FIRST LAYER INTERCONNECT FIRST ON CARRIER APPROACH FOR EMIB PATCH

    公开(公告)号:US20230027030A1

    公开(公告)日:2023-01-26

    申请号:US17958296

    申请日:2022-09-30

    Abstract: A patch structure of an integrated circuit package comprises a core having a first side facing downwards and a second side facing upwards. A first solder resist (SR) layer is formed on the first side of the core, wherein the first SR layer comprises a first layer interconnect (FLI) and has a first set of one or more microbumps thereon to bond to one or more logic die. A second solder resist (SR) layer is formed on the second side of the core, wherein the second SR layer has a second set of one or more microbumps thereon to bond with a substrate. One or more bridge dies includes a respective sets of bumps, wherein the one or more bridge dies is disposed flipped over within the core such that the respective sets of bumps face downward and connect to the first set of one or more microbumps in the FLI.

    MOLDING SYSTEM AND MOLDING METHOD
    26.
    发明申请

    公开(公告)号:US20250144857A1

    公开(公告)日:2025-05-08

    申请号:US18500132

    申请日:2023-11-02

    Abstract: Various aspects may provide a molding system. The molding system may include a molding unit which includes a first mold panel and a second mold panel. The first mold panel and the second mold panel may include a mold cavity which surrounds a semiconductor workpiece along a side surface of the semiconductor workpiece, with the first mold panel and the second mold panel engaged with the semiconductor workpiece. Various aspects may also provide a molding method which utilize the molding system.

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