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公开(公告)号:US11254563B2
公开(公告)日:2022-02-22
申请号:US15962912
申请日:2018-04-25
Applicant: Intel Corporation
Inventor: Omkar G. Karhade , Nitin A. Deshpande
Abstract: Embodiments include a microelectronic device package structure having a die on a substrate, where a first side of the die is electrically coupled to the substrate, and a second side of the die is covered with a first material having a first thermal conductivity. A second material is adjacent to a sidewall of the die and adjacent to a sidewall of the first material. The second material has second thermal conductivity, smaller than the first thermal conductivity. The second material may have mechanical and/or underfill properties superior to those of the first material. Together, the two materials may provide a package structure having enhanced thermal and mechanical performance.
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公开(公告)号:US20210391263A1
公开(公告)日:2021-12-16
申请号:US16902958
申请日:2020-06-16
Applicant: Intel Corporation
Inventor: Bai Nie , Gang Duan , Omkar G. Karhade , Nitin A. Deshpande , Yikang Deng , Wei-Lun Jen , Tarek A. Ibrahim , Sri Ranga Sai Boyapati , Robert Alan May , Yosuke Kanaoka , Robin Shea McRee , Rahul N. Manepalli
IPC: H01L23/538 , H01L21/48
Abstract: Disclosed herein are microelectronic structures including bridges, as well as related assemblies and methods. In some embodiments, a microelectronic structure may include a substrate and a bridge.
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公开(公告)号:US20210066265A1
公开(公告)日:2021-03-04
申请号:US16553544
申请日:2019-08-28
Applicant: Intel Corporation
Inventor: Feras Eid , Aleksandar Aleksov , Telesphor Kamgaing , Georgios Dogiamis , Johanna M. Swan , Sivakumar Nagarajan , Nitin A. Deshpande , Omkar G. Karhade , William James Lambert
Abstract: Disclosed herein are tunable capacitor arrangements in integrated circuit (IC) package substrates, as well as related methods and devices. For example, in some embodiments, an IC package substrate may include a first embedded capacitor, a second embedded capacitor, and a fuse electrically coupled between the first embedded capacitor and the second embedded capacitor such that when the fuse is in a closed state, the first embedded capacitor and the second embedded capacitor are connected in parallel, and when the fuse is in an open state, the first embedded capacitor and the second embedded capacitor are not connected in parallel.
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公开(公告)号:US20190157205A1
公开(公告)日:2019-05-23
申请号:US16254126
申请日:2019-01-22
Applicant: INTEL CORPORATION
Inventor: Nitin A. Deshpande , Omkar G. Karhade
IPC: H01L23/538 , H01L23/13 , H01L23/522 , H01L21/48 , H01L23/00 , H01L25/065 , H01L25/00
CPC classification number: H01L23/5383 , H01L21/486 , H01L23/13 , H01L23/522 , H01L23/5381 , H01L23/5384 , H01L23/5385 , H01L24/97 , H01L25/0652 , H01L25/0655 , H01L25/50 , H01L2224/0401 , H01L2224/0557 , H01L2224/06181 , H01L2224/14 , H01L2224/16145 , H01L2224/16227 , H01L2224/16238 , H01L2224/1703 , H01L2225/0651 , H01L2225/06513 , H01L2225/06541 , H01L2924/15153 , H01L2924/15192
Abstract: A microelectronic structure includes a substrate having a first surface and a cavity extending into the substrate from the substrate first surface, a first microelectronic device and a second microelectronic device attached to the substrate first surface, and a bridge disposed within the substrate cavity and attached to the first microelectronic device and to the second microelectronic device. The bridge includes a plurality conductive vias extending from a first surface to an opposing second surface of the bridge, wherein the conductive vias are electrically coupled to deliver electrical signals from the substrate to the first microelectronic device and the second microelectronic device. The bridge further creates at least one electrical signal connection between the first microelectronic device and the second microelectronic device.
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公开(公告)号:US10229882B2
公开(公告)日:2019-03-12
申请号:US15668179
申请日:2017-08-03
Applicant: INTEL CORPORATION
Inventor: Nitin A. Deshpande , Omkar G. Karhade
IPC: H01L23/538 , H01L23/13 , H01L23/522 , H01L21/48 , H01L23/00 , H01L25/065 , H01L25/00
Abstract: A microelectronic structure includes a substrate having a first surface and a cavity extending into the substrate from the substrate first surface, a first microelectronic device and a second microelectronic device attached to the substrate first surface, and a bridge disposed within the substrate cavity and attached to the first microelectronic device and to the second microelectronic device. The bridge includes a plurality conductive vias extending from a first surface to an opposing second surface of the bridge, wherein the conductive vias are electrically coupled to deliver electrical signals from the substrate to the first microelectronic device and the second microelectronic device. The bridge further creates at least one electrical signal connection between the first microelectronic device and the second microelectronic device.
