公开(公告)号：US20110177670A1

公开(公告)日：2011-07-21

申请号：US12690299

申请日：2010-01-20

Applicant: Russell T. Herrin ,  Peter J. Lindgren ,  Edmund J. Sprogis ,  Anthony K. Stamper

Inventor： Russell T. Herrin ,  Peter J. Lindgren ,  Edmund J. Sprogis ,  Anthony K. Stamper

IPC: H01L21/71

CPC classification number: H01L21/76898 ,  G03F9/7076 ,  G03F9/708 ,  H01L23/544 ,  H01L2223/54453 ,  H01L2924/0002 ,  H01L2924/00

Abstract: A method of manufacturing an integrated circuit structure forms a first opening in a substrate and lines the first opening with a protective liner. The method deposits a material into the first opening and forms a protective material over the substrate. The protective material includes a process control mark and includes a second opening above, and aligned with, the first opening. The method removes the material from the first opening through the second opening in the protective material. The process control mark comprises a recess within the protective material that extends only partially through the protective material, such that portions of the substrate below the process control mark are not affected by the process of removing the material.

Abstract translation: 一种制造集成电路结构的方法在衬底中形成第一开口并且用保护性衬垫对第一开口进行排列。 该方法将材料沉积到第一开口中并在基底上形成保护材料。 保护材料包括工艺控制标记，并且包括在第一开口上方并对准第二开口的第二开口。 该方法通过保护材料中的第二开口从第一开口移除材料。 过程控制标记包括在保护材料内的仅部分延伸穿过保护材料的凹槽，使得在过程控制标记之下的基底的部分不受去除材料的过程的影响。

公开(公告)号：US20110037161A1

公开(公告)日：2011-02-17

申请号：US12540510

申请日：2009-08-13

Applicant: Paul S. Andry ,  Edward C. Cooney, III ,  Edmund J. Sprogis ,  Anthony K. Stamper ,  Cornelia K. Tsang

Inventor： Paul S. Andry ,  Edward C. Cooney, III ,  Edmund J. Sprogis ,  Anthony K. Stamper ,  Cornelia K. Tsang

IPC: H01L23/488 ,  H01L21/78 ,  H01L21/50

CPC classification number: H01L24/10 ,  H01L23/5384 ,  H01L24/13 ,  H01L2224/05124 ,  H01L2224/05147 ,  H01L2224/05166 ,  H01L2224/05181 ,  H01L2224/05184 ,  H01L2224/05624 ,  H01L2224/05647 ,  H01L2224/05666 ,  H01L2224/05681 ,  H01L2224/05684 ,  H01L2224/05686 ,  H01L2224/13 ,  H01L2224/13099 ,  H01L2224/16 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01019 ,  H01L2924/01022 ,  H01L2924/01023 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01049 ,  H01L2924/01073 ,  H01L2924/01074 ,  H01L2924/01327 ,  H01L2924/04953 ,  H01L2924/12044 ,  H01L2924/15311 ,  H01L2924/00 ,  H01L2924/00014 ,  H01L2924/049

Abstract: A back of a dielectric transparent handle substrate is coated with a blanket conductive film or a mesh of conductive wires. A semiconductor substrate is attached to the transparent handle substrate employing an adhesive layer. The semiconductor substrate is thinned in the bonded structure to form a stack of the transparent handle substrate and the semiconductor interposer. The thinned bonded structure may be loaded into a processing chamber and electrostatically chucked employing the blanket conductive film or the mesh of conductive wires. The semiconductor interposer may be bonded to a semiconductor chip or a packaging substrate employing C4 bonding or intermetallic alloy bonding. Illumination of ultraviolet radiation to the adhesive layer is enabled, for example, by removal of the blanket conductive film or through the mesh so that the transparent handle substrate may be detached. The semiconductor interposer may then be bonded to a packaging substrate or a semiconductor chip.

Abstract translation: 电介质透明手柄基板的背面涂覆有橡皮布导电膜或导电丝网。 使用粘合剂层将半导体衬底附接到透明手柄衬底。 半导体衬底在接合结构中变薄以形成透明手柄衬底和半导体插入器的堆叠。 减薄的粘合结构可以被加载到处理室中并且使用橡皮布导电膜或导线的网状物静电夹持。 半导体插入件可以结合到采用C4键合或金属间化合物键合的半导体芯片或封装衬底。 照射紫外线到粘合剂层是可以实现的，例如，通过去除橡皮布传导膜或通过网格，使透明手柄基板可以分离。 然后可以将半导体中介层结合到封装衬底或半导体芯片。

公开(公告)号：US07791168B2

公开(公告)日：2010-09-07

申请号：US11930698

申请日：2007-10-31

Applicant: Raymond R. Horton ,  John U. Knickerbocker ,  Edmund J. Sprogis ,  Cornelia K. Tsang

