公开(公告)号：US10460958B2

公开(公告)日：2019-10-29

申请号：US14870823

申请日：2015-09-30

Applicant: Invensas Corporation

Inventor： Ilyas Mohammed ,  Belgacem Haba

IPC: H01L21/56 ,  H01L21/48 ,  H05K7/00 ,  H01L23/538 ,  H01L23/00 ,  H05K1/18 ,  H01L25/10

Abstract: Microelectronic assemblies and methods of making the same are disclosed. In some embodiments, a microelectronic assembly includes a microelectronic element having edge surfaces bounding a front surface and contacts at the front surface; rigid metal posts disposed between at least one edge surface and a corresponding edge of the assembly, each metal post having a sidewall separating first and second end surfaces, the sidewalls have a root mean square (rms) surface roughness of less than about 1 micron; a encapsulation contacting at least the edge surfaces and the sidewalls; an insulation layer overlying the encapsulation; connection elements extending through the insulation layer, wherein at least some connection elements have cross sections smaller than those of the metal posts; a redistribution structure deposited on the insulation layer and electrically connecting first terminals with corresponding metal posts through the first connection elements, some metal posts electrically coupled with contacts of microelectronic element.

公开(公告)号：US20190272802A1

公开(公告)日：2019-09-05

申请号：US16292705

申请日：2019-03-05

Applicant: Invensas Corporation

Inventor： Belgacem Haba ,  Ilyas Mohammed ,  Rajesh Katkar

IPC: G09G5/00 ,  G02B27/01

Abstract: A virtual reality/augmented reality (VR/AR) headset system (including the capability for one or both of virtual reality and augmented reality) includes a remote optical engine. The remote disposition of the optical engine removes many or all of the components of the VR/AR headset system that add weight, heat, and other characteristics that can add to user discomfort in using the system from the headset. An electronic image is received and/or generated remotely at the optical engine, and is transmitted optically from the remote location to the headset to be viewed by the user. One or more optical waveguides may be used to transmit the electronic image to one or more passive displays of the headset, from the remote optical engine.

公开(公告)号：US10290589B2

公开(公告)日：2019-05-14

申请号：US15346397

申请日：2016-11-08

Applicant: Invensas Corporation

Inventor： Belgacem Haba ,  Ilyas Mohammed

IPC: H01L23/495 ,  H01L23/00 ,  H01L23/498 ,  H01L21/56 ,  H01L23/31 ,  H01L25/065 ,  H01L23/538 ,  H01L21/48

Abstract: A foldable microelectronic assembly and a method for forming the same are provided. One or more packages comprising encapsulated microelectronic elements are formed, along with a compliant layer. The packages and the compliant layer are coupled to a redistribution layer. The compliant layer and the redistribution layer are bent such that the redistribution layer is non-planar.

公开(公告)号：US20180301350A1

公开(公告)日：2018-10-18

申请号：US15873218

申请日：2018-01-17

Applicant: Invensas Corporation

Inventor： Belgacem Haba ,  Ilyas Mohammed ,  Rajesh Katkar

IPC: H01L21/48 ,  H01L21/56 ,  H01L21/78 ,  H01L23/538 ,  H01L23/498 ,  H01L23/00 ,  H01L25/10

Abstract: Fan-out wafer level packages with resist vias are provided. In an implementation, an example wafer level process or panel fabrication process includes adhering a die to a carrier, applying a temporary resist layer over the die and the carrier, developing the resist layer to form channels or spaces, filling the channels or the spaces with a molding material, removing the remaining resist to create vias in the molding material, and metalizing the vias in the molding material to provide conductive vias for the microelectronics package. The methods automatically create good via and pad alignment. In another implementation, an example process includes adhering a die to a carrier, applying a permanent resist layer over the die and the carrier, developing the resist layer to form vias in the resist layer, and metalizing the vias in the remaining resist of the permanent resist layer to provide conductive vias for the microelectronics package. Assemblies may be constructed with the semiconductor dies face-up or face-down. One or more redistribution layers (RDLs) may be built on one or both sides of an assembly with resist vias.

