摘要:
Systems and methods for preventing damage to a unit with preventive structures are presented. In an embodiment, a unit of a collection of units includes a functional area and a preventive structure configured to prevent cracks from propagating into the functional area.
摘要:
Embodiments of the present invention are directed to a wireless-enabled component (WEC) for enabling a wireless bus for intra-chip and inter-chip communication. A WEC encompasses a functional block of an IC (such as, for example, a processing core of a processing unit), an entire IC (such as, for example, a processing unit), or a device that includes a plurality of ICs (such as, for example, a handheld device). According to embodiments, a WEC may be associated with one or more sub-blocks of an IC, a single IC, or a plurality of ICs.
摘要:
Methods, systems, and apparatuses for integrated circuit packages and lead frames are provided. A quad flat no-lead (QFN) package includes a plurality of peripherally positioned pins, a die-attach paddle, an integrated circuit die, and an encapsulating material. The die-attach paddle is positioned within a periphery formed by the pins. The die is attached to the die-attach paddle. The encapsulating material encapsulates the die on the die-attach paddle, encapsulates bond wires connected between the die and the pins, and fills a space between the pins and the die-attach paddle. One or more of the pins are extended. An extended pin may be elongated, L shaped, T shaped, or “wishbone” shaped. The extended pin(s) enable wire bonding of additional ground, power, and I/O (input/output) pads of the die in a manner that does not significantly increase QFN package cost.
摘要:
Electrically, mechanically, and thermally enhanced ball grid array (BGA) packages are described. A substrate has a surface, wherein the surface has an opening therein. A stiffener has a surface coupled to the surface of the substrate. An area of the surface of the stiffener can be greater than, equal to, or less than an area of the surface of the substrate. A thermal connector is coupled to the surface of the stiffener through the opening. A surface of the thermal connector is capable of attachment to a printed circuit board (PCB) when the BGA package is mounted to the PCB. The thermal connector can have a height such that the thermal connector extends into a cavity formed in a surface of the PCB when the BGA package is mounted to the PCB. Alternatively, the stiffener and thermal connector may be combined into a single piece stiffener, wherein the stiffener has a protruding portion. The protruding portion extends through the opening when the stiffener is coupled to the substrate, and is capable of attachment to the PCB.
摘要:
Methods and apparatus for improved electrical, mechanical and thermal performance of stacked IC packages are described. An IC package comprises a substrate, a first die, a second die, and an interposer with an opening in a first surface of the interposer configured to accommodate the first die. The first IC die is attached a first surface of the substrate. The interposer is mounted on the first surface of the substrate such that the first IC die is placed within the opening in the interposer. The second die is mounted on a second surface of the interposer. Wire bonds couple bond pads on the first surfaces of IC die are coupled to the first surface of the substrate. A mold compound encapsulates the first IC die, the second IC die, the interposer and the wire bonds.
摘要:
Methods and apparatuses for improved integrated circuit (IC) packages are described herein. In an aspect, an IC device package includes an IC die having a contact pad, where the contact pad is located on a hotspot of the IC die. The hotspot is thermally coupled to a thermal interconnect member. In an aspect, the package is encapsulated in a mold compound. In a further aspect, a heat spreader is attached to the mold compound, and is thermally coupled to the thermal interconnect member. In another aspect, a thermal interconnect member thermally is coupled between the heat spreader and the substrate.
摘要:
Methods and apparatus for improved thermal performance and electromagnetic interference (EMI) shielding in integrated circuit (IC) packages is described. A die-up or die-down package includes first and second caps defining a cavity, an IC die, and a leadframe. The leadframe includes a centrally located die attach pad, a plurality of leads, and a plurality of tie bars that couple the die attach pad to the leads. The IC die is mounted to the die attach pad. Planar rim portions of the first and second caps that surround the cavity are coupled to the leadframe. The first and second caps and the leadframe form an enclosure structure that substantially encloses the IC die, and shields EMI emanating from and radiating towards the IC die. The enclosure structure also dissipates heat generated by the IC die during operation.
摘要:
Apparatuses, methods, and systems for improved integrated circuit packages are described. An integrated circuit (IC) package includes a substrate having opposing first and second surfaces, an IC die, a plurality of conductive elements, and an encapsulating material. The substrate has a plurality of contact pads on the first surface that are electrically coupled to a plurality of electrically conductive features on the second surface. The plurality of conductive elements is formed on the first surface of the substrate. The IC die is located on the first surface of the substrate. The encapsulating material encapsulates the IC die and a portion of each element of the plurality of conductive elements.
摘要:
An apparatus and method for a wire-bond die-up area array package is described. The package includes an integrated circuit (IC) die, a substrate, and a thermally conducting body. A bottom surface of the IC die is exposed through an opening in a central region of the substrate. The die is mounted to the thermally conducting body. A bottom surface of the thermally conducting body is configured to be connected to a circuit board, such as a PWB, when the package is mounted to the circuit board. The bottom surface of the thermally conducting body may be connected directly to the circuit board, or may be coupled to the circuit board via solder balls or other mechanism. One or more wirebonds are used to electrically connect the die to a top surface of the substrate. A mold compound encapsulates the die, the wirebonds, and at least a portion of the top surface of the substrate, and fills a gap between peripheral edges of the IC die and inner walls of the substrate central window opening. A matrix of solder balls is attached to a bottom surface of the substrate.
摘要:
An exemplary implementation of the present disclosure includes a testable semiconductor package that includes an active die having interface contacts and dedicated testing contacts. An interposer is situated adjacent a bottom surface of the active die, the interposer providing electrical connections between the interface contacts and a bottom surface of the testable semiconductor package. At least one conductive medium provides electrical connection between at least one of the dedicated testing contacts and a top surface of the testable semiconductor package. The at least one conductive medium can be coupled to a package-top testing connection, which may include a solder ball.