Inventor： Raymond R. Horton ,  John U. Knickerbocker ,  Edmund J. Sprogis ,  Cornelia K. Tsang

IPC: H01L29/00 ,  H01L23/52 ,  H01L23/04 ,  H01L23/053

CPC classification number: H01L23/49827 ,  H01L23/49822 ,  H01L23/50 ,  H01L23/5382 ,  H01L2224/16225 ,  H01L2224/16235 ,  H01L2924/01012 ,  H01L2924/01019 ,  H01L2924/0102 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/15311

Abstract: Techniques for electronic device fabrication are provided. In one aspect, an electronic device is provided. The electronic device includes at least one interposer structure having one or more vias and a plurality of decoupling capacitors integrated therein, the at least one interposer structure being configured to allow for one or more of the plurality of decoupling capacitors to be selectively deactivated. In another aspect, a method of fabricating an electronic device including at least one interposer structure having one or more vias and a plurality of decoupling capacitors integrated therein includes the following step. One or more of the plurality of decoupling capacitors are selectively deactivated.

Abstract translation: 提供电子器件制造技术。 一方面，提供一种电子设备。 电子设备包括具有一个或多个通孔和集成在其中的多个去耦电容器的至少一个插入器结构，所述至少一个插入器结构被配置为允许选择性地去激活多个去耦电容器中的一个或多个。 在另一方面，一种制造电子器件的方法包括至少一个具有一个或多个通孔的内插器结构和集成在其中的多个去耦电容器，其中包括以下步骤。 选择性地去激活多个去耦电容器中的一个或多个。

公开(公告)号：US07691669B2

公开(公告)日：2010-04-06

申请号：US12056852

申请日：2008-03-27

Applicant: Raymond R. Horton ,  John U. Knickerbocker ,  Edmund J. Sprogis ,  Cornelia K. Tsang

Inventor： Raymond R. Horton ,  John U. Knickerbocker ,  Edmund J. Sprogis ,  Cornelia K. Tsang

IPC: H01L21/50 ,  H01L21/48 ,  H01L21/44 ,  H01L21/8242

CPC classification number: H01L23/49827 ,  H01L23/49822 ,  H01L23/50 ,  H01L23/5382 ,  H01L2224/16225 ,  H01L2224/16235 ,  H01L2924/01012 ,  H01L2924/01019 ,  H01L2924/0102 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/15311

Abstract: Techniques for electronic device fabrication are provided. In one aspect, an electronic device is provided. The electronic device comprises at least one interposer structure having one or more vias and a plurality of decoupling capacitors integrated therein, the at least one interposer structure being configured to allow for one or more of the plurality of decoupling capacitors to be selectively deactivated. In another aspect, a method of fabricating an electronic device comprising at least one interposer structure having one or more vias and a plurality of decoupling capacitors integrated therein comprises the following step. One or more of the plurality of decoupling capacitors are selectively deactivated.

Abstract translation: 提供电子器件制造技术。 一方面，提供一种电子设备。 电子设备包括具有一个或多个通孔和集成在其中的多个去耦电容器的至少一个插入器结构，所述至少一个插入器结构被配置为允许选择性地去激活多个去耦电容器中的一个或多个。 在另一方面，一种制造电子器件的方法，包括至少一个具有一个或多个通孔的内插器结构和集成在其中的多个去耦电容器，其包括以下步骤。 选择性地去激活多个去耦电容器中的一个或多个。

公开(公告)号：US07488624B2

公开(公告)日：2009-02-10

申请号：US12056808

申请日：2008-03-27

Applicant: Raymond R. Horton ,  John U. Knickerbocker ,  Edmund J. Sprogis ,  Cornelia K. Tsang

Inventor： Raymond R. Horton ,  John U. Knickerbocker ,  Edmund J. Sprogis ,  Cornelia K. Tsang

IPC: H01L21/82

CPC classification number: H01L23/49827 ,  H01L23/49822 ,  H01L23/50 ,  H01L23/5382 ,  H01L2224/16225 ,  H01L2224/16235 ,  H01L2924/01012 ,  H01L2924/01019 ,  H01L2924/0102 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/15311

Abstract: Techniques for electronic device fabrication are provided. In one aspect, an electronic device is provided. The electronic device comprises at least one interposer structure having one or more vias and a plurality of decoupling capacitors integrated therein, the at least one interposer structure being configured to allow for one or more of the plurality of decoupling capacitors to be selectively deactivated. In another aspect, a method of fabricating an electronic device comprising at least one interposer structure having one or more vias and a plurality of decoupling capacitors integrated therein comprises the following step. One or more of the plurality of decoupling capacitors are selectively deactivated.

