Abstract:
An interconnection component (10) includes a first support portion (12) and has a plurality of first conductive vias (22) extending therethrough substantially perpendicular to surfaces thereof such that each via has a first end (26) adjacent a first surface (14) and a second end (24) adjacent a second surface (16). A second support portion (30) has a plurality of second conductive vias (40) extending therethrough substantially perpendicular to surfaces thereof such that each via has a first end (44) adjacent the first surface (34) and a second end (42) adjacent the second surface (32). A redistribution layer (50) is disposed between the second surfaces of the first and second support portions, electrically connecting at least some of the first vias with at least some of the second vias. The first and second support portions can have a CTE of less than 12 ppm/°C.
Abstract:
A method for making a microelectronic assembly includes providing a microelectronic element 30 with first conductive elements and a dielectric element 50 with second conductive elements. At least some of either the first conductive elements or the second conductive elements may be conductive posts 40 and other of the first or second conductive elements may include a bond metal 10 disposed between some of the conductive posts 40. An underfill layer 60 may overly some of the first or second conductive elements. At least one of the first conductive elements may be moved towards the other of the second conductive elements so that the posts pierce the underfill layer 60 and at least deform the bond metal 10. The microelectronic element 30 and the dielectric element 50 can be heated to join them together. The height of the posts 40 above the surface may be at least forty percent of a distance between surfaces of the microelectronic element 30 and dielectric element 50.
Abstract:
A microelectronic package (10) can include a substrate (20) having first and second opposed surfaces (21, 22), first, second, third, and fourth microelectronic elements (30a, 30b, 30c, 30d), and terminals (25) exposed at the second surface. Each microelectronic element (30) can have a front surface (31) facing the first surface (21) of the substrate (20) and a plurality of contacts (35) at the front surface. The front surfaces (31) of the microelectronic elements (30) can be arranged in a single plane parallel to and overlying the first surface (21). Each microelectronic element (30) can have a column of contacts (35) exposed at the front surface and arranged along respective first, second, third, and fourth axes (29a, 29b, 29c, 29d). The first and third axes (29a, 29c) can be parallel to one another. The second and fourth axes (29b, 29d) can be transverse to the first and third axes (29a, 29c).
Abstract:
A microelectronic package 510 can include a substrate 520 having first and second opposed surfaces 521, 527, at least two pairs of microelectronic elements 507a, 512b, and a plurality of terminals 525 exposed at the second surface. Each pair of microelectronic elements 507 can include an upper microelectronic element 530b and a lower microelectronic element 530a. The pairs of microelectronic elements 507 can be fully spaced apart from one another in a horizontal direction H parallel to the first surface 521 of the substrate 520. Each lower microelectronic element 530a can have a front surface 531 and a plurality of contacts 535 at the front surface. A surface 531 of each of the upper microelectronic elements 530b can at least partially overlie the first surface 521 of the substrate 520 and the lower microelectronic element 530a in its pair.
Abstract:
A microelectronic package (10) may have a plurality of terminals (36) disposed at a face (32) thereof which are configured for connection to at least one external component, e.g., a circuit panel (70). First and second microelectronic elements (12), (14) can be affixed with packaging structure (30) therein. A first electrical connection (51A, 40A, 74A) can extend from a respective terminal (36A) of the package (10) to a corresponding contact (20A) on the first microelectronic element (12), and a second electrical connection (53A, 40B, 52A) can extend from the respective terminal (36A) to a corresponding contact (26A) on the second microelectronic element (14), the first and second connections being configured such that a respective signal carried by the first and second connections is subject to propagation delay of the same duration between the respective terminal (36A) and each of the corresponding contacts (20A, 26A) coupled thereto.
Abstract:
A microelectronic assembly 10 can include a substrate 20 having first and second surfaces 21, 22, at least two logic chips 30 overlying the first surface, and a memory chip 40 having a front surface 45 with contacts 44 thereon, the front surface of the memory chip confronting a rear surface 36 of each logic chip. Signal contacts 34 of each logic chip 30 can be directly electrically connected to signal contacts 34 of the other logic chips 30 through conductive structure 62 of the substrate 20 for transfer of signals between the logic chips. The logic chips 30 can be adapted to simultaneously execute a set of instructions of a given thread of a process. The contacts 44 of the memory chip 40 can be directly electrically connected to the signal contacts 34 of at least one of the logic chips 30 through the conductive structure 62.
Abstract:
A component (10) includes a substrate (20) and a capacitor (40). The substrate (20) can have first and second surfaces (21, 22) and an opening (30) extending from the first surface. The capacitor (40) can include first, second, third, and fourth conductive plates (61, 62, 71, 72), each plate extending along an inner surface (31) of the opening (30). The capacitor (40) can include first and second electrodes (163, 164) exposed at first and second spaced apart locations, and third and fourth electrodes (173, 174) exposed at third and fourth spaced apart locations. The third plate (71) can overlie the first plate (61) and can be separated therefrom by a first dielectric layer (81). The second plate (62) can overlie the third plate (71) and can be separated therefrom by a second dielectric layer (82). The fourth plate (72) can overlie the second plate (62) and can be separated therefrom by a third dielectric layer (83).
Abstract:
A microelectronic unit 10 includes a semiconductor element 20 consisting essentially of semiconductor material and having a front surface 21, a rear surface 22, a plurality of active semiconductor devices 23a, 23b adjacent the front surface 21, a plurality of conductive pads 50 exposed at the front surface 21, and an opening 30 extending through the semiconductor element 20. At least one of the conductive pads 50 can at least partially overlie the opening 30 and can be electrically connected with at least one of the active semiconductor devices 23a, 23b. The microelectronic unit 10 can also include a first conductive element 60 exposed at the rear surface 22 for connection with an external component, the first conductive element 60 extending through the opening 30 and electrically connected with the at least one conductive pad 50, and a second conductive element 40 extending through the opening 30 and insulated from the first conductive element 60. The at least one conductive pad 50 can overlie a peripheral edge 41 of the second conductive element 40.
Abstract:
A method of fabricating a microelectronic unit 210 includes providing a semiconductor element 220 having a front 222 and rear surface 221 remote from the front surface, forming at least one opening 230 extending from the rear surface 221 through the semiconductor element 220 towards the front surface 222 by directing a jet of fine abrasive particles towards the semiconductor element, forming at least one second opening 240 extending from the first opening 230 to a bottom surface 251 of one conductive pad 250 exposed at the front surface 222, and forming at least one conductive contact 290 and at least one conductive interconnect 280a, 280b together. Each conductive interconnect 280a, 280b can extend within one or more of the first openings 230 and can be coupled to at least one conductive pad 250.
Abstract:
A method of forming a conductive element (24) on a substrate (10) and the resulting assembly (80) are provided. The method includes forming a groove (22) in a sacrificial layer (20) overlying a dielectric region (18) disposed on a substrate (10). The groove (22) preferably extends along a sloped surface (16) of the substrate (10). The sacrificial layer (20) is preferably removed by a non-photolithographic method, such as ablating with a laser (70), mechanical milling, or sandblasting. A conductive element (24) is formed in the groove (22). The grooves (22) and conductive elements (124) may be formed along any surface of the substrate (110), including within trenches (128) and vias (121) formed therein, and may connect to conductive pads (150) on the front (114) and/or rear surface (112) of the substrate (110). The conductive elements (24) are preferably formed by plating and may or may not conform to the surface of the substrate (10).