Memory Chip With Error Detection And Retry Modes Of Operation
    131.
    发明申请
    Memory Chip With Error Detection And Retry Modes Of Operation 有权
    具有错误检测和重试模式的存储芯片

    公开(公告)号:US20150378818A1

    公开(公告)日:2015-12-31

    申请号:US14828013

    申请日:2015-08-17

    Applicant: Rambus Inc.

    Abstract: A memory system includes a link having at least one signal line and a controller. The controller includes at least one transmitter coupled to the link to transmit first data, and a first error protection generator coupled to the transmitter. The first error protection generator dynamically adds an error detection code to at least a portion of the first data. At least one receiver is coupled to the link to receive second data. A first error detection logic determines if the second data received by the controller contains at least one error and, if an error is detected, asserts a first error condition. The system includes a memory device having at least one memory device transmitter coupled to the link to transmit the second data. A second error protection generator coupled to the memory device transmitter dynamically adds an error detection code to at least a portion of the second data.

    Abstract translation: 存储器系统包括具有至少一个信号线的链路和控制器。 所述控制器包括耦合到所述链路以发送第一数据的至少一个发射机,以及耦合到所述发射机的第一误差保护发生器。 第一错误保护发生器动态地将错误检测码添加到第一数据的至少一部分。 至少一个接收器耦合到链路以接收第二数据。 第一错误检测逻辑确定控制器接收到的第二数据是否包含至少一个错误,并且如果检测到错误则断言第一错误状况。 该系统包括具有耦合到链路以传输第二数据的至少一个存储器件发送器的存储器件。 耦合到存储器件发射器的第二误差保护发生器动态地将错误检测码添加到第二数据的至少一部分。

    ELECTRICALLY ERASABLE PROGRAMMABLE MEMORY DEVICE THAT GENERATES A CYCLIC REDUNDANCY CHECK (CRC) CODE
    132.
    发明申请
    ELECTRICALLY ERASABLE PROGRAMMABLE MEMORY DEVICE THAT GENERATES A CYCLIC REDUNDANCY CHECK (CRC) CODE 有权
    生成循环冗余检查(CRC)代码的电可擦除可编程存储器件

    公开(公告)号:US20150347223A1

    公开(公告)日:2015-12-03

    申请号:US14823804

    申请日:2015-08-11

    Applicant: Rambus Inc.

    Abstract: A controller includes a link interface that is to couple to a first link to communicate bi-directional data and a second link to transmit unidirectional error-detection information. An encoder is to dynamically add first error-detection information to at least a portion of write data. A transmitter, coupled to the link interface, is to transmit the write data. A delay element is coupled to an output from the encoder. A receiver, coupled to the link interface, is to receive second error-detection information corresponding to at least the portion of the write data. Error-detection logic is coupled to an output from the delay element and an output from the receiver. The error-detection logic is to determine errors in at least the portion of the write data by comparing the first error-detection information and the second error-detection information, and, if an error is detected, is to assert an error condition.

    Abstract translation: 控制器包括要耦合到第一链路以传送双向数据的链路接口和用于发送单向错误检测信息的第二链路。 编码器将动态地将第一错误检测信息添加到写入数据的至少一部分。 耦合到链路接口的发射机是发送写入数据。 延迟元件耦合到编码器的输出。 耦合到链路接口的接收机是接收对应于写数据的至少一部分的第二错误检测信息。 错误检测逻辑耦合到来自延迟元件的输出和来自接收器的输出。 错误检测逻辑是通过比较第一错误检测信息和第二错误检测信息来确定写入数据的至少一部分中的错误,并且如果检测到错误则是断言错误状况。

    Memory Systems and Methods for Dynamically Phase Adjusting a Write Strobe and Data to Account for Receive-Clock Drift
    135.
    发明申请
    Memory Systems and Methods for Dynamically Phase Adjusting a Write Strobe and Data to Account for Receive-Clock Drift 有权
    用于动态相位调整写入频闪和数据以记录接收时钟漂移的存储器系统和方法

    公开(公告)号:US20150243342A1

    公开(公告)日:2015-08-27

    申请号:US14669919

    申请日:2015-03-26

    Applicant: Rambus Inc.

    Abstract: A memory system includes a memory controller that writes data to and reads data from a memory device. A write data strobe accompanying the write data indicates to the memory device when the write data is valid, whereas a read strobe accompanying data from the memory device indicates to the memory controller when the read data is valid. The memory controller adaptively controls the phase of the write data strobe to compensate for timing drift at the memory device. The memory controller uses read signals as a measure of the drift.