公开(公告)号：US20180233448A1

公开(公告)日：2018-08-16

申请号：US15951925

申请日：2018-04-12

Applicant: Invensas Corporation

Inventor： Ilyas Mohammed

IPC: H01L23/522 ,  H01L25/10 ,  H01L25/065 ,  H01L23/00 ,  H01L23/538 ,  H01L21/768 ,  H01L21/56 ,  H05K3/40

CPC classification number: H01L23/5226 ,  H01L21/563 ,  H01L21/568 ,  H01L21/76877 ,  H01L21/76892 ,  H01L23/5389 ,  H01L24/06 ,  H01L24/18 ,  H01L24/19 ,  H01L24/20 ,  H01L24/45 ,  H01L24/49 ,  H01L24/96 ,  H01L25/0657 ,  H01L25/105 ,  H01L2224/04042 ,  H01L2224/04105 ,  H01L2224/32145 ,  H01L2224/32245 ,  H01L2224/45101 ,  H01L2224/45124 ,  H01L2224/45139 ,  H01L2224/45144 ,  H01L2224/45147 ,  H01L2224/45155 ,  H01L2224/45565 ,  H01L2224/45624 ,  H01L2224/45655 ,  H01L2224/45664 ,  H01L2224/45669 ,  H01L2224/4569 ,  H01L2224/48 ,  H01L2224/49 ,  H01L2224/73267 ,  H01L2225/06524 ,  H01L2225/06548 ,  H01L2225/06558 ,  H01L2225/1035 ,  H01L2225/1052 ,  H01L2225/1058 ,  H01L2924/00011 ,  H01L2924/00012 ,  H01L2924/00014 ,  H01L2924/12042 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/18162 ,  H01L2924/182 ,  H01L2924/191 ,  H01L2924/19107 ,  H05K3/4046 ,  H05K2201/10287 ,  H05K2203/1461 ,  H01L2924/00 ,  H01L2924/014 ,  H01L2924/01049

Abstract: A method for making a microelectronic unit includes forming a plurality of wire bonds on a first surface in the form of a conductive bonding surface of a structure comprising a patternable metallic element. The wire bonds are formed having bases joined to the first surface and end surfaces remote from the first surface. The wire bonds have edge surfaces extending between the bases and the end surfaces. The method also includes forming a dielectric encapsulation layer over a portion of the first surface of the conductive layer and over portions of the wire bonds such that unencapsulated portions of the wire bonds are defined by end surfaces or portions of the edge surfaces that are unconvered by the encapsulation layer. The metallic element is patterned to form first conductive elements beneath the wire bonds and insulated from one another by portions of the encapsulation layer.

公开(公告)号：US09842745B2

公开(公告)日：2017-12-12

申请号：US14600595

申请日：2015-01-20

Applicant: Invensas Corporation

Inventor： Ilyas Mohammed ,  Masud Beroz

IPC: H01L21/48 ,  H01L23/14 ,  H01L23/00 ,  H01L21/52 ,  H01L21/768 ,  H01L23/495

CPC classification number: H01L21/4853 ,  H01L21/486 ,  H01L21/52 ,  H01L21/768 ,  H01L23/142 ,  H01L23/49568 ,  H01L24/97 ,  H01L2224/16225 ,  H01L2224/45124 ,  H01L2224/45139 ,  H01L2224/45144 ,  H01L2224/45147 ,  H01L2224/48091 ,  H01L2224/48472 ,  H01L2224/73265 ,  H01L2924/01322 ,  H01L2924/12041 ,  H01L2924/19107 ,  H01L2924/00014 ,  H01L2924/00 ,  H01L2924/00011

Abstract: Heat spreading substrate with embedded interconnects. In an embodiment in accordance with the present invention, an apparatus includes a metal parallelepiped comprising a plurality of wires inside the metal parallelepiped. The plurality of wires have a different grain structure than the metal parallelepiped. The plurality of wires are electrically isolated from the metal parallelepiped. The plurality of wires may be electrically isolated from one another.

