Electroplated wire layout for package sawing
    13.
    发明申请
    Electroplated wire layout for package sawing 有权
    用于包装锯切的电镀线布局

    公开(公告)号:US20060027918A1

    公开(公告)日:2006-02-09

    申请号:US10911585

    申请日:2004-08-05

    IPC分类号: H01L23/34

    摘要: An electroplated wire layout for package sawing comprises a substrate with a plurality of chip arrays disposed thereon. A kerf having two scribe lines is disposed between every two chip arrays. Several solder ball pads corresponding to the chip arrays are disposed on a back surface of the substrate. Each solder ball pad has a solder ball electroplated wire extended into a kerf. There is also a kerf electroplated wire disposed in each kerf and above the scribe lines of the kerf in a zigzag way. The kerf electroplated wire is connected with the solder ball pad electroplated wires to achieve electric connection. By changing the shape of the kerf electroplated wire, the kerf electroplated wire can be easily cut off to enhance the yield and reliability and also lower the cost.

    摘要翻译: 用于包装锯切的电镀线布局包括其上布置有多个芯片阵列的基板。 在每两个芯片阵列之间设置具有两个划痕线的切口。 对应于芯片阵列的几个焊球垫设置在基板的背面上。 每个焊球垫具有延伸到切口中的焊球电镀丝。 还有一个切口电镀线,以锯齿形的方式设置在每个切口上并且在切口的划线之上。 切割电镀线与焊球电镀线连接,实现电连接。 通过改变切口电镀线的形状,切割电镀线可以容易地切断,以提高产量和可靠性,并降低成本。

    Stacked chip scale package structure
    16.
    发明授权
    Stacked chip scale package structure 有权
    堆叠芯片级封装结构

    公开(公告)号:US06633086B1

    公开(公告)日:2003-10-14

    申请号:US10162910

    申请日:2002-06-06

    IPC分类号: H01L2348

    摘要: The present invention provides a stacked chip scale package structure, wherein a lower chip and an upper chip are stacked on a substrate. Two rows of bonding pads are disposed on each of the upper and lower chips. The bonding pads on the upper and lower chips are parallel arranged. At least a dummy die is disposed below the suspended portion of the upper chip and at the side of the lower chip as a support during wire bonding. A gap is reserved between the dummy die and the lower chip. The present invention utilizes the design of dummy die to resolve the problem of die crack caused by wire bonding of suspended chip. Therefore, the present invention can flexibly adjust the size and installation direction of the upper chip to meet the requirement of substrate layout, and can also shorten the trace length on the substrate to enhance the electric performance thereof.

    摘要翻译: 本发明提供一种堆叠式芯片级封装结构,其中下部芯片和上部芯片堆叠在基板上。 两排接合焊盘设置在上和下芯片的每一个上。 上芯片和下芯片上的焊盘平行布置。 在引线接合期间,至少一个虚设裸片设置在上芯片的悬挂部分下方和下芯片的侧面作为支撑。 在虚设管芯和下部芯片之间保留间隙。 本发明利用虚拟模具的设计来解决悬挂芯片引线接合引起的模具裂纹问题。 因此,本发明可以灵活地调节上芯片的尺寸和安装方向,以满足基板布局的要求,并且还可以缩短基板上的走线长度以增强其电气性能。

    Structure of plated wire of fiducial marks for die-dicing package
    20.
    发明授权
    Structure of plated wire of fiducial marks for die-dicing package 有权
    用于芯片切割封装的基准电镀线的结构

    公开(公告)号:US06570263B1

    公开(公告)日:2003-05-27

    申请号:US10162912

    申请日:2002-06-06

    IPC分类号: H01L23544

    摘要: The present invention provides a design structure of an plated wire of a fiducial mark for a die-dicing package. In the present structure, a cutting line is positioned between each two adjacent ball grid array (BGA) chips. There is configured a solder mask opening at the edge connecting region of the cutting lines. A fiducial mark is positioned in the opening of each BGA chip, wherein the fiducial mark is close to the cutting line and positioned a plated wire therein to pull from the fiducial mark to out the opening and to connect to the plated wire of the cutting line. So as all the plated wires utilizing the coverage of the solder mask can be entirely cut without the pulling problem from the cutter. The present invention provides a new design structure of the plated wire to overcome the burr effect of prior die dicing so as to enhance the product efficiency and decrease the manufacturing cost.

    摘要翻译: 本发明提供了用于芯片划片封装的基准标记的电镀线的设计结构。 在本结构中,切割线位于每个两个相邻的球栅阵列(BGA)芯片之间。 在切割线的边缘连接区域处设置有焊接掩模开口。 每个BGA芯片的开口中都有一个基准标记,其中基准标记靠近切割线,并将电镀线放置在其中以从基准标记拉出开口,并连接到切割线的电镀线 。 因此,利用焊接掩模的覆盖的所有电镀线可以完全切割而不会从切割器引起问题。 本发明提供了一种电镀线的新设计结构,以克服现有的芯片切割的毛刺效应,从而提高产品效率并降低制造成本。