Abstract translation: 提供电子器件制造技术。 一方面，提供一种电子设备。 电子设备包括具有一个或多个通孔和集成在其中的多个去耦电容器的至少一个插入器结构，所述至少一个插入器结构被配置为允许选择性地去激活多个去耦电容器中的一个或多个。 在另一方面，一种制造电子器件的方法，包括至少一个具有一个或多个通孔的内插器结构和集成在其中的多个去耦电容器，其包括以下步骤。 选择性地去激活多个去耦电容器中的一个或多个。

公开(公告)号：US07449067B2

公开(公告)日：2008-11-11

申请号：US10700327

申请日：2003-11-03

Applicant: Paul S. Andry ,  Jon A. Casey ,  Raymond R. Horton ,  Chiraq S. Patel ,  Edmund J. Sprogis ,  Brian R. Sundlof

Inventor： Paul S. Andry ,  Jon A. Casey ,  Raymond R. Horton ,  Chiraq S. Patel ,  Edmund J. Sprogis ,  Brian R. Sundlof

IPC: B05C1/00 ,  B05C3/00 ,  B05C3/18

CPC classification number: H01L21/486 ,  H01L23/147 ,  H01L2224/16225 ,  H01L2924/10253 ,  H01L2924/1461 ,  H01L2924/15311 ,  H01L2924/00

Abstract: A method for filling vias, and in particular initially blind vias, in a wafer, and various apparatus for performing the method, comprising evacuating air from the vias; trapping at least a portion of the wafer and a paste for filling the vias between two surfaces; and pressurizing the paste to fill the vias.

Abstract translation: 一种用于在晶片中填充通孔，特别是初始盲孔的方法，以及用于执行该方法的各种装置，包括从通孔排出空气; 捕获晶片的至少一部分和用于在两个表面之间填充通孔的糊状物; 并对该糊状物加压以填充通孔。

公开(公告)号：US07435627B2

公开(公告)日：2008-10-14

申请号：US11201572

申请日：2005-08-11

Applicant: Raymond R. Horton ,  John U. Knickerbocker ,  Edmund J. Sprogis ,  Cornelia K. Tsang

Inventor： Raymond R. Horton ,  John U. Knickerbocker ,  Edmund J. Sprogis ,  Cornelia K. Tsang

IPC: H01L21/82

CPC classification number: H01L23/49827 ,  H01L23/49822 ,  H01L23/50 ,  H01L23/5382 ,  H01L2224/16225 ,  H01L2224/16235 ,  H01L2924/01012 ,  H01L2924/01019 ,  H01L2924/0102 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/15311

Abstract: Techniques for electronic device fabrication are provided. In one aspect, an electronic device is provided. The electronic device comprises at least one interposer structure having one or more vias and a plurality of decoupling capacitors integrated therein, the at least one interposer structure being configured to allow for one or more of the plurality of decoupling capacitors to be selectively deactivated. In another aspect, a method of fabricating an electronic device comprising at least one interposer structure having one or more vias and a plurality of decoupling capacitors integrated therein comprises the following step. One or more of the plurality of decoupling capacitors are selectively deactivated.

Abstract translation: 提供电子器件制造技术。 一方面，提供一种电子设备。 电子设备包括具有一个或多个通孔和集成在其中的多个去耦电容器的至少一个插入器结构，所述至少一个插入器结构被配置为允许选择性地去激活多个去耦电容器中的一个或多个。 在另一方面，一种制造电子器件的方法，包括至少一个具有一个或多个通孔的内插器结构和集成在其中的多个去耦电容器，其包括以下步骤。 选择性地去激活多个去耦电容器中的一个或多个。

公开(公告)号：US20080182359A1

公开(公告)日：2008-07-31

申请号：US12056852

申请日：2008-03-27

Applicant: Raymond R. Horton ,  John U. Knickerbocker ,  Edmund J. Sprogis ,  Cornelia K. Tsang

Inventor： Raymond R. Horton ,  John U. Knickerbocker ,  Edmund J. Sprogis ,  Cornelia K. Tsang

IPC: H01L21/00

CPC classification number: H01L23/49827 ,  H01L23/49822 ,  H01L23/50 ,  H01L23/5382 ,  H01L2224/16225 ,  H01L2224/16235 ,  H01L2924/01012 ,  H01L2924/01019 ,  H01L2924/0102 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/15311

Abstract: Techniques for electronic device fabrication are provided. In one aspect, an electronic device is provided. The electronic device comprises at least one interposer structure having one or more vias and a plurality of decoupling capacitors integrated therein, the at least one interposer structure being configured to allow for one or more of the plurality of decoupling capacitors to be selectively deactivated. In another aspect, a method of fabricating an electronic device comprising at least one interposer structure having one or more vias and a plurality of decoupling capacitors integrated therein comprises the following step. One or more of the plurality of decoupling capacitors are selectively deactivated.