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公开(公告)号:US09275955B2
公开(公告)日:2016-03-01
申请号:US14132774
申请日:2013-12-18
Applicant: INTEL CORPORATION
Inventor: Ravindranath V. Mahajan , Christopher J. Nelson , Omkar G. Karhade , Feras Eid , Nitin A. Deshpande , Shawna M. Liff
IPC: H01L23/28 , H01L23/538 , H01L25/00 , H01L25/16 , H01L23/00 , H01L23/367 , H01L23/14 , H01L23/31 , H01L23/433 , H01L23/498 , H01L21/56
CPC classification number: H01L23/5381 , H01L21/563 , H01L21/568 , H01L23/145 , H01L23/3114 , H01L23/3128 , H01L23/367 , H01L23/3675 , H01L23/4334 , H01L23/49816 , H01L23/49827 , H01L23/5389 , H01L24/16 , H01L24/17 , H01L24/19 , H01L24/24 , H01L24/73 , H01L24/81 , H01L24/92 , H01L25/0657 , H01L25/165 , H01L25/50 , H01L2224/0401 , H01L2224/04105 , H01L2224/12105 , H01L2224/16145 , H01L2224/16225 , H01L2224/16227 , H01L2224/16265 , H01L2224/17181 , H01L2224/24145 , H01L2224/24245 , H01L2224/291 , H01L2224/29109 , H01L2224/29111 , H01L2224/29113 , H01L2224/29116 , H01L2224/2912 , H01L2224/29139 , H01L2224/29144 , H01L2224/2919 , H01L2224/32225 , H01L2224/32245 , H01L2224/73209 , H01L2224/73253 , H01L2224/73259 , H01L2224/73267 , H01L2224/81005 , H01L2224/92124 , H01L2224/92224 , H01L2224/92242 , H01L2224/92244 , H01L2225/06513 , H01L2225/06517 , H01L2225/06541 , H01L2225/06565 , H01L2924/12042 , H01L2924/1432 , H01L2924/1433 , H01L2924/1434 , H01L2924/15192 , H01L2924/181 , H01L2924/18161 , H01L2924/18162 , H01L2924/19041 , H01L2924/19042 , H01L2924/19043 , H01L2924/19104 , H01L2924/014 , H01L2924/00 , H01L2924/0665
Abstract: Embodiments of the present disclosure are directed towards an integrated circuit (IC) package having first and second dies with first and second input/output (I/O) interconnect structures, respectively. The IC package may include a bridge having first and second electrical routing features coupled to a portion of the first and second I/O interconnect structures, respectively. In embodiments, the first and second electrical routing features may be disposed on one side of the bridge; and third electrical routing features may be disposed on an opposite side. The first and second electrical routing features may be configured to route electrical signals between the first die and the second die and the third electrical routing features may be configured to route electrical signals between the one side and the opposite side. The first die, the second die, and the bridge may be embedded in electrically insulating material. Other embodiments may be described and/or claimed.
Abstract translation: 本公开的实施例涉及具有分别具有第一和第二输入/输出(I / O)互连结构的第一和第二裸片的集成电路(IC)封装。 IC封装可以包括具有分别耦合到第一和第二I / O互连结构的一部分的第一和第二电路由特征的桥。 在实施例中,第一和第二电路由特征可以设置在桥的一侧; 并且第三电路布线特征可以设置在相对侧上。 第一和第二电路由特征可以被配置为在第一管芯和第二管芯之间路由电信号,并且第三电路由特征可以被配置为在一侧和相对侧之间路由电信号。 第一管芯,第二管芯和桥可以嵌入电绝缘材料中。 可以描述和/或要求保护其他实施例。
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公开(公告)号:US20150163904A1
公开(公告)日:2015-06-11
申请号:US14102757
申请日:2013-12-11
Applicant: Intel Corporation
Inventor: Omkar G. Karhade , John S. Guzek , Johanna M. Swan , Christopher J. Nelson , Nitin A. Deshpande , William J. Lambert , Charles A. Gealer , Feras Eid , Islam A. Salama , Kemal Aygun , Sasha N. Oster , Tyler N. Osborn
CPC classification number: H01L25/16 , H01L23/5383 , H01L23/5386 , H01L23/5387 , H01L24/50 , H01L24/86 , H01L25/00 , H01L25/0655 , H01L2224/0405 , H01L2224/04105 , H01L2224/05568 , H01L2224/056 , H01L2224/05647 , H01L2224/29078 , H01L2224/86203 , H01L2224/86815 , H05K1/185 , Y10T29/49155 , H01L2924/00014 , H01L2924/014
Abstract: A microelectronic package of the present description may comprises a first microelectronic device having at least one row of connection structures electrically connected thereto and a second microelectronic device having at least one row of connection structures electrically connected thereto, wherein the connection structures within the at least one first microelectronic device row are aligned with corresponding connection structures within the at least one second microelectronic device row in an x-direction. An interconnect comprising an interconnect substrate having a plurality of electrically isolated conductive traces extending in the x-direction on a first surface of the interconnect substrate may be attached to the at least one first microelectronic device connection structure row and the at least one second microelectronic device connection structure row, such that at least one interconnect conductive trace forms a connection between a first microelectronic device connection structure and its corresponding second microelectronic device connection structure.
