Assemblies for temporarily connecting microelectronic elements for testing and methods therefor
    4.
    发明授权
    Assemblies for temporarily connecting microelectronic elements for testing and methods therefor 有权
    用于临时连接用于测试的微电子元件的组件及其方法

    公开(公告)号:US07205659B2

    公开(公告)日:2007-04-17

    申请号:US10777804

    申请日:2004-02-12

    IPC分类号: H01L23/48

    摘要: A microelectronic assembly includes a first microelectronic element having a contact bearing face and at least one contact accessible at the contact bearing face, and a second microelectronic element opposing the first microelectronic element, the second microelectronic element having a first surface including at least one lead extending over the first surface. The microelectronic assembly includes the first fusible material engaging the at least one contact of the first microelectronic element, and a second fusible material engaging the at least one lead, whereby one of the first and second fusible materials has a higher melting temperature and one of the first and second fusible materials has a lower melting temperature. The first and second microelectronic elements are juxtaposed with one another so that the first and second fusible materials are in substantial alignment with one another, with one of the first and second fusible materials in a liquid state and one of the first and second fusible materials in a solid state.

    摘要翻译: 微电子组件包括第一微电子元件,其具有接触支承面和在接触支承面处可访问的至少一个触点,以及与第一微电子元件相对的第二微电子元件,第二微电子元件具有第一表面,第一表面包括至少一个引线延伸 在第一个表面。 微电子组件包括与第一微电子元件的至少一个触点接合的第一可熔材料和与该至少一个引线接合的第二可熔材料,其中第一和第二熔融材料之一具有较高的熔化温度, 第一和第二可熔材料具有较低的熔化温度。 第一和第二微电子元件彼此并置,使得第一和第二可熔材料彼此基本对齐,其中第一和第二可熔材料中的一个处于液体状态,第一和第二可熔材料中的一个在 固态。

    Assemblies for temporarily connecting microelectronic elements for testing and methods therefor
    8.
    发明授权
    Assemblies for temporarily connecting microelectronic elements for testing and methods therefor 失效
    用于临时连接用于测试的微电子元件的组件及其方法

    公开(公告)号:US06794202B2

    公开(公告)日:2004-09-21

    申请号:US09802834

    申请日:2001-03-09

    IPC分类号: H01L2166

    摘要: A method of making a microelectronic assembly includes providing a first microelectronic element having one or more conductive bumps, the conductive bumps including a first fusible material that transforms from a solid to a liquid at a first melting temperature, and providing a second microelectronic element having one or more conductive elements. The conductive bumps of the first microelectronic element are electrically interconnected with the conductive elements of the second microelectronic element using a second fusible material, the second fusible material having a second melting temperature that is lower than the first melting temperature of the first fusible material. During the electrically interconnecting step, the second fusible material is maintained at a temperature that is greater than or equal to the second melting temperature and less than the first melting temperature of the first fusible material. The method also includes testing the microelectronic assembly after the electrically interconnecting step while maintaining the second fusible material at a temperature that is greater than or equal to the second melting temperature.

    摘要翻译: 一种制造微电子组件的方法包括提供具有一个或多个导电凸块的第一微电子元件,所述导电凸块包括在第一熔化温度下从固体转变为液体的第一可熔材料,以及提供具有一个 或更多导电元件。 第一微电子元件的导电凸块使用第二可熔材料与第二微电子元件的导电元件电互连,第二可熔材料具有低于第一可熔材料的第一熔化温度的第二熔化温度。 在电互连步骤期间,第二可熔材料保持在大于或等于第二熔融温度并小于第一熔融材料的第一熔化温度的温度。 该方法还包括在电互连步骤之后测试微电子组件,同时将第二可熔材料保持在大于或等于第二熔融温度的温度。

    Microelectronic assemblies incorporating inductors

    公开(公告)号:US20060113645A1

    公开(公告)日:2006-06-01

    申请号:US11327057

    申请日:2006-01-06

    IPC分类号: H01L23/495

    摘要: Inductors are provided in chip assemblies such as in packaged semiconductor chips. The inductors may be incorporated in a chip carrier which forms part of the package, and may include, for example, spiral or serpentine inductors formed from traces on the chip carrier. The chip carrier may include a flap bearing the inductive element, and this flap may be bent to tilt the inductive element out of the plane of the chip carrier to reduce electromagnetic interaction between the inductive element and surrounding electrical components. Other inductors include solenoids formed in part by leads on the chip carrier as, for example, by displacing leads out of the plane of the chip carrier to form loops in vertically-extensive planes transverse to the plane of the chip carrier. Additional features provide trimming of the inductor to a desired inductance value during by breaking or connecting leads during assembly.