Abstract:
A memory system includes a link having at least one signal line and a controller. The controller includes at least one transmitter coupled to the link to transmit first data, and a first error protection generator coupled to the transmitter. The first error protection generator dynamically adds an error detection code to at least a portion of the first data. At least one receiver is coupled to the link to receive second data. A first error detection logic determines if the second data received by the controller contains at least one error and, if an error is detected, asserts a first error condition. The system includes a memory device having at least one memory device transmitter coupled to the link to transmit the second data. A second error protection generator coupled to the memory device transmitter dynamically adds an error detection code to at least a portion of the second data.
Abstract:
A controller includes a link interface that is to couple to a first link to communicate bi-directional data and a second link to transmit unidirectional error-detection information. An encoder is to dynamically add first error-detection information to at least a portion of write data. A transmitter, coupled to the link interface, is to transmit the write data. A delay element is coupled to an output from the encoder. A receiver, coupled to the link interface, is to receive second error-detection information corresponding to at least the portion of the write data. Error-detection logic is coupled to an output from the delay element and an output from the receiver. The error-detection logic is to determine errors in at least the portion of the write data by comparing the first error-detection information and the second error-detection information, and, if an error is detected, is to assert an error condition.
Abstract:
A system includes a memory controller and a memory device having a command interface and a plurality of memory banks, each with a plurality of rows of memory cells. The memory controller transmits an auto-refresh command to the memory device. Responsive to the auto-refresh command, during a first time interval, the memory device performs refresh operations to refresh the memory cells and the command interface of the memory device is placed into a calibration mode for the duration of the first time interval. Concurrently, during at least a portion of the first time interval, the memory controller performs a calibration of the command interface of the memory device. The auto-refresh command may specify an order in which memory banks of the memory device are to be refreshed, such that the memory device sequentially refreshes a respective row in the plurality of memory banks in the specified bank order.
Abstract:
The embodiments described herein describe technologies for using the memory modules in different modes of operation, such as in a standard multi-drop mode or as in a dynamic point-to-point (DPP) mode (also referred to herein as an enhanced mode). The memory modules can also be inserted in the sockets of the memory system in different configurations.
Abstract:
A memory system includes a memory controller that writes data to and reads data from a memory device. A write data strobe accompanying the write data indicates to the memory device when the write data is valid, whereas a read strobe accompanying data from the memory device indicates to the memory controller when the read data is valid. The memory controller adaptively controls the phase of the write data strobe to compensate for timing drift at the memory device. The memory controller uses read signals as a measure of the drift.
Abstract:
Described are memory systems in which a memory controller issues commands and addresses to multiple memory modules that collectively support each read and write transactions. A common set of control signal lines from the controller communicates the same command and address signals to the modules. For write commands, the controller sends subsets of write data to each module over a respective subset of data lines. For read commands, each module responds with a subset of the requested data over the respective subset of data lines. The memory modules can be width configurable so that a single full-width module can connect to both subsets of data lines to convey full-width data, or two half-width modules can connect one each to the subsets of data lines.
Abstract:
Chip selection and internal clocking functions are enabled within an integrated circuit memory component in response to a single “chip-enable” control signal, thus reducing memory system pin count and wiring complexity relative to designs that require separate chip-select and clock-enable signals. Internal clocking logic may also be provided to generate timing signal edges more precisely limited to the number required to complete a given memory component operation, reducing the number of unnecessary timing events and lowering power consumption. Further, internal read and write clock signals may be speculatively enabled within the memory component to more quickly stabilize those clocks in preparation for data transmission and reception operations, potentially lowering memory access latency.
Abstract:
A memory device (100) includes an extra column (114) of repair memory tiles. These repair memory tiles are accessed at the same time, and in the same manner as the main array of memory tiles. The output of the repair column is substituted for the output of a column of the main array (112). The main array column that is substituted is determined by tags (121) stored externally to the memory device. The external tags are queried with a partial address of the access. If the address of the access corresponds to an address in the external tags, the tag information is supplied to the memory device. The tag information determines which column in the main array is replaced by the output of the repair column. Since each column of the main array supplies one bit during the access, the repair column enables cell-by-cell replacement of main array cells.
Abstract:
An integrated-circuit memory controller outputs to a memory device a first signal in a first state to enable operation of synchronous data transmission and reception circuits within the memory device. A transaction queue within the memory controller stores memory read and write requests that, to be serviced, require operation of the synchronous data transmission and reception circuits, respectively, within the memory device. Power control circuitry within the memory controller determines that the transaction queue has reached a predetermined state and, in response, outputs the first signal to the memory device in a second state to disable operation of the synchronous data transmission and reception circuits within the memory device.
Abstract:
A memory device is disclosed that includes a row of storage locations to store a data word, and a spare row element. The data word is encoded via an error code for generating error information for correcting X bit errors or detecting Y bit errors, where Y is greater than X. The spare row element has substitute storage locations. The logic is responsive to detected errors to (1) enable correction of a data word based on the error information where there are no more than X bit errors, and (2) substitute the spare row element for a portion of the row where there are at least Y bit errors in the data word.