    Abstract translation: 存储器系统包括将数据写入存储器件并从存储器件读取数据的存储器控​​制器。 伴随写入数据的写入数据选通信号在写入数据有效时向存储器件指示,而伴随来自存储器件的数据的读取选通器在读取数据有效时向存储器控制器指示。 存储器控制器自适应地控制写入数据选通的相位以补偿存储器件的定时漂移。 存储器控制器使用读取信号作为漂移的度量。

    Memory with merged control input
    137.
    发明授权
    Memory with merged control input 有权
    具有合并控制输入的存储器

    公开(公告)号:US09087568B1

    公开(公告)日:2015-07-21

    申请号:US13848832

    申请日:2013-03-22

    Applicant: Rambus Inc.

    Abstract: Chip selection and internal clocking functions are enabled within an integrated circuit memory component in response to a single “chip-enable” control signal, thus reducing memory system pin count and wiring complexity relative to designs that require separate chip-select and clock-enable signals. Internal clocking logic may also be provided to generate timing signal edges more precisely limited to the number required to complete a given memory component operation, reducing the number of unnecessary timing events and lowering power consumption. Further, internal read and write clock signals may be speculatively enabled within the memory component to more quickly stabilize those clocks in preparation for data transmission and reception operations, potentially lowering memory access latency.

    Abstract translation: 芯片选择和内部时钟功能在集成电路存储器组件内响应于单个“芯片使能”控制信号而被使能,从而相对于需要单独的芯片选择和时钟使能信号的设计而减少存储器系统引脚数量和布线复杂度 。 还可以提供内部时钟逻辑以产生更精确地限制完成给定存储器组件操作所需的数量的定时信号边沿,减少不必要的定时事件的数量并降低功耗。 此外,内部读和写时钟信号可以在存储器组件内被推测启用,以更快地稳定这些时钟以准备数据传输和接收操作,潜在地降低存储器访问等待时间。

    MEMORY REPAIR USING EXTERNAL TAGS
    138.
    发明申请
    MEMORY REPAIR USING EXTERNAL TAGS 有权
    使用外部标签进行记忆修复

    公开(公告)号:US20150162101A1

    公开(公告)日:2015-06-11

    申请号:US14407318

    申请日:2013-10-31

    Applicant: Rambus Inc.

    Abstract: A memory device (100) includes an extra column (114) of repair memory tiles. These repair memory tiles are accessed at the same time, and in the same manner as the main array of memory tiles. The output of the repair column is substituted for the output of a column of the main array (112). The main array column that is substituted is determined by tags (121) stored externally to the memory device. The external tags are queried with a partial address of the access. If the address of the access corresponds to an address in the external tags, the tag information is supplied to the memory device. The tag information determines which column in the main array is replaced by the output of the repair column. Since each column of the main array supplies one bit during the access, the repair column enables cell-by-cell replacement of main array cells.

    Abstract translation: 存储器设备(100)包括修复存储器块的额外列(114)。 这些修复存储器瓦片同时被以与主阵列的存储器瓦片相同的方式被访问。 修复列的输出代替主阵列(112)的列的输出。 取代的主阵列列由存储在外部的存储器件的标签(121)决定。 使用访问的部分地址查询外部标记。 如果访问的地址对应于外部标签中的地址,则将标签信息提供给存储设备。 标签信息确定主阵列中的哪个列由修复列的输出替代。 由于主阵列的每列在访问期间提供一位,所以修复列可以逐个单元替换主阵列单元。

    DRAM METHOD, COMPONENTS, AND SYSTEM CONFIGURATIONS FOR ERROR MANAGEMENT
    140.
    发明申请
    DRAM METHOD, COMPONENTS, AND SYSTEM CONFIGURATIONS FOR ERROR MANAGEMENT 审中-公开
    DRAM方法,组件和系统配置错误管理

    公开(公告)号:US20140351673A1

    公开(公告)日:2014-11-27

    申请号:US14285467

    申请日:2014-05-22

    Applicant: Rambus Inc.

    Abstract: A memory device is disclosed that includes a row of storage locations to store a data word, and a spare row element. The data word is encoded via an error code for generating error information for correcting X bit errors or detecting Y bit errors, where Y is greater than X. The spare row element has substitute storage locations. The logic is responsive to detected errors to (1) enable correction of a data word based on the error information where there are no more than X bit errors, and (2) substitute the spare row element for a portion of the row where there are at least Y bit errors in the data word.

    Abstract translation: 公开了一种存储器件,其包括用于存储数据字的存储位置行和备用行元件。 数据字通过用于产生用于校正X位错误的错误信息的错误代码进行编码,或者检测Y位错误,其中Y大于X.备用行元件具有替代的存储位置。 逻辑响应于检测到的错误,以(1)能够基于错误信息来校正数据字,其中存在不超过X位错误,以及(2)将备用行元素替换为存在行的一部分 数据字中至少有Y位错误。

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