公开(公告)号：US09812433B2

公开(公告)日：2017-11-07

申请号：US15153188

申请日：2016-05-12

Applicant: Invensas Corporation

Inventor： Belgacem Haba ,  Ilyas Mohammed ,  Liang Wang

IPC: H01L23/48 ,  H01L25/00 ,  H01L25/10 ,  H01L21/56 ,  H01L23/00 ,  H01L23/538 ,  H01L23/13 ,  H01L23/31 ,  H01L25/065 ,  H01L23/498

CPC classification number: H01L25/50 ,  H01L21/56 ,  H01L21/561 ,  H01L21/565 ,  H01L23/13 ,  H01L23/3157 ,  H01L23/49816 ,  H01L23/49827 ,  H01L23/5389 ,  H01L24/17 ,  H01L24/81 ,  H01L25/0657 ,  H01L25/105 ,  H01L2224/131 ,  H01L2224/13109 ,  H01L2224/13111 ,  H01L2224/1329 ,  H01L2224/133 ,  H01L2224/16227 ,  H01L2224/32225 ,  H01L2224/48227 ,  H01L2224/4824 ,  H01L2224/73204 ,  H01L2224/73265 ,  H01L2224/81805 ,  H01L2224/92125 ,  H01L2225/06524 ,  H01L2225/06527 ,  H01L2225/06544 ,  H01L2225/06582 ,  H01L2225/1023 ,  H01L2225/1041 ,  H01L2225/1058 ,  H01L2924/15333 ,  H01L2924/014 ,  H01L2924/00

Abstract: A microelectronic assembly can be made by joining first and second subassemblies by electrically conductive masses to connect electrically conductive elements on support elements of each subassembly. A patterned layer of photo-imageable material may overlie a surface of one of the support elements and have openings with cross-sectional dimensions which are constant or monotonically increasing with height from the surface of that support element, where the masses extend through the openings and have dimensions defined thereby. An encapsulation can be formed by flowing an encapsulant into a space between the joined first and second subassemblies.

公开(公告)号：US20170207159A1

公开(公告)日：2017-07-20

申请号：US15477265

申请日：2017-04-03

Applicant: Invensas Corporation

Inventor： Rajesh Katkar ,  Cyprian Emeka Uzoh ,  Belgacem Haba ,  Ilyas Mohammed

IPC: H01L23/498 ,  H01L21/48 ,  H01L23/538 ,  H01L23/373 ,  H01L23/00 ,  H01L25/065

CPC classification number: H05K1/0306 ,  H01L21/481 ,  H01L21/4853 ,  H01L21/486 ,  H01L23/13 ,  H01L23/3731 ,  H01L23/49816 ,  H01L23/49827 ,  H01L23/49833 ,  H01L23/49838 ,  H01L23/49894 ,  H01L23/5381 ,  H01L23/5384 ,  H01L23/5385 ,  H01L23/5386 ,  H01L24/17 ,  H01L25/0655 ,  H01L25/0657 ,  H01L2224/16113 ,  H01L2224/16225 ,  H01L2224/16227 ,  H01L2224/16235 ,  H01L2225/06517 ,  H01L2225/0652 ,  H01L2225/06548 ,  H01L2225/06572 ,  H01L2225/06586 ,  H01L2225/06589 ,  H01L2225/1023 ,  H01L2225/107 ,  H01L2924/15192 ,  H01L2924/15311 ,  H01L2924/15331 ,  H05K1/09 ,  H05K1/112 ,  H05K1/115 ,  H05K3/4007 ,  H05K3/42 ,  H05K2201/09545 ,  H05K2201/10378 ,  H05K2203/0323