Abstract translation: 本说明书的微电子封装可以包括具有与其电连接的至少一行连接结构的第一微电子器件和具有与其电连接的至少一排连接结构的第二微电子器件,其中所述至少一个 第一微电子器件行与X方向上的至少一个第二微电子器件行内的对应连接结构对准。 包括具有在互连衬底的第一表面上沿x方向延伸的多个电隔离导电迹线的互连衬底的互连可以附接到所述至少一个第一微电子器件连接结构行和所述至少一个第二微电子器件 连接结构行,使得至少一个互连导电迹线形成第一微电子器件连接结构与其对应的第二微电子器件连接结构之间的连接。
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公开(公告)号:US20250062278A1
公开(公告)日:2025-02-20
申请号:US18452152
申请日:2023-08-18
Applicant: Intel Corporation
Inventor: Sagar Suthram , Debendra Mallik , Wilfred Gomes , Pushkar Sharad Ranade , Nitin A. Deshpande , Ravindranath Vithal Mahajan , Abhishek A. Sharma , Joshua Fryman , Stephen Morein , Matthew Adiletta , Michael Crocker , Aaron Gorius
IPC: H01L25/065 , H01L23/00 , H01L23/522
Abstract: Embodiments of a microelectronic assembly may include a first integrated circuit (IC) die having a first surface, a second surface opposite the first surface, and a third surface orthogonal to the first and second surfaces, the first IC die including a conductive trace that is parallel to the first and second surfaces, and the conductive trace is exposed at the third surface; and a second IC die including a fourth surface, wherein the fourth surface of the second IC die is electrically coupled to the third surface of the first IC die by an interconnect including solder.
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公开(公告)号:US12181710B2
公开(公告)日:2024-12-31
申请号:US17237375
申请日:2021-04-22
Applicant: Intel Corporation
Inventor: Omkar G. Karhade , Xiaoqian Li , Tarek A. Ibrahim , Ravindranath Vithal Mahajan , Nitin A. Deshpande
Abstract: Photonic packages and device assemblies that include photonic integrated circuits (PICs) coupled to optical lenses on lateral sides of the PICs. An example photonic package comprises a package support, an integrated circuit (IC), an insulating material, a PIC having an active side and a lateral side substantially perpendicular to the active side. At least one optical structure is on the active side. A substantial portion of the active side is in contact with the insulating material, and the PIC is electrically coupled to the package support and to the IC. The photonic package further includes an optical lens coupled to the PIC on the lateral side. In some embodiments, the photonic package further includes an interposer between the PIC or the IC and the package support.
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公开(公告)号:US20240319437A1
公开(公告)日:2024-09-26
申请号:US18189844
申请日:2023-03-24
Applicant: Intel Corporation
Inventor: Xiaoqian Li , Omkar G. Karhade , Nitin A. Deshpande , Julia Chiu , Chia-Pin Chiu , Kaveh Hosseini , Madhubanti Chatterjee
CPC classification number: G02B6/12002 , G02B6/136
Abstract: A photonic integrated circuit (PIC), a semiconductor assembly including the PIC, a multi-chip package including the PIC, and a method of forming the PIC. The PIC includes a PIC substrate, and a semiconductor layer on a top surface of the PIC substrate and including a semiconductor material and an optical component. The PIC substrate defines an air cavity therein extending in a direction from a bottom surface of the PIC substrate toward and in registration with the optical component. The semiconductor layer is free of any opening therethrough in communication with the air cavity.
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