openings and second openings in a substrate. The first openings are formed smaller than the second openings. The method also simultaneously forms a first material in the first openings and the second openings. The first material fills the first openings, and the first material lines the second openings. The method forms a second material different than the first material in the second openings. The second material fills the second openings. The method forms a plurality of integrated circuit structures over the first material and the second material within the second openings. The method applies mechanical stress to the substrate to cause the substrate to split along the first openings.

    Abstract translation: 系统和方法同时在衬底中形成第一开口和第二开口。 第一开口形成为小于第二开口。 该方法还同时在第一开口和第二开口中形成第一材料。 第一材料填充第一开口,第一材料将第二开口排列。 该方法形成与第二开口中的第一材料不同的第二材料。 第二材料填充第二开口。 该方法在第二开口内的第一材料和第二材料上形成多个集成电路结构。 该方法对基板施加机械应力以使基板沿着第一开口分开。

    Metal insulator metal (MIM) capacitor structure
    5.
    发明授权
    Metal insulator metal (MIM) capacitor structure 有权
    金属绝缘体金属(MIM)电容器结构

    公开(公告)号:US09252204B2

    公开(公告)日:2016-02-02

    申请号:US13233752

    申请日:2011-09-15

    CPC classification number: H01L28/90

    Abstract: A MIM capacitor includes a dielectric cap that enhances performance and reduces damage to MIM insulators during manufacture. A cavity is formed in an insulative substrate, such as a back end of line dielectric layer, and a first metal layer and an insulator layer are conformally deposited. A second metal layer may be deposited conformally and/or to fill a remaining portion of the cavity. The dielectric cap may be an extra layer of insulative material deposited at ends of the insulator at an opening of the cavity and may also be formed as part of the insulator layer.

    Abstract translation: MIM电容器包括在制造期间增强性能并减少对MIM绝缘体的损坏的电介质盖。 在绝缘基板(例如线路介质层的后端)中形成空腔,并且第一金属层和绝缘体层被共形沉积。 可以共形地沉积第二金属层和/或填充空腔的剩余部分。 电介质盖可以是在空腔的开口处沉积在绝缘体的端部处的绝缘材料的额外层,并且还可以形成为绝缘体层的一部分。

    METAL INSULATOR METAL (MIM) CAPACITOR STRUCTURE
    8.
    发明申请
    METAL INSULATOR METAL (MIM) CAPACITOR STRUCTURE 有权
    金属绝缘体金属(MIM)电容结构

    公开(公告)号:US20130069199A1

    公开(公告)日:2013-03-21

    申请号:US13233752

    申请日:2011-09-15

    CPC classification number: H01L28/90

    Abstract: A MIM capacitor includes a dielectric cap that enhances performance and reduces damage to MIM insulators during manufacture. A cavity is formed in an insulative substrate, such as a back end of line dielectric layer, and a first metal layer and an insulator layer are conformally deposited. A second metal layer may be deposited conformally and/or to fill a remaining portion of the cavity. The dielectric cap may be an extra layer of insulative material deposited at ends of the insulator at an opening of the cavity and may also be formed as part of the insulator layer.

    Abstract translation: MIM电容器包括在制造期间增强性能并减少对MIM绝缘体的损坏的电介质盖。 在绝缘基板(例如线路介质层的后端)中形成空腔,并且第一金属层和绝缘体层被共形沉积。 可以共形地沉积第二金属层和/或填充空腔的剩余部分。 电介质盖可以是在空腔的开口处沉积在绝缘体的端部处的绝缘材料的额外层,并且还可以形成为绝缘体层的一部分。

Patent Agency Ranking