Abstract: Interposers and methods of making the same are disclosed herein. In one embodiment, an interposer includes a region having first and second oppositely facing surfaces and a plurality of pores, each pore extending in a first direction from the first surface towards the second surface, wherein alumina extends along a wall of each pore; a plurality of electrically conductive connection elements extending in the first direction, consisting essentially of aluminum and being electrically isolated from one another by at least the alumina; a first conductive path provided at the first surface for connection with a first component external to the interposer; and a second conductive path provided at the second surface for connection with a second component external to the interposer, wherein the first and second conductive paths are electrically connected through at least some of the connection elements.

公开(公告)号：US20170179046A1

公开(公告)日：2017-06-22

申请号：US15449993

申请日：2017-03-05

Applicant: Invensas Corporation

Inventor： Liang Wang ,  Ilyas Mohammed ,  Masud Beroz

IPC: H01L23/00 ,  H01L23/544 ,  H01L21/02

CPC classification number: H01L23/562 ,  H01L21/02002 ,  H01L21/02035 ,  H01L21/02378 ,  H01L21/02381 ,  H01L21/02389 ,  H01L21/02392 ,  H01L21/02395 ,  H01L21/02414 ,  H01L21/6835 ,  H01L23/544 ,  H01L24/19 ,  H01L24/32 ,  H01L24/83 ,  H01L25/50 ,  H01L27/0207 ,  H01L33/005 ,  H01L33/0062 ,  H01L2924/12041 ,  H01L2924/12042 ,  H01L2924/13091 ,  H01L2924/351 ,  H01L2924/00

Abstract: In accordance with a first method embodiment, a plurality of piggyback substrates are attached to a carrier substrate. The edges of the plurality of the piggyback substrates are bonded to one another. The plurality of piggyback substrates are removed from the carrier substrate to form a substrate assembly. The substrate assembly is processed to produce a plurality of integrated circuit devices on the substrate assembly. The processing may use manufacturing equipment designed to process wafers larger than individual instances of the plurality of piggyback substrates.

公开(公告)号：US20160260696A1

公开(公告)日：2016-09-08

申请号：US15153188

申请日：2016-05-12

Applicant: Invensas Corporation

Inventor： Belgacem Haba ,  Ilyas Mohammed ,  Liang Wang

IPC: H01L25/00 ,  H01L23/31 ,  H01L25/065

CPC classification number: H01L25/50 ,  H01L21/56 ,  H01L21/561 ,  H01L21/565 ,  H01L23/13 ,  H01L23/3157 ,  H01L23/49816 ,  H01L23/49827 ,  H01L23/5389 ,  H01L24/17 ,  H01L24/81 ,  H01L25/0657 ,  H01L25/105 ,  H01L2224/131 ,  H01L2224/13109 ,  H01L2224/13111 ,  H01L2224/1329 ,  H01L2224/133 ,  H01L2224/16227 ,  H01L2224/32225 ,  H01L2224/48227 ,  H01L2224/4824 ,  H01L2224/73204 ,  H01L2224/73265 ,  H01L2224/81805 ,  H01L2224/92125 ,  H01L2225/06524 ,  H01L2225/06527 ,  H01L2225/06544 ,  H01L2225/06582 ,  H01L2225/1023 ,  H01L2225/1041 ,  H01L2225/1058 ,  H01L2924/15333 ,  H01L2924/014 ,  H01L2924/00

Abstract: A microelectronic assembly can be made by joining first and second subassemblies by electrically conductive masses to connect electrically conductive elements on support elements of each subassembly. A patterned layer of photo-imageable material may overlie a surface of one of the support elements and have openings with cross-sectional dimensions which are constant or monotonically increasing with height from the surface of that support element, where the masses extend through the openings and have dimensions defined thereby. An encapsulation can be formed by flowing an encapsulant into a space between the joined first and second subassemblies.