Abstract translation: 提供电子器件制造技术。 一方面，提供一种电子设备。 电子设备包括具有一个或多个通孔和集成在其中的多个去耦电容器的至少一个插入器结构，所述至少一个插入器结构被配置为允许选择性地去激活多个去耦电容器中的一个或多个。 在另一方面，一种制造电子器件的方法，包括至少一个具有一个或多个通孔的内插器结构和集成在其中的多个去耦电容器，其包括以下步骤。 选择性地去激活多个去耦电容器中的一个或多个。

公开(公告)号：US20080116537A1

公开(公告)日：2008-05-22

申请号：US11560882

申请日：2006-11-17

Applicant: James W. Adkisson ,  Jeffrey P. Gambino ,  Zhong-Xiang He ,  Mark D. Jaffe ,  Robert K. Leidy ,  Stephen E. Luce ,  Richard J. Rassel ,  Edmund J. Sprogis

Inventor： James W. Adkisson ,  Jeffrey P. Gambino ,  Zhong-Xiang He ,  Mark D. Jaffe ,  Robert K. Leidy ,  Stephen E. Luce ,  Richard J. Rassel ,  Edmund J. Sprogis

IPC: H01L27/146 ,  H01L21/04

CPC classification number: H01L27/14687 ,  H01L27/14618 ,  H01L27/14621 ,  H01L27/14627 ,  H01L27/14632 ,  H01L27/14685 ,  H01L2224/05001 ,  H01L2224/05008 ,  H01L2224/05124 ,  H01L2224/05548 ,  H01L2224/05569 ,  H01L2224/05647 ,  H01L2224/13 ,  H01L2924/00014

Abstract: A CMOS image sensor array and method of fabrication. The CMOS imager sensor array comprises a substrate; an array of light receiving pixel structures formed above the substrate, the array having formed therein “m” levels of conductive structures, each level formed in a corresponding interlevel dielectric material layer; a dense logic wiring region formed adjacent to the array of light receiving pixel structures having “n” levels of conductive structures, each level formed in a corresponding interlevel dielectric material layer, where n>m. A microlens array having microlenses and color filters formed above the interlevel dielectric material layer, a microlens and respective color filter in alignment with a respective light receiving structure formed at a surface of the substrate. A top surface of the interlevel dielectric material layer beneath the microlens array is recessed from a top surface of the interlevel dielectric material layers of the dense logic wiring region.

Abstract translation: CMOS图像传感器阵列及其制造方法。 CMOS成像器传感器阵列包括衬底; 形成在衬底上方的光接收像素结构的阵列，阵列中形成有“m”级的导电结构，每个级形成在相应的层间介电材料层中; 与具有“n”级的导电结构的光接收像素结构的阵列相邻形成的密集的逻辑布线区域，每个层级形成在相应的层间电介质材料层中，其中n> m。 具有形成在层间电介质材料层上方的微透镜和滤色器的微透镜阵列，与形成在衬底表面处的各个光接收结构对准的微透镜和相应的滤色器。 微透镜阵列下面的层间介电材料层的顶表面从密集逻辑布线区域的层间介电材料层的顶表面凹陷。

公开(公告)号：US07052925B2

公开(公告)日：2006-05-30

申请号：US10709039

申请日：2004-04-08

Applicant: William J. Murphy ,  Edmund J. Sprogis ,  Anthony K. Stamper ,  Erick G. Walton

Inventor： William J. Murphy ,  Edmund J. Sprogis ,  Anthony K. Stamper ,  Erick G. Walton

IPC: H01L31/26

CPC classification number: H01L28/20 ,  H01L27/0802 ,  Y10T29/49082 ,  Y10T29/49085

Abstract: A method for manufacturing a self-compensating resistor within an integrated circuit is disclosed. The self-compensating resistor includes a first resistor and a second resistor. The first resistor having a first resistance value is initially formed, and then the second resistor having a second resistance value is subsequently formed. The second resistor is connected in series with the first resistor. The second resistance value is less than the first resistance value, but the total resistance value of the first and second resistors lies beyond a desired target resistance range. Finally, an electric current is sent to the second resistor to change the dimension of the second resistor such that the total resistance value of the first and second resistors falls within the desired target resistance range.

Abstract translation: 公开了一种在集成电路内制造自补偿电阻器的方法。 自补偿电阻器包括第一电阻器和第二电阻器。 初始形成具有第一电阻值的第一电阻器，然后形成具有第二电阻值的第二电阻器。 第二个电阻与第一个电阻串联。 第二电阻值小于第一电阻值，但是第一和第二电阻器的总电阻值超过期望的目标电阻范围。 最后，向第二电阻器发送电流以改变第二电阻器的尺寸，使得第一和第二电阻器的总电阻值落在期望的目标电